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1.发明申请公开(公告)号：US20140253149A1
公开(公告)日：2014-09-11
申请号：US14286136
申请日：2014-05-23
IPC分类号： G01N27/22
摘要： A method of characterizing a quality of a polycrystalline diamond compact (PDC) cutter includes obtaining a PDC cutter that includes a leached layer and an unleached layer. The unleached layer is positioned adjacent to the leached layer, and the leached layer has at least a portion of a catalyst material removed from therein. The method further includes measuring capacitance values of the PDC cutter at multiple frequencies of an electrical signal provided to the PDC cutter by a capacitance measuring device to measure the capacitance values of the PDC cutter. The method also includes characterizing a quality of the PDC cutter based on a lowest capacitance value from among the capacitance values. Each capacitance value of the capacitance values is measured at a respective frequency of the multiple frequencies of the electrical signal.
摘要翻译： 表征多晶金刚石压块（PDC）切割器的质量的方法包括获得包括浸出层和未漂白层的PDC切割器。 未浸提层定位成与浸出层相邻，并且浸出层具有从其中去除的至少一部分催化剂材料。 该方法还包括通过电容测量装置测量提供给PDC切割器的电信号的多个频率来测量PDC切割器的电容值，以测量PDC切割器的电容值。 该方法还包括基于来自电容值的最低电容值来表征PDC切割器的质量。 在电信号的多个频率的相应频率处测量电容值的每个电容值。
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公开(公告)号：US20130263521A1
公开(公告)日：2013-10-10
申请号：US13440868
申请日：2012-04-05
IPC分类号： B24D18/00
CPC分类号： B24D3/06 , B22F2005/001 , B24D18/00 , C04B35/52 , C04B35/5831 , C04B41/0072 , C04B41/009 , C04B41/80 , C04B2235/427 , C04B2235/6562 , C04B2235/6567 , C04B2235/662 , C04B2235/664 , C04B2235/96 , C21D1/30 , C21D1/44 , C21D11/00 , C22C1/1094 , C22C26/00 , C25F1/00 , G01N29/14 , G01N2291/0232
摘要： A post manufacture method and apparatus for reducing residual stresses present within a component. The component includes a substrate, a polycrystalline structure coupled thereto, and residual stresses present therein. The method includes obtaining a component from a component category, determining a critical temperature and a critical time period for the component category at which the component becomes structurally impaired, determining a heat treatment temperature and a heat treatment time period based upon the critical temperature and the critical time period, and heating one or more remaining components from the component category to the heat treatment temperature for the heat treatment time period. The apparatus includes a heater defining a heating chamber and a molten bath positioned within the heating chamber. The components are placed within the pre-heated molten bath and isolated from oxygen during heating to the heat treatment temperature for the heat treatment time period.
摘要翻译： 一种用于减少部件内存在的残余应力的后制造方法和装置。 该组件包括衬底，与其耦合的多晶结构和其中存在的残余应力。 该方法包括从组件类别获得组件，确定组件变得结构受损的组件类别的临界温度和临界时间段，基于临界温度确定热处理温度和热处理时间段 临界时间段，以及从组分类别中将一种或多种剩余组分加热至热处理时间段的热处理温度。 该装置包括限定加热室和位于加热室内的熔池的加热器。 将组分放置在预热的熔融浴中，并且在加热到热处理温度的热处理时间段期间与氧隔离。
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3.发明申请Method Of Determining Wear Abrasion Resistance Of Polycrystalline Diamond Compact (PDC) Cutters 审中-公开确定多晶金刚石（PDC）刀具耐磨性的方法公开(公告)号：US20150075252A1
公开(公告)日：2015-03-19
申请号：US14027874
申请日：2013-09-16
CPC分类号： G01N3/56 , G01N33/40 , G01N2203/0053
摘要： The present disclosure provides methods and techniques for determining wear abrasion resistance of superhard components, such as cutters used in down-hole drilling tools. The methods and techniques provided herein produce an efficiency ratio of a superhard component through data obtained from a vertical turret lathe test. The efficiency ratio is the ratio between the volume of a target cylinder removed by the superhard component during the vertical turret lathe test and the normal force applied onto the superhard component by the target cylinder. The efficiency ratio is indicative of the energy efficiency of the superhard component.
