公开(公告)号：US11181581B2

公开(公告)日：2021-11-23

申请号：US14257845

申请日：2014-04-21

Applicant: TEKTRONIX, INC.

Inventor： Krishna N H Sri ,  Gajendra Kumar Patro ,  Abhinav Bal ,  Gurushiddappa M N

IPC: G01R31/327 ,  G01R13/02 ,  G01R31/26 ,  G01R35/00 ,  G01R23/16 ,  H02M3/157

Abstract: The disclosed technology relates to a method and apparatus for graphically displaying a switching cycle of a switching device. A switching voltage and a switching current are acquired for a device under test via a voltage probe and a current probe, respectively, for a plurality of switching cycles of the device under test. The switching current versus the switching voltage is plotted on a current versus voltage plot as a curve for each of the switching cycles. Each of the curves on the current versus voltage plot overlap each other and are displayed to a user.

公开(公告)号：US12020855B2

公开(公告)日：2024-06-25

申请号：US17315022

申请日：2021-05-07

Applicant: Tektronix, Inc.

Inventor： Shubha B ,  Niranjan R Hegde ,  Yogesh M Pai ,  Gajendra Kumar Patro ,  Krishna N H Sri

IPC: H01F27/34 ,  G01R33/14 ,  H01F3/10 ,  H01F27/24 ,  H01F27/42

CPC classification number: H01F27/346 ,  G01R33/14 ,  H01F3/10 ,  H01F27/24 ,  H01F27/42 ,  H01F2003/106 ,  H01F2027/348

Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.

公开(公告)号：US20210358685A1

公开(公告)日：2021-11-18

申请号：US17315022

申请日：2021-05-07

Applicant: Tektronix, Inc.

Inventor： Shubha B ,  Niranjan R Hegde ,  Yogesh M Pai ,  Gajendra Kumar Patro ,  Krishna N H Sri

IPC: H01F27/34 ,  H01F27/42 ,  H01F3/10 ,  H01F27/24 ,  G01R33/14

Abstract: A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.

公开(公告)号：US10895612B2

公开(公告)日：2021-01-19

申请号：US16160879

申请日：2018-10-15

Applicant: Tektronix, Inc.

Inventor： U N Vasudev ,  Gajendra Kumar Patro ,  Krishna N H Sri

IPC: G01R33/14

Abstract: A test and measurement instrument, comprising at least one port configured to receive a signal from a device under test; a user interface configured to receive a user input, the user input indicating magnetic properties of a magnetic material of the device under test, and one or more processors. The one or more processors are configured to generate a hysteresis loop mask based on the magnetic properties of the magnetic material, determine whether the signal received from the device under test violates the hysteresis loop mask, and generate an alert when the signal received from the device under test violates the hysteresis loop mask. The test and measurement instrument may also include a display configured to display the hysteresis loop mask, the signal received from the device under test, and/or the alert.