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    DISTANCE MEASUREMENT SYSTEMS AND METHODS
    1.
    发明申请
    DISTANCE MEASUREMENT SYSTEMS AND METHODS 审中-公开
    距离测量系统和方法

    公开(公告)号：US20120149281A1

    公开(公告)日：2012-06-14

    申请号：US13312595

    申请日：2011-12-06

    申请人： Xinjun WAN ,  Guju Song ,  Kevin George Harding ,  Shukuan Xu ,  Steven Robert Hayashi ,  Robert William Tait ,  James Joseph Hoffman ,  Charles Walter Muchmore ,  Matthew Michael Gluesenkamp

    发明人： Xinjun WAN ,  Guju Song ,  Kevin George Harding ,  Shukuan Xu ,  Steven Robert Hayashi ,  Robert William Tait ,  James Joseph Hoffman ,  Charles Walter Muchmore ,  Matthew Michael Gluesenkamp

    IPC分类号： B24B51/00 ,  G01B11/24

    CPC分类号： G01B11/026

    摘要： A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.

    摘要翻译： 距离测量系统包括被配置为产生光束的光学距离传感器，第一光学模块和处理器。 第一光学模块被配置为接收光束，并且生成并选择性地透射具有不同光通道的多个光束，用于投射到物体的一个或多个点上，以产生从相应的一个或多个散射的一个或多个反射光束 并且将一个或多个反射光束捕获并传输到光学距离传感器中以将多个距离数据提取到对象的相应一个或多个点。 处理器被配置为处理距离数据以确定对象的相应一个或多个点的位置信息。 还提出了一种距离测量方法。

    MEASUREMENT SYSTEMS AND METHODS
    2.
    发明申请
    MEASUREMENT SYSTEMS AND METHODS 失效
    测量系统和方法

    公开(公告)号：US20120147383A1

    公开(公告)日：2012-06-14

    申请号：US13312423

    申请日：2011-12-06

    申请人： Li TAO ,  Guiju Song ,  Xinjun Wan ,  Kevin George Harding ,  Steven Robert Hayashi ,  James Joseph Hoffman ,  Charles Walter Muekmore ,  Yana Zhang Williams ,  Shukuan Xu

    发明人： Li TAO ,  Guiju Song ,  Xinjun Wan ,  Kevin George Harding ,  Steven Robert Hayashi ,  James Joseph Hoffman ,  Charles Walter Muekmore ,  Yana Zhang Williams ,  Shukuan Xu

    IPC分类号： G01B11/24

    CPC分类号： G01B11/2513 ,  G01B11/2527 ,  G01S17/36 ,  G01S17/89

    摘要： A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.

    摘要翻译： 公开了一种包括光源单元，投影单元和光学单元的测量系统。 光源单元被配置为产生多个调制相移光束。 投影单元被配置为将调制的相移光束反射到物体表面上。 光学单元被配置为捕获来自物体表面的经调制的相移光束。 测量系统还包括光电检测器和处理器。 光电检测器被配置为从光学单元接收经调制的相移光束以产生电信号。 处理器被配置为基于来自光电检测器的电信号来检索物体表面的位置信息。 还提出了一种测量方法。

    Measurement systems and methods
    3.
    发明授权
    Measurement systems and methods 失效
    测量系统和方法

    公开(公告)号：US08643849B2

    公开(公告)日：2014-02-04

    申请号：US13312423

    申请日：2011-12-06

    申请人： Li Tao ,  Guiju Song ,  Xinjun Wan ,  Kevin George Harding ,  Steven Robert Hayashi ,  James Joseph Hoffman ,  Charles Walter Muekmore ,  Yana Zhang Williams ,  Shukuan Xu

    发明人： Li Tao ,  Guiju Song ,  Xinjun Wan ,  Kevin George Harding ,  Steven Robert Hayashi ,  James Joseph Hoffman ,  Charles Walter Muekmore ,  Yana Zhang Williams ,  Shukuan Xu

    IPC分类号： G02B11/24

    CPC分类号： G01B11/2513 ,  G01B11/2527 ,  G01S17/36 ,  G01S17/89

    摘要： A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.

    摘要翻译： 公开了一种包括光源单元，投影单元和光学单元的测量系统。 光源单元被配置为产生多个调制相移光束。 投影单元被配置为将调制的相移光束反射到物体表面上。 光学单元被配置为捕获来自物体表面的经调制的相移光束。 测量系统还包括光电检测器和处理器。 光电检测器被配置为从光学单元接收经调制的相移光束以产生电信号。 处理器被配置为基于来自光电检测器的电信号来检索物体表面的位置信息。 还提出了一种测量方法。

    System and method for extracting parameters of a cutting tool
    4.
    发明授权
    System and method for extracting parameters of a cutting tool 失效
    用于提取切削刀具参数的系统和方法

