摘要:
A self-clocking memory device comprises a memory array, a memory input circuit, and a memory control circuit. The memory input circuit is operable to receive an input clock signal and generate a memory operation initiation signal in response thereto, while the memory control circuit is operable to receive the memory operation initiation signal and generate one or more control signals to initiate a memory operation in response thereto. The memory control circuit is further operable to identify completion of the memory operation and generate a cycle ready strobe signal in response thereto. The memory input circuit receives the cycle ready strobe signal as an input and generates a next memory operation initiation signal in response thereto for initiation of a next memory operation.
摘要:
A self-clocking memory device comprises a memory array, a memory input circuit, and a memory control circuit. The memory input circuit is operable to receive an input clock signal and generate a memory operation initiation signal in response thereto, while the memory control circuit is operable to receive the memory operation initiation signal and generate one or more control signals to initiate a memory operation in response thereto. The memory control circuit is further operable to identify completion of the memory operation and generate a cycle ready strobe signal in response thereto. The memory input circuit receives the cycle ready strobe signal as an input and generates a next memory operation initiation signal in response thereto for initiation of a next memory operation.
摘要:
A self-clocking memory device comprises a memory array, a memory input circuit, and a memory control circuit. The memory input circuit is operable to receive an input clock signal and generate a memory operation initiation signal in response thereto, while the memory control circuit is operable to receive the memory operation initiation signal and generate one or more control signals to initiate a memory operation in response thereto. The memory control circuit is further operable to identify completion of the memory operation and generate a cycle ready strobe signal in response thereto. The memory input circuit receives the cycle ready strobe signal as an input and generates a next memory operation initiation signal in response thereto for initiation of a next memory operation.
摘要:
A method of reducing power supply current transients in a memory array caused by a simultaneous change in logic state of numerous CMOS digital circuits during a memory write cycle. Write driver enable signals (ENT, ENC) and bitcell enable signals (WBC1-WBC24) are sequentially delayed in time during the write cycle through use of the propagation delay of inverters (INV1-INV24-7). The sequential time delay reduces the number of circuits that are simultaneously changing logic state at any given time during the write cycle. The power supply current transient is transformed from a single, large change in current to a series of smaller changes displaced in time from each other during the write cycle. The ground bounce of the power supply network attributed to the current transient is significantly reduced, such change in ground potential being directly related to the magnitude of the current transient and its rate of change with respect to time.
摘要:
A method and circuit for verifying the burst-mode operation and the frequency characterization of a self-timed sequential circuit 2 in burst mode by detecting and measuring an output 15 of the self-timed sequential circuit 2.
摘要:
A method for evaluating an output of a sequential circuit 2 by storing a series of output pulses from the sequential circuit 2 and determining whether the output pulses 4 toggled as desired. Also a circuit 1 for evaluating an output 4 of a sequential circuit 2 that determines if the output pulses 4 toggled as desired.
摘要:
A memory device (10) includes a memory array (12) having storage units (14) arranged in a plurality of rows (16). A row decoder (18) receives address information and determines which of the plurality of rows (16) to enable. According to the determined row (16), a row selector (20) drives the storage units (14) associated with the determined row (16) to provide their outputs onto respective bitlines (34) for identification by a bitline sensor (22). If the received address information indicates an out of range address that does not identify any of the plurality of rows (16) of the memory array (12), an out of range decoder (24) provides such determination to drive an out of range selector (26) to enable storage units (30) arranged in a single row (32) of a bitline driver (28). Outputs from the storage units (30) are applied to the respective bitlines (34) during an out of range address occurrence to prevent the bitlines (34) from being placed in an undesirable floating state.