Apparatus for evaluating characteristics of semiconductor device and
method of evaluating characteristics of semiconductor device using the
same
    1.
    发明授权
    Apparatus for evaluating characteristics of semiconductor device and method of evaluating characteristics of semiconductor device using the same 失效
    用于评估半导体器件的特性的装置和使用其的半导体器件的特性评估方法

    公开(公告)号:US5491425A

    公开(公告)日:1996-02-13

    申请号:US215774

    申请日:1994-03-22

    CPC分类号: G01R1/06783

    摘要: A probe is attached to a support plate vertically to the surface of the support plate. A drop of a molten metal is formed at a tip portion of the probe. The support plate has a heater for setting the temperature of the probe and the drop of the molten metal at the tip portion of the probe. The probe is situated at a position corresponding to a position of an electrode of an LSI. The probe is connected to a measuring device for evaluating characteristics of the LSI by wiring. The drop of the molten metal connects the probe and the electrode of the LSI electrically.

    摘要翻译: 探针垂直于支撑板的表面附接到支撑板。 在探针的尖端处形成一滴熔融金属。 支撑板具有用于将探针的温度和熔融金属的液滴设置在探针的尖端部分的加热器。 探针位于与LSI的电极的位置对应的位置。 探头连接到用于通过布线评估LSI的特性的测量装置。 熔融金属液滴将探针和LSI的电极电连接。