公开(公告)号：US20240036143A1

公开(公告)日：2024-02-01

申请号：US18359789

申请日：2023-07-26

Applicant: Tektronix, Inc.

Inventor： Shubha B ,  Krishna N H Sri ,  Sathish Kumar K ,  Yogesh M. Pai

IPC: G01R35/00 ,  G01R31/26

CPC classification number: G01R35/005 ,  G01R31/2601

Abstract: A system for measuring characteristics of wide bandgap Devices Under Test (DUTs) includes a testing fixture including one or more wide bandgap DUTs, and a measurement instrument having one or more processors configured to apply a stimulus to provoke a response of one or more wide bandgap DUTs, measure the response, graph the response on one or more displays, each display having a vertical scale, and automatically adjusting the vertical scale of the one or more displays until no clipping occurs in the one or more displays. Methods of dynamically configuring a test and measurement instrument based on a particular testing setup are also described.