摘要翻译： 本公开提供了用于确定超硬组件（例如在井下钻具中使用的切割器）的耐磨性的方法和技术。 本文提供的方法和技术通过从垂直转塔车床测试获得的数据产生超硬组分的效率比。 效率比是在垂直转塔车床试验期间由超硬部件除去的目标圆筒的体积与由目标圆筒施加到超硬体部件上的法向力之间的比率。 效率比表示超硬部件的能量效率。
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4.发明申请Method and Apparatus to Assess the Thermal Damage Caused to a PCD Cutter Using Capacitance Spectroscopy 有权使用电容光谱法评估引起PCD切割机的热损伤的方法和装置公开(公告)号：US20140062509A1
公开(公告)日：2014-03-06
申请号：US14073557
申请日：2013-11-06
IPC分类号： G01R27/26
CPC分类号： G01R27/2605 , G01N27/22 , G01N33/40
摘要： A method and apparatus for non-destructively determining the wear resistance of an ultra-hard polycrystalline structure after being coupled to a downhole tool using capacitance measurements. The apparatus includes a capacitance measuring device having a positive and negative terminal, a leached component comprising a polycrystalline structure that has been coupled to a downhole tool, a first wire, and a second wire. The first wire electrically couples the positive terminal to a surface of the leached component and the second wire electrically couples the negative terminal to a surface of the downhole tool. The capacitance is measured for the leached component one or more times and compared to a calibration curve that shows a relationship between capacitance values and wear resistance, thereby allowing determination of an estimated wear resistance for the polycrystalline structure.
摘要翻译： 在使用电容测量结合到井下工具之后，非破坏性地确定超硬多晶结构的耐磨性的方法和装置。 该装置包括具有正极端子和负极端子的电容测量装置，包括已连接到井下工具，第一导线和第二导线的多晶结构的浸出部件。 第一线将正端子电耦合到浸出部件的表面，并且第二线将负极端子电耦合到井下工具的表面。 对于浸出组分测量电容量一次或多次，并与显示电容值和耐磨性之间的关系的校准曲线进行比较，从而可以确定多晶结构的估计耐磨性。
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公开(公告)号：US20130213433A1
公开(公告)日：2013-08-22
申请号：US13401452
申请日：2012-02-21
CPC分类号： B08B3/12 , B08B3/08 , B08B7/028 , B23B27/148 , B23B27/20 , B23B2226/12 , B23B2226/315 , B23B2270/28 , Y10T408/81
摘要： A cleaned component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned component, and a method for determining the effectiveness of cleaning the leached component. The cleaned component includes a leached layer that has at least a portion of by-product materials removed. The by-product materials were deposited into the leached layer during a leaching process that formed the leached layer. The apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. Optionally, a transducer emits ultrasonic waves into the leached layer. The method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned component, measuring one or more capacitance values of the cleaned component, repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.
摘要翻译： 具有多晶结构的清洁部件，用于清洁浸出部件以形成清洁部件的方法和装置，以及用于确定清洗部件的有效性的方法。 清洁的部件包括具有除去的副产物材料的至少一部分的浸出层。 在形成浸出层的浸出过程中，副产物材料沉积到浸出层中。 用于清洁的装置和方法包括罐，置于罐内的清洗液，以及浸入清洗液中的浸出层的至少一部分。 可选地，换能器将超声波发射到浸出层中。 用于确定清洁效果的方法包括清洗浸出的部件以形成清洁的部件，测量清洁部件的一个或多个电容值，重复清洁和测量直到达到稳定的下限电容值。
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公开(公告)号：US20130247478A1
公开(公告)日：2013-09-26
申请号：US13428635
申请日：2012-03-23
IPC分类号： C09K3/14
CPC分类号： G01N27/221 , B22F3/24 , B22F7/06 , B22F2003/244 , C22C26/00 , E21B10/00 , E21B10/56
摘要： A method to leach a component that includes a polycrystalline structure. The method includes obtaining the component having the polycrystalline structure. The polycrystalline structure includes catalyst material deposited therein. The method also includes performing a leaching process on the polycrystalline structure to an intermediate leaching depth. The leaching process removes at least a portion of the catalyst material from the polycrystalline structure and forms one or more by-product materials deposited therein. The method also includes performing a cleaning process on the polycrystalline structure, which removes at least a portion of the by-product materials. The leaching process and the cleaning process are iteratively continued until the intermediate leaching depth reaches a desired leaching depth, both of which are measured from one end of the polycrystalline structure. The desired leaching depth is greater than at least one intermediate leaching depth.
摘要翻译： 一种浸出包括多晶结构的组分的方法。 该方法包括获得具有多晶结构的部件。 多晶结构包括沉积在其中的催化剂材料。 该方法还包括对多晶结构进行中间浸出深度的浸出过程。 浸出过程将催化剂材料的至少一部分从多晶结构中去除并形成沉积在其中的一种或多种副产物材料。 该方法还包括对多晶结构进行清洁处理，其去除至少一部分副产物材料。 迭代过程和清洗过程直到中间浸出深度达到所需的浸出深度，两者都是从多晶结构的一端测量的。 所需的浸出深度大于至少一个中间浸出深度。
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公开(公告)号：US20150209837A1
公开(公告)日：2015-07-30
申请号：US14681348
申请日：2015-04-08
CPC分类号： B08B3/12 , B08B3/08 , B08B7/028 , B23B27/148 , B23B27/20 , B23B2226/12 , B23B2226/315 , B23B2270/28 , Y10T408/81
摘要： A cleaned component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned component, and a method for determining the effectiveness of cleaning the leached component. The cleaned component includes a leached layer that has at least a portion of by-product materials removed. The by-product materials were deposited into the leached layer during a leaching process that formed the leached layer. The apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. Optionally, a transducer emits ultrasonic waves into the leached layer. The method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned component, measuring one or more capacitance values of the cleaned component, repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.
