Image sensor structure including nanowire structure and manufacturing method thereof

    公开(公告)号:US12176375B2

    公开(公告)日:2024-12-24

    申请号:US17322599

    申请日:2021-05-17

    Abstract: An image sensor structure including a substrate, a nanowire structure, a first conductive line, a second conductive line, and a third conductive line is provided. The nanowire structure includes a first doped layer, a second doped layer, a third doped layer, and a fourth doped layer sequentially stacked on the substrate. The first doped layer and the third doped layer have a first conductive type. The second doped layer and the fourth doped layer have a second conductive type. The first conductive line is connected to a sidewall of the second doped layer. The second conductive line is connected to a sidewall of the third doped layer. The third conductive line is connected to the fourth doped layer.

    IMAGE SENSOR STRUCTURE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20220336519A1

    公开(公告)日:2022-10-20

    申请号:US17322599

    申请日:2021-05-17

    Abstract: An image sensor structure including a substrate, a nanowire structure, a first conductive line, a second conductive line, and a third conductive line is provided. The nanowire structure includes a first doped layer, a second doped layer, a third doped layer, and a fourth doped layer sequentially stacked on the substrate. The first doped layer and the third doped layer have a first conductive type. The second doped layer and the fourth doped layer have a second conductive type. The first conductive line is connected to a sidewall of the second doped layer. The second conductive line is connected to a sidewall of the third doped layer. The third conductive line is connected to the fourth doped layer.

    RESISTIVE RANDOM ACCESS MEMORY AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20250031585A1

    公开(公告)日:2025-01-23

    申请号:US18447317

    申请日:2023-08-10

    Abstract: A resistive random access memory includes a first electrode, a second electrode, a dielectric layer, a protection layer, and at least one switching layer. The dielectric layer is formed on the first electrode. The dielectric layer has an opening exposing a portion of the first electrode. The protection layer is disposed on sidewalls of the opening. The switching layer is disposed on the exposed portion of the first electrode and exposes a portion of sidewalls of the protection layer. The second electrode is at least one conductive layer and is disposed on the switching layer in the opening.

    MANUFACTURING METHOD OF IMAGE SENSOR STRUCTURE

    公开(公告)号:US20250022905A1

    公开(公告)日:2025-01-16

    申请号:US18900947

    申请日:2024-09-30

    Abstract: An image sensor structure including a substrate, a nanowire structure, a first conductive line, a second conductive line, and a third conductive line is provided. The nanowire structure includes a first doped layer, a second doped layer, a third doped layer, and a fourth doped layer sequentially stacked on the substrate. The first doped layer and the third doped layer have a first conductive type. The second doped layer and the fourth doped layer have a second conductive type. The first conductive line is connected to a sidewall of the second doped layer. The second conductive line is connected to a sidewall of the third doped layer. The third conductive line is connected to the fourth doped layer.

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