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    Multichannel spectrophotometer using linear variable filter sensor
    2.
    发明授权
    Multichannel spectrophotometer using linear variable filter sensor 有权

    公开(公告)号：US12174069B2

    公开(公告)日：2024-12-24

    申请号：US17922761

    申请日：2021-05-05

    Applicant: X-Rite Incorporated

    Inventor： Chris Boes ,  Richard Van Andel ,  Rob Kuschinsky ,  David Salyer ,  Brad Remenak

    IPC: G01J3/02 ,  G01J3/51 ,  G01N21/25 ,  G02B13/08

    Abstract: A multichannel color measurement instrument for measuring spectral properties of a target comprises pick-up optics to collect measurement light, first and second anamorphic optical paths optically coupled to the pick up optics, a pick-up polarizing element located to polarize measurement light in the second anamorphic optical path, a reference anamorphic optical path including a reference illumination source, and a two-dimensional variable filter sensor having an optically transmissive filter function that varies in a first direction parallel to a surface of the variable filter sensor and is substantially constant in a second direction parallel to a surface of the variable filter sensor and orthogonal to the first direction. The anamorphic optical paths spread the measurement light in the first direction direct it on to different portions of the variable filter sensor.

    TARGETING SYSTEM
    5.
    发明申请
    TARGETING SYSTEM 审中-公开
    瞄准系统

    公开(公告)号：US20170052066A1

    公开(公告)日：2017-02-23

    申请号：US14782461

    申请日：2015-04-16

    Applicant: X-RITE, INCORPORATED

    Inventor： Weston Harness ,  David Salyer

    IPC: G01J3/02 ,  G01J3/04

    CPC classification number: G01J3/0289 ,  G01J1/0425 ,  G01J1/0462 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/04 ,  G02B6/42

    Abstract: A targeting system for a spectrophotometer includes a plurality of fiber channels, including at least one measurement channel and at least one illumination channel. A slit assembly includes a translucent layer disposed adjacent the plurality of fiber channels, and reflective portion disposed adjacent the translucent layer. Each fiber channel includes a first end, the first end offset from the reflective portion of the slit assembly to allow light transfer from one fiber channel to an adjacent fiber channel. A light source is in optical communication with the at least one illumination channel. A sample plane is in optical communication with a second end of the measurement channel. The system is configured such that light is transmitted from the light source, through the at least one illumination channel, reflected off the slit assembly, transmitted through the measurement channel, and onto the sample plane.

    Abstract translation: 用于分光光度计的瞄准系统包括多个光纤通道，包括至少一个测量通道和至少一个照明通道。 狭缝组件包括邻近多个纤维通道设置的半透明层和邻近半透明层设置的反射部分。 每个光纤通道包括第一端，第一端偏离狭缝组件的反射部分，以允许从一个光纤通道到相邻光纤通道的光传输。 光源与所述至少一个照明通道光学通信。 样品平面与测量通道的第二端光学通信。 该系统被配置为使得光从光源透过至少一个照明通道，从狭缝组件反射出来，透射通过测量通道并传播到样品平面上。

    Targeting system for color measurement device
    6.
    发明授权
    Targeting system for color measurement device 有权

    公开(公告)号：US10190911B2

    公开(公告)日：2019-01-29

    申请号：US14782461

    申请日：2015-04-16

    Applicant: X-RITE, INCORPORATED

    Inventor： Weston Harness ,  David Salyer

    IPC: G01J3/02 ,  G01J3/04 ,  G01J1/04 ,  G02B6/42

    Abstract: A targeting system for a spectrophotometer includes a plurality of fiber channels, including at least one measurement channel and at least one illumination channel. A slit assembly includes a translucent layer disposed adjacent the plurality of fiber channels, and reflective portion disposed adjacent the translucent layer. Each fiber channel includes a first end, the first end offset from the reflective portion of the slit assembly to allow light transfer from one fiber channel to an adjacent fiber channel. A light source is in optical communication with the at least one illumination channel. A sample plane is in optical communication with a second end of the measurement channel. The system is configured such that light is transmitted from the light source, through the at least one illumination channel, reflected off the slit assembly, transmitted through the measurement channel, and onto the sample plane.

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