Abstract:
To provide a plurality of DRAM cells, a plurality of sense amplifiers connected to corresponding bit line pairs, a first column switch and a second column switch assigned to each of the sense amplifiers, data lines connected via the column switches to the sense amplifiers, a first port PORT1 and a second port PORT2 that can input/output write data and read data, and an input/output circuit that connects the PORT1 and the PORT2 to the data lines. Thus, a pseudo dual-port memory can be configured by using an ordinary DRAM array.
Abstract:
To provide a memory array for information bit that stores information bits, a memory array for check bit that stores check bits, a correction circuit that, in response to a write request, reads the information bit and the check bit corresponding to a write address from the respective memory arrays and corrects an error included in the information bit, and a mixer temporarily holding information bit corrected by the correction circuit. The mixer overwrites only a part of bytes of the held information bits with write data according to a byte mask signal. Accordingly, a capacity required for the memory array for check bit can be reduced while the byte mask function is maintained.
Abstract:
An automatic choke apparatus for a carburetor includes an electric actuator, a choke valve opening/closing mechanism configured to open and close a choke valve by being driven by a power exerted by the electric actuator, and a controller configured to control operation of the electric actuator. The controller, to which a battery supplies electric power, operates the electric actuator and the choke valve opening/closing mechanism in order that, when the engine is stopped, the choke valve is set in a semi-opened position and, when the engine starts to be cranked, the choke valve is set in a fully-closed position. Accordingly, it is possible to prevent the choke valve from freezing up in the fully-closed state in a case where the engine is stopped under an extremely low temperature environment.
Abstract:
An apparatus testing a semiconductor device may include, but is not limited to, a first strobe signal generating circuit and a detecting circuit. The first strobe signal generating circuit generates a first strobe signal in response to a reference clock supplied from the semiconductor device. The detecting circuit detects a data signal, supplied from the semiconductor device, based on the first strobe signal.
Abstract:
To provide data lines connected via column switches to a plurality of sense amplifiers and an input/output circuit that, in response to a write request, supplies pre-write data through the data line to selected phase change memory cells and then write data through the data line to the selected phase change memory cells. Thus, a pre-write operation and an actual write operation according to the write data can be performed at high speed. Because only the memory cells selected by a column address are subject to write, consumption power is reduced and lives of the memory cells are not shortened.
Abstract:
A semiconductor device includes a first and a second ROMs; and a first control circuit having an input node and sets a first and a second addresses that are different each other to be respectively recorded in the first and second ROMs from a plurality of input addresses supplied sequentially into the input node, on the basis of a setting signal, the plurality of input addresses including the first and second addresses, wherein the first control circuit being configured to set an input address as the first address based on the setting signal, and the first control circuit further being configured to set an input address as the second address on the basis of the setting signal when the first and second addresses are different each other in a predetermined portion of bits after the first address is set to the first ROM.
Abstract:
To provide an input/output circuit that includes a write path to which write data is supplied and a read path to which read data is supplied and first and second data lines that connect the input/output circuit to a memory cell array. The input/output circuit includes a write buffer that supplies the write data on the write path to the first data line, a read amplifier that supplies the read data supplied to the read path through the second data line, and a bypass circuit that supplies the write data on the write path to the read path in response to detection of matching between a write address and a read address. Thus, data collisions can be avoided.