-
公开(公告)号：US6118855A
公开(公告)日：2000-09-12
申请号：US83692
申请日：1998-05-21
摘要： X-ray examination apparatus including a filter An X-ray examination apparatus (1) includes an X-ray source (2), an X-ray detector (5) and an X-ray filter (6). The X-ray filter (6) is arranged between the X-ray source and the X-ray detector. The X-ray filter (6) includes a plurality of filter elements (7) whose X-ray absorptivity can be adjusted by adjusting a quantity of X-ray absorbing liquid (30) present in individual filter elements (7). The filter elements are formed by substantially parallel plates (8), respective plates being provided with separating members (10) which project approximately transversely from the plane of such a plate. The filter elements are formed notably by parallel corrugated plates or by parallel plates provided with partitions extending transversely from the plates.
摘要翻译： 包括滤光片的X射线检查装置X射线检查装置（1）包括X射线源（2），X射线检测器（5）和X射线滤波器（6）。 X射线过滤器（6）设置在X射线源和X射线检测器之间。 X射线过滤器（6）包括多个过滤器元件（7），其可以通过调节存在于各个过滤器元件（7）中的X射线吸收液体（30）的量来调节其X射线吸收率。 过滤元件由基本上平行的板（8）形成，相应的板设置有从该板的平面大致横向突出的分离构件（10）。 过滤器元件特别地由平行的波纹板形成，或者由设置有从板横向延伸的隔板的平行板形成。
-
公开(公告)号：US06181774B2
公开(公告)日：2001-01-30
申请号：US09316782
申请日：1999-05-21
申请人： Menno W. J. Prins , Jacobus B. Giesbers , Johannes W. Weekamp , Theodorus J. A. M. Jans , Wilhelmus J. J. Welters , Nicolaas P. Willard
发明人： Menno W. J. Prins , Jacobus B. Giesbers , Johannes W. Weekamp , Theodorus J. A. M. Jans , Wilhelmus J. J. Welters , Nicolaas P. Willard
IPC分类号： G21K300
CPC分类号： B29D99/0089 , B29C37/0075 , G21K1/10
摘要： An X-ray examination apparatus of this invention comprises an X-ray source, an X-ray detector and an X-ray filter which is located between the X-ray source and the X-ray detector. The X-ray filter includes filter elements, notably capillary tubes, and the X-ray absorption of separate filter elements can be controlled by controlling a quantity of X-ray absorbing liquid in the respective filter elements. The quantity of X-ray absorbing liquid in the individual filter elements is controlled by way of electric voltages applied to the individual filter elements. The filter elements are formed as spaces between deformed foils which are arranged in a stack which is expanded in the direction transversely of the foils. Adjacent foils are locally attached to one another along seams. The stack is arranged between rigid plates and buffer elements are provided between the rigid plates and the stack. The buffer elements are contractable in the direction transversely to the direction of expansion of the stack. The shape of the cross-section of the capillary tubes is dependent on the ratio of the width of the seams to the spacing of the seams.
摘要翻译： 本发明的X射线检查装置包括位于X射线源和X射线检测器之间的X射线源，X射线检测器和X射线滤波器。 X射线过滤器包括过滤元件，特别是毛细管，并且可以通过控制各个过滤器元件中的X射线吸收液体的量来控制单独的过滤器元件的X射线吸收。 各个过滤元件中的X射线吸收液体的量通过施加到各个过滤器元件的电压来控制。过滤元件形成为在横向方向上膨胀的堆叠中布置的变形箔之间的空间 的箔。 相邻的箔片沿着接缝局部附着在一起。 堆叠布置在刚性板之间，缓冲元件设置在刚性板和堆叠之间。 缓冲元件可沿横向于堆叠的膨胀方向收缩。 毛细管横截面的形状取决于接缝宽度与接缝间距的比例。
-
公开(公告)号：US6061426A
公开(公告)日：2000-05-09
申请号：US166432
申请日：1998-10-05
申请人： Petrus W. J. Linders , Herman Stegehuis , Wilhelmus J. J. Welters , Nicolaas P. Willard , Lambertus G. J. Fokkink
发明人： Petrus W. J. Linders , Herman Stegehuis , Wilhelmus J. J. Welters , Nicolaas P. Willard , Lambertus G. J. Fokkink
CPC分类号： G21K1/10
摘要： An X-ray examination apparatus includes an X-ray source (1) for emitting X-rays. An object to be radiologically examined is arranged in an examination space. An X-ray detector (2) derives an image signal, for example an electronic video signal, from an X-ray image of the object. An X-ray filter locally attenuates the X-rays partly. The X-ray filter is arranged between the X-ray source and the X-ray detector and the X-ray filter is provided with filter elements whose X-ray absorptivity can be adjusted on the basis of an amount of X-ray absorbing liquid present within the individual filter elements.The X-ray examination apparatus includes an X-ray collimator for locally intercepting the X-rays. The X-ray collimator is arranged between the X-ray source and the examination space and is provided with collimator elements which can be switched between an X-ray transmitting state and an X-ray intercepting state. Individual collimator elements are filled with an X-ray intercepting liquid in the X-ray intercepting state.The amount of X-ray absorbing liquid present in the filter elements is controlled by application of an electric voltage to the relevant filter elements. The collimator elements are switched between the X-ray intercepting state and the X-ray transmitting state by means of an electric voltage which is applied to the relevant collimator elements.
