摘要:
Interconnect driver circuits that can be used in the interconnect structures of dynamic integrated circuits (ICs) such as dynamic programmable logic devices (PLDs). An exemplary IC includes two or more logic circuits, and two or more self-resetting interconnect driver circuits coupled between the logic circuits. Each self-resetting interconnect driver circuit includes a multiplexer circuit driving a buffer circuit. In a first state, the buffer circuit drives a first value onto the output terminal of the buffer circuit. In a second state, the buffer circuit first drives a second value onto the output terminal of the buffer circuit and then returns to the first state. Several different circuits are described in detail.
摘要:
A programmable lookup table for an integrated circuit (IC) optionally provides two input signals and two output signals to an interconnect structure of the programmable IC when programmed to function as shift register logic. According to one embodiment, an integrated circuit includes an interconnect structure and a N-input lookup table (LUT) having input and output terminals coupled to the interconnect structure, where N is a integer. The LUT can be configured to function as a (2**(N−1))-bit shift register having a shift in input signal and one output signal coupled to the interconnect structure, or as a two (2**(N−2))-bit shift registers having two shift in input signals and two output signals coupled to the interconnect structure. In some embodiments, each bit of the shift register includes two memory cells of the LUT, a first memory cell functioning as a master latch and a second memory cell functioning as a slave latch.
摘要:
A programmable logic block reduces output delay by bypassing a final slave latch when programmed to function as a shift register. The logic block includes memory cells, a multiplexer structure, and a bypass select multiplexer (BSM). The memory cells are coupled in series to form a shift register controlled by a shift clock, each bit including two paired memory cells implementing master and slave latches. Each memory cell drives an input terminal of the multiplexer structure. The BSM drives a select terminal of the multiplexer structure and selects one signal from each pair of the memory cells. The shift clock drives one data input terminal of the BSM. When in shift register mode, the shift clock simultaneously shifts a value in each master latch to the corresponding slave latch and selects a value from one of the master latches. The output path bypasses the slave latch of the selected bit.
摘要:
A programmable logic block provides an improved output delay by bypassing the memory array and multiplexer structure when programmed to function as a random access memory (RAM) and a new value is written to the RAM. A programmable logic block includes memory cells, a multiplexer structure, a memory element, a bypass select multiplexer, and a control circuit. The memory cells implement a RAM driven by a write data input signal and a write enable signal. Each memory cell drives an input terminal of the multiplexer structure. Under the control of the write enable signal, a bypass select multiplexer selects either the write data input signal (in RAM mode) or the output terminal of the multiplexer structure (in another mode), and passes the selected signal to a memory element. Thus, when in RAM mode, write data is simultaneously written to a specified location in the RAM and to the memory element.
摘要:
A programmable logic block provides two lookup table (LUT) output signals to a general interconnect structure in an integrated circuit (IC), one output terminal of the logic block being dedicated to a first LUT output signal, and the other output terminal having a selectable input that can provide either of the two LUT output signals to the general interconnect structure. An IC includes an interconnect structure (e.g., a programmable interconnect structure) and a programmable logic block coupled to the interconnect structure. The programmable logic block includes a LUT having two output terminals. A first LUT output terminal is non-programmably coupled to the interconnect structure via a first output terminal of the logic block. Both the first and the second LUT output terminals are programmably coupled to the interconnect structure via a second output terminal of the logic block, e.g., via a programmable multiplexer selecting between the two LUT output terminals.
摘要:
A programmable lookup table optionally provides two input signals and two output signals to an interconnect structure of a programmable integrated circuit when programmed to function as a random access memory (RAM). An integrated circuit includes an interconnect structure and a N-input lookup table (LUT) having input and output terminals coupled to the interconnect structure. The LUT can be configured to function as a single-bit wide RAM (e.g., a (2**N)×1 RAM) having N input address signals coupled to the interconnect structure and one output signal coupled to the interconnect structure, or as a multi-bit wide RAM (e.g., a (2**(N−1))×2 RAM) having fewer than N (e.g., N−1) input address signals coupled to the interconnect structure and at least two output signals coupled to the interconnect structure. Optionally, the LUT can also be configured as shift register logic, e.g., a 2**(N−1)-bit shift register or two 2**(N−2)-bit shift registers.
摘要:
A programmable logic device (PLD) includes dynamic lookup table (LUT) circuits, an interconnect structure implemented in either dynamic or static logic, and optional static logic circuits. Each dynamic LUT circuit has paired true and complement input terminals and provides to the interconnect structure both true and complement output signals pre-charged to a first known value. In some embodiments, the LUT circuits are self-resetting circuits that detect when the paired input signals are valid and evaluate the LUT output values at that time. Once a valid LUT output value has been produced, the LUT resets itself in anticipation of the next valid input condition. In some embodiments, the LUT circuits are implemented using clocked dynamic logic. Routing multiplexers in the interconnect structure can be static or dynamic logic, optionally skewed. Clocked LUTs and routing multiplexers use either of two clock phases under the control of configuration memory cells of the PLD.
摘要:
Lookup table (LUT) circuits can optionally be configured as two or more smaller LUTs having independent input signals. A LUT circuit includes a tristate buffer circuit coupled between first and second multiplexer stages. The data input of the tristate buffer circuit is provided as a first output signal from the LUT circuit. The output of the second multiplexer stage provides the second LUT output signal. The tristate buffer circuit can include a tristate buffer with a pullup and a pulldown on the output terminal. To configure the circuit as a single LUT, the buffer is enabled (tristate disabled), and both the pullup and pulldown are turned off. To configure the circuit as two separate LUTs, the buffer is tristated and either the pullup or the pulldown is enabled. Additional multiplexer stages and tristate buffer circuits can be included to enable the division of the circuit into larger numbers of LUTs.
摘要:
A programmable logic block provides N-bit and M-bit (e.g., (N/2)-bit) lookahead functionality for carry chains traversing the logic block, N and M being integers greater than one. An exemplary programmable logic block includes four carry multiplexers that together form a 4-bit lookahead carry chain. The 4-bit lookahead carry chain also provides a 2-bit lookahead output after the second carry multiplexer. Alternatively, the last two bits of the 4-bit lookahead carry chain can be used as a 2-bit lookahead carry chain. In one embodiment, the programmable logic block also includes four function generators associated with the four carry multiplexers. Each function generator drives a select terminal of the associated carry multiplexer. The 4-bit and 2-bit carry chains can be programmably coupled to an interconnect structure of the PLD at the carry out output terminals. In some embodiments, an initialization value can also be provided to the 4-bit and 2-bit carry chains.
摘要:
A test circuit to test rise delay/fall delay performance on a semiconductor device may comprise a latch to latch data at its input responsive to a clock signal. The latch may source an output signal related to the data latched. A buffer chain may be configured to serially propagate the signal sourced by the latch from the latch output back to the clock input, as the clock signal. A reset/set input of the latch may be configured to receive a reset/set signal from an intermediate node of the buffer chain.