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1.发明公开公开(公告)号：US20240044968A1
公开(公告)日：2024-02-08
申请号：US18361672
申请日：2023-07-28
Applicant: Tektronix, Inc.
Inventor： Vivek Shivaram , Niranjan R. Hegde , Krishna N H Sri , Abhishek Naik , Shubha B , Yogesh M. Pai , Venkatraj Melinamane
CPC classification number: G01R31/2603 , G01R31/2889 , G01R1/06788
Abstract: A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.
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公开(公告)号：US12020855B2
公开(公告)日：2024-06-25
申请号：US17315022
申请日：2021-05-07
Applicant: Tektronix, Inc.
Inventor： Shubha B , Niranjan R Hegde , Yogesh M Pai , Gajendra Kumar Patro , Krishna N H Sri
CPC classification number: H01F27/346 , G01R33/14 , H01F3/10 , H01F27/24 , H01F27/42 , H01F2003/106 , H01F2027/348
Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.
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公开(公告)号：US20240353470A1
公开(公告)日：2024-10-24
申请号：US18641314
申请日：2024-04-19
Applicant: Tektronix, Inc.
Inventor： Niranjan R. Hegde , Daniel G. Knierim , Vivek Shivaram , Krishna N H Sri , Joshua J. O'Brien , Shubha B , Yogesh M. Pai
IPC: G01R31/26
CPC classification number: G01R31/2621
Abstract: A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.
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Patent Agency Ranking
公开(公告)号：US20240036143A1
公开(公告)日：2024-02-01
申请号：US18359789
申请日：2023-07-26
Applicant: Tektronix, Inc.
Inventor： Shubha B , Krishna N H Sri , Sathish Kumar K , Yogesh M. Pai
CPC classification number: G01R35/005 , G01R31/2601
Abstract: A system for measuring characteristics of wide bandgap Devices Under Test (DUTs) includes a testing fixture including one or more wide bandgap DUTs, and a measurement instrument having one or more processors configured to apply a stimulus to provoke a response of one or more wide bandgap DUTs, measure the response, graph the response on one or more displays, each display having a vertical scale, and automatically adjusting the vertical scale of the one or more displays until no clipping occurs in the one or more displays. Methods of dynamically configuring a test and measurement instrument based on a particular testing setup are also described.
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公开(公告)号：US20240027513A1
公开(公告)日：2024-01-25
申请号：US18220222
申请日：2023-07-10
Applicant: Tektronix, Inc.
Inventor： Vivek Shivaram , Niranjan R. Hedge , Shubha B , Krishna N H Sri , Yogesh M. Pai , Venkatraj Melinamane
IPC: G01R31/26
CPC classification number: G01R31/2608
Abstract: A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.
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6.发明申请公开(公告)号：US20250062720A1
公开(公告)日：2025-02-20
申请号：US18807895
申请日：2024-08-16
Applicant: Tektronix, Inc.
Inventor： Shubha B , Krishna N H Sri , Niranjan R. Hegde , Vivek Shivaram
Abstract: An oscilloscope includes input channels for receiving at least one voltage signal and at least one current signal from at least one component of a photovoltaic power system under test (SUT), a user interface including a display and one or more controls for receiving one or more test configuration settings from a user, and one or more processors configured to acquire waveforms of the at least one voltage signal and the at least one current signal, and implement a photovoltaic power system compliance test module that automatically determines, in real-time, one or more SUT performance measurements based on the acquired voltage and current waveforms and the one or more test configuration settings, displays, in real-time, the one or more SUT performance measurements to the user on the display. Methods of performing automated hardware-in-the-loop testing of a photovoltaic power system under test using an oscilloscope are also disclosed.
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公开(公告)号：US20240345166A1
公开(公告)日：2024-10-17
申请号：US18629865
申请日：2024-04-08
Applicant: Tektronix, Inc.
Inventor： Krishna N H Sri , Niranjan R Hegde , Christopher J. Loberg , Shubha B
IPC: G01R31/34
CPC classification number: G01R31/343
Abstract: A test and measurement instrument includes one or more processors to acquire first, second, and third phase drive signals applied to a three-phase motor. A motor drive analyzer performs a direct-quadrature-zero, DQZ, transformation on the acquired first, second, and third phase drive signals to produce direct (D), quadrature (Q), and zero (Z) components, and generates an overlapped DQ phasor plot illustrating the D and Q components along with frequency domain representations of the D and Q components. The motor driver analyzer displays, on a user interface, the generated overlapped DQ phasor plot and an overlapped DQ spectra plot from the frequency domain representations of the D and Q components to enable a user to detect motor defects through visual characteristics of the overlapped DQ phasor and DQ spectra plots. The motor driver analyzer removes an offset and filters the D and Q components prior generating the overlapped DQ phasor plot.
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公开(公告)号：US20210358685A1
公开(公告)日：2021-11-18
申请号：US17315022
申请日：2021-05-07
Applicant: Tektronix, Inc.
Inventor： Shubha B , Niranjan R Hegde , Yogesh M Pai , Gajendra Kumar Patro , Krishna N H Sri
Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.
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