摘要翻译： X射线检查装置包括用于发射X射线的X射线源（1）。 将放射学检查的对象布置在检查空间中。 X射线检测器（2）从对象的X射线图像导出图像信号，例如电子视频信号。 X射线滤波器部分地局部衰减X射线。 X射线滤光器配置在X射线源和X射线检测器之间，X射线滤光片设置有可以根据X射线吸收液量的X射线吸收率进行调整的滤光元件 存在于各个过滤元件内。 X射线检查装置包括用于局部截断X射线的X射线准直器。 X射线准直仪设置在X射线源和检查空间之间，并且设置有能够在X射线透射状态和X射线截取状态之间切换的准直元件。 单个准直器元件在X射线拦截状态下被X射线拦截液体填充。 通过向相关的过滤元件施加电压来控制存在于过滤元件中的X射线吸收液体的量。 准直器元件通过施加到相关准直器元件的电压在X射线拦截状态和X射线透射状态之间切换。
-
公开(公告)号：US5966426A
公开(公告)日：1999-10-12
申请号：US957992
申请日：1997-11-05
CPC分类号： G21K1/10
摘要： An X-ray examination apparatus (1) is provided with an X-ray source (2) and an X-ray detector (5) wherebetween there is arranged an X-ray filter (6) which includes filter elements (7) whose X-ray absorptivity can be adjusted by controlling the quantity of X-ray absorbing liquid (31) in individual filter elements (7). The filter elements (7) are formed by spaces between electrically conductive tracks (9) provided on parallel plates (8). The parallel plates are arranged in a reservoir (31) for the X-ray absorbing liquid. The liquid level in the vicinity of an electrically conductive track is controlled on the basis of an electric voltage applied to the relevant electrically conductive track (9).
摘要翻译： X射线检查装置（1）设置有X射线源（2）和X射线检测器（5），其中设置有包括过滤元件（7）的X射线滤光器（6），其中X 可以通过控制各个过滤元件（7）中的X射线吸收液（31）的量来调节光线吸收率。 过滤器元件（7）由设置在平行板（8）上的导电轨道（9）之间的空间形成。 平行板布置在用于X射线吸收液体的储存器（31）中。 基于施加到相关导电轨道（9）的电压来控制导电轨道附近的液位。
-
公开(公告)号：US5751786A
公开(公告)日：1998-05-12
申请号：US679037
申请日：1996-07-12
IPC分类号： G01N23/04 , A61B6/00 , B09B3/00 , F23G5/027 , F23G5/08 , F23G5/12 , F23G5/30 , F23G5/50 , F23G7/12 , G21K1/10 , G21K3/00
CPC分类号： G21K1/10 , F23G5/085 , F23G5/12 , F23G7/12 , F23G2209/102 , F23G2209/26 , F23G2209/281 , F23G2900/7006 , F23L2900/07007 , Y02E20/344
摘要： An X-ray examination apparatus (1) includes a filter (4) which is arranged between the X-ray source (2) and the X-ray detector (3). The X-ray filter includes a large number of filter elements (5); the X-ray absorptivity of the filter elements can be adjusted by controlling the quantity of X-ray absorbing liquid (6) than individual filter elements. The filter elements are formed by metal capillary tubes or the wall of the capillary tubes, or the wall of the capillary tubes is provided with a metal layer (7). On the metal layer there is provided a dielectric layer (8) and the dielectric layer is covered by a coating layer (9). The dielectric layer is, for example a glass, parylene or polystyrene layer. The coating layer is, for example a Teflon, silane or siloxane layer. The dielectric layer can be dispensed with when a Teflon coating layer is used.
摘要翻译： X射线检查装置（1）包括设置在X射线源（2）和X射线检测器（3）之间的滤光器（4）。 X射线滤光器包括大量滤光元件（5）; 过滤元件的X射线吸收率可以通过控制X射线吸收液（6）的量比单个的过滤元件来调节。 过滤元件由金属毛细管或毛细管的壁形成，或者毛细管的壁设有金属层（7）。 在金属层上设置介电层（8），电介质层被涂层（9）覆盖。 电介质层是例如玻璃，聚对二甲苯或聚苯乙烯层。 涂层是例如特氟隆，硅烷或硅氧烷层。 当使用特氟龙涂层时，可以省去电介质层。
-
-
-
-
搜索结果
5 条记录 (耗时 0.016 秒)
