摘要:
A cleaning composition for removing plasma etching residue and/or ashing residue formed above a semiconductor substrate is provided that includes (component a) water, (component b) a hydroxylamine and/or a salt thereof, (component c) a basic organic compound, and (component d) an organic acid and has a pH of 7 to 9. There are also provided a cleaning process and a process for producing semiconductor device employing the cleaning composition.
摘要:
Provided are a cleaning composition which is capable of inhibiting the metal of a semiconductor substrate from corrosion, and has an excellent removability of plasma etching residues and/or ashing residues on the semiconductor substrate, a method for producing a semiconductor device, and a cleaning method using the cleaning composition. The cleaning composition for removing plasma etching residues and/or ashing residues formed on a semiconductor substrate, and a preparation method and a cleaning method for a semiconductor device, using the cleaning composition, wherein the cleaning composition includes (Component a) water; (Component b) an amine compound; (Component c) hydroxylamine and/or a salt thereof; (Component d) a quaternary ammonium compound; (Component e) an organic acid; and (Component f) a water-soluble organic solvent; and has a pH of 6 to 9.
摘要:
A cleaning agent used after chemical mechanical polishing of a semiconductor device, the cleaning agent including a polycarboxylic acid and diethylenetriamine pentaacetic acid, the semiconductor device including a copper diffusion barrier film and copper wiring on an interlayer dielectric film, and the dielectric film containing SiOC and having a dielectric constant of 3.0 or less.
摘要:
The present inventive filter is a columnar porous body 1 having numerous flow paths 2 formed in parallel in axial direction, numerous liquid collecting slits 3 formed with extending in axial direction and allowing a group of the flow paths formed in parallel and the outside of the porous body to communicate with each other, wherein a group of the flow paths 2a communicating with the liquid collecting slits 3 are plugged at both ends. Liquid collecting slits 3a into which the backwashing liquid can flow among the liquid collecting slits 3 are disposed in such a manner that 75% or more of the length in axial direction is positioned on backwashing liquid non-outflow end side with respect to the position which is 60% of the length of the porous body 1 in axial direction from the backwashing liquid outflow end of the porous body 1.