    公开(公告)号：US07577491B2

    公开(公告)日：2009-08-18

    申请号：US11289912

    申请日：2005-11-30

    申请人： Tian Chen ,  Kevin George Harding ,  Zhongguo Li ,  Jianming Zheng ,  Steven Robert Hayashi ,  Xiaoming Du

    发明人： Tian Chen ,  Kevin George Harding ,  Zhongguo Li ,  Jianming Zheng ,  Steven Robert Hayashi ,  Xiaoming Du

    IPC分类号： G06F19/00 ,  G01B5/20

    CPC分类号： B23Q17/249 ,  B23Q17/0919

    摘要： A method for extracting parameters of a cutting tool is provided. The method includes obtaining a measurement data set having a point cloud corresponding to a surface of the cutting tool and virtually slicing the point cloud at a pre-determined section to obtain a set of points on the pre-determined section. The method also includes generating a plurality of curves through the set of points and optimizing the plurality of curves to generate optimized fitting curves and extracting the parameters of the cutting tool from the optimized fitting curves. Furthermore, based on the presented rotary angle projection technique, a plurality of parameters can be extracted for the cutting tool.

    摘要翻译： 提供了一种用于提取切削工具的参数的方法。 该方法包括获得具有对应于切割工具的表面的点云的测量数据集，并且在预定部分上虚拟地分割点云以获得预定部分上的一组点。 该方法还包括通过该组点产生多个曲线并优化多个曲线以产生最优化的拟合曲线并从优化的拟合曲线提取切割工具的参数。 此外，基于所提出的旋转角投影技术，可以为切削工具提取多个参数。

    METHOD AND SYSTEM FOR GASH PARAMETER EXTRACTION OF A CUTTING TOOL
    7.
    发明申请
    METHOD AND SYSTEM FOR GASH PARAMETER EXTRACTION OF A CUTTING TOOL 有权
    用于切割工具的喷射参数提取的方法和系统

    公开(公告)号：US20100280649A1

    公开(公告)日：2010-11-04

    申请号：US12431999

    申请日：2009-04-29

    申请人： Tian Chen ,  Kevin George Harding ,  Steven Robert Hayashi ,  Xiaoming Du ,  Howard Paul Weaver ,  James Allen Baird ,  Xinjue Zou ,  Kevin William Meyer

    发明人： Tian Chen ,  Kevin George Harding ,  Steven Robert Hayashi ,  Xiaoming Du ,  Howard Paul Weaver ,  James Allen Baird ,  Xinjue Zou ,  Kevin William Meyer

    IPC分类号： G06F17/00

    CPC分类号： B23Q17/24 ,  B23Q17/0947 ,  G01B11/24

    摘要： A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.

    摘要翻译： 一种用于提取切割工具的沟槽参数的方法，包括将切割工具定位在可移动台上，扫描切割工具的两个或更多个间隙部分以产生两个或更多个间隙部分扫描点云，对该间隙扫描的多个点进行索引 使用索引的漏洞部分扫描点云来检测多个漏洞特征，将索引的漏洞部分扫描点云的漏隙特征的多个点云投影成一个或多个预测的间隙特征点云，识别一个或多个类型的 一个或多个预测的间隙特征点云，基于类型识别来分割一个或多个预测的间隙特征点云，以及基于所述一个或多个投影间隙特征点云的分割来提取一个或多个间隙参数。 还提出了一个提取参数的系统。

    Method and system for gash parameter extraction of a cutting tool
    9.
    发明授权
    Method and system for gash parameter extraction of a cutting tool 有权
    切削刀具的齿槽参数提取方法和系统

    公开(公告)号：US08112172B2

    公开(公告)日：2012-02-07

    申请号：US12431999

    申请日：2009-04-29

    申请人： Tian Chen ,  Kevin George Harding ,  Steven Robert Hayashi ,  Xiaoming Du ,  Howard Paul Weaver ,  James Allen Baird ,  Xinjue Zou ,  Kevin William Meyer

    发明人： Tian Chen ,  Kevin George Harding ,  Steven Robert Hayashi ,  Xiaoming Du ,  Howard Paul Weaver ,  James Allen Baird ,  Xinjue Zou ,  Kevin William Meyer

    IPC分类号： G06F19/00 ,  G01B5/20

    CPC分类号： B23Q17/24 ,  B23Q17/0947 ,  G01B11/24

    摘要： A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.

    摘要翻译： 一种用于提取切割工具的沟槽参数的方法，包括将切割工具定位在可移动台上，扫描切割工具的两个或更多个间隙部分以产生两个或更多个间隙部分扫描点云，对该间隙扫描的多个点进行索引 使用索引的漏洞部分扫描点云来检测多个漏洞特征，将索引的漏洞部分扫描点云的漏隙特征的多个点云投影成一个或多个预测的间隙特征点云，识别一个或多个类型的 一个或多个预测的间隙特征点云，基于类型识别来分割一个或多个预测的间隙特征点云，以及基于所述一个或多个投影间隙特征点云的分割来提取一个或多个间隙参数。 还提出了一个提取参数的系统。