摘要翻译： 具有多晶结构的清洁部件，用于清洁浸出部件以形成清洁部件的方法和装置，以及用于确定清洗部件的有效性的方法。 清洁的部件包括具有除去的副产物材料的至少一部分的浸出层。 在形成浸出层的浸出过程中，副产物材料沉积到浸出层中。 用于清洁的装置和方法包括罐，置于罐内的清洗液，以及浸入清洗液中的浸出层的至少一部分。 可选地，换能器将超声波发射到浸出层中。 用于确定清洁效果的方法包括清洗浸出的部件以形成清洁的部件，测量清洁部件的一个或多个电容值，重复清洁和测量直到达到稳定的下限电容值。
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公开(公告)号：US20130214799A1
公开(公告)日：2013-08-22
申请号：US13401188
申请日：2012-02-21
IPC分类号： G01R27/26
摘要： A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using capacitance measurements. The apparatus includes a capacitance measuring device having a positive and negative terminal, a leached component comprising a polycrystalline structure, a first wire, and a second wire. The leached component includes a first surface and an opposing second surface. The first wire electrically couples the positive terminal to one of the surfaces of the leached component and the second wire electrically couples the negative terminal to the other surface of the leached component. The capacitance is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure.
摘要翻译： 一种用于使用电容测量来非特异性地表征超硬多晶结构内的一个或多个区域的方法，系统和装置。 该装置包括具有正和负端子的电容测量装置，包括多晶结构的浸出部件，第一线和第二线。 浸出的组分包括第一表面和相对的第二表面。 第一线将正端子电耦合到浸出部件的一个表面，并且第二线将负极端子电耦合到浸出部件的另一表面。 测量电容一次或多次，并与校准曲线进行比较，以确定多晶结构内的估计浸出深度。 确定数据散射范围以确定多晶结构的相对孔隙率或多晶结构内的浸出质量。
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公开(公告)号：US20130214768A1
公开(公告)日：2013-08-22
申请号：US13401231
申请日：2012-02-21
IPC分类号： G01R33/12
摘要： A method, system, and apparatus for non-destructively characterizing one or more regions within an ultra-hard polycrystalline structure using eddy current measurements. The apparatus includes an eddy current measuring device having at least one terminal, a leached component comprising a polycrystalline structure, a first wire, and a probe. The leached component includes a cutting surface and an opposing second surface. A portion of the polycrystalline structure extending inwardly from the cutting surface has at least a portion of a catalyst material removed from therein. The first wire electrically couples the terminal to the probe, which is placed in contact with the cutting surface. The eddy current is measured one or more times and compared to a calibration curve to determine an estimated leaching depth within the polycrystalline structure. A data scattering range is ascertained to determine a relative porosity of the polycrystalline structure or the leaching quality within the polycrystalline structure.
摘要翻译： 一种用于使用涡流测量在非硬质多晶结构内非破坏性地表征一个或多个区域的方法，系统和装置。 该装置包括具有至少一个端子的涡流测量装置，包括多晶结构的浸出部件，第一焊丝和探针。 浸出的组分包括切割表面和相对的第二表面。 从切割表面向内延伸的多晶结构的一部分具有从其中去除的催化剂材料的至少一部分。 第一线将端子电耦合到与切割表面接触的探针。 测量涡流一次或多次，并与校准曲线进行比较，以确定多晶结构内的估计浸出深度。 确定数据散射范围以确定多晶结构的相对孔隙率或多晶结构内的浸出质量。
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公开(公告)号：US20130213720A1
公开(公告)日：2013-08-22
申请号：US13482285
申请日：2012-05-29
CPC分类号： C22C26/00 , B22F2003/244 , B22F2005/001 , E21B10/46 , E21B10/567
摘要： A cleaned component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned component, and a method for determining the effectiveness of cleaning the leached component. The cleaned component includes a leached layer that has at least a portion of by-product materials removed. The by-product materials were deposited into the leached layer during a leaching process that formed the leached layer. The apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. Optionally, a transducer emits ultrasonic waves into the leached layer. The method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned component, measuring one or more capacitance values of the cleaned component, repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.
摘要翻译： 具有多晶结构的清洁部件，用于清洁浸出部件以形成清洁部件的方法和装置，以及用于确定清洗部件的有效性的方法。 清洁的部件包括具有除去的副产物材料的至少一部分的浸出层。 在形成浸出层的浸出过程中，副产物材料沉积到浸出层中。 用于清洁的装置和方法包括罐，置于罐内的清洗液，以及浸入清洗液中的浸出层的至少一部分。 可选地，换能器将超声波发射到浸出层中。 用于确定清洁效果的方法包括清洗浸出的部件以形成清洁的部件，测量清洁部件的一个或多个电容值，重复清洁和测量直到达到稳定的下限电容值。
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