System, method, and computer program product for optimizing a manufacturing process

    公开(公告)号:US11698628B2

    公开(公告)日:2023-07-11

    申请号:US17175785

    申请日:2021-02-15

    IPC分类号: G05B19/418

    摘要: Provided are a system, method, and computer program product for optimizing a manufacturing process. The method includes receiving manufacturing data associated with a manufacturing process for manufacturing a product. The manufacturing data may include data from a plurality of data sources associated with a plurality of stages of the manufacturing process, and the manufacturing data may include values for a plurality of parameters including at least one process parameter value and at least one quality parameter value. The method includes generating a time-sequenced data structure including the manufacturing data and transforming the time-sequenced data structure to a positionally-dimensioned data structure based on timing data associated with the plurality of stages. The method includes determining a new value for the at least one process parameter value based on the positionally-dimensioned data structure and at least one algorithm and optimizing the manufacturing process based on the new value.

    System, Method, and Computer Program Product for Optimizing a Manufacturing Process

    公开(公告)号:US20210286341A1

    公开(公告)日:2021-09-16

    申请号:US17175785

    申请日:2021-02-15

    IPC分类号: G05B19/418

    摘要: Provided are a system, method, and computer program product for optimizing a manufacturing process. The method includes receiving manufacturing data associated with a manufacturing process for manufacturing a product. The manufacturing data may include data from a plurality of data sources associated with a plurality of stages of the manufacturing process, and the manufacturing data may include values for a plurality of parameters including at least one process parameter value and at least one quality parameter value. The method includes generating a time-sequenced data structure including the manufacturing data and transforming the time-sequenced data structure to a positionally-dimensioned data structure based on timing data associated with the plurality of stages. The method includes determining a new value for the at least one process parameter value based on the positionally-dimensioned data structure and at least one algorithm and optimizing the manufacturing process based on the new value.

    Solar Control Coating With Discontinuous Metal Layer

    公开(公告)号:US20190276352A1

    公开(公告)日:2019-09-12

    申请号:US16423489

    申请日:2019-05-28

    IPC分类号: C03C17/36

    摘要: An architectural transparency includes a substrate; a first dielectric layer over at least a portion of the substrate, a first metallic layer over the first dielectric layer, a first primer layer over the first metallic layer, a second dielectric layer over the first primer layer, a second metallic layer over the second dielectric layer, a second primer layer over the second metallic layer, a third dielectric layer over the second primer layer, a third metallic layer over the third dielectric layer, a third primer layer over the third dielectric layer, and a fourth dielectric layer over the third primer layer. At least one of the metallic layers is a subcritical metallic layer.