SNAPSHOTS IN A HYBRID STORAGE DEVICE COMPRISING A MAGNETIC DISK AND A SOLID STATE DISK
    2.
    发明申请
    SNAPSHOTS IN A HYBRID STORAGE DEVICE COMPRISING A MAGNETIC DISK AND A SOLID STATE DISK 有权
    包含磁性磁盘和固态磁盘的混合存储设备中的快照

    公开(公告)号:US20120110287A1

    公开(公告)日:2012-05-03

    申请号:US12914491

    申请日:2010-10-28

    IPC分类号: G06F12/16 G06F12/00

    摘要: One or more snapshots of data stored over a period of time are maintained in a hybrid storage device comprising a magnetic disk and a solid state disk, wherein a selected snapshot stores information that allows recovery of data that is stored in the hybrid storage device at a selected point in time of the period of time. The hybrid storage device receives an input/output (I/O) command from a computational device. A category of a plurality of categories to which the I/O command belongs is determined, wherein the plurality of categories comprise writing to an unused block, writing to a used block, reading from an unused block, and reading from a used block. In response to determining the category to which the I/O command belongs, the I/O command is handled by one of the magnetic disk and the solid state disk based on the determined category.

    摘要翻译: 在一段时间内存储的数据的一个或多个快照被保存在包括磁盘和固态盘的混合存储设备中,其中所选择的快照存储允许以一种方式恢复存储在混合存储设备中的数据的信息 选定的时间点。 混合存储装置从计算装置接收输入/输出(I / O)命令。 确定I / O命令所属的多个类别的类别,其中所述多个类别包括写入未使用的块,写入使用的块,从未使用的块读取和从使用的块读取。 响应于确定I / O命令所属的类别,I / O命令基于所确定的类别由磁盘和固态盘中的一个来处理。

    Position control system for scanning probe microscope
    3.
    发明授权
    Position control system for scanning probe microscope 失效
    扫描探针显微镜位置控制系统

    公开(公告)号:US5729015A

    公开(公告)日:1998-03-17

    申请号:US591092

    申请日:1996-01-25

    申请人: Yi Tong

    发明人: Yi Tong

    摘要: A position control system for a scanning probe microscope which performs calculations so that the natural resonant frequency of a piezoelectric element may be as flat as possible, and then controls the scanning voltage of the piezoelectric element. The scanning signal from outside a position control circuit is inputted to an integral compensator via a comparator. The output of the integral compensator is supplied from an adder to the piezoelectric element via a high-voltage amplifier and also to a reference model section. The output of the piezoelectric element, together with the output of the reference model section, is supplied to a comparator and at the same time, is fed back to the comparator via a displacement sensor. Furthermore, the comparator inputs a correcting voltage Va to an adder via an adaptive mechanism section. The scanning voltage added at the adder is amplified at the high-voltage amplifier, which supplies the amplified voltage to the piezoelectric element as a control voltage Vp.

    摘要翻译: 一种用于扫描探针显微镜的位置控制系统,其执行计算,使得压电元件的固有谐振频率可以尽可能平坦,然后控制压电元件的扫描电压。 来自位置控制电路外部的扫描信号通过比较器输入到积分补偿器。 积分补偿器的输出由加法器通过高压放大器和参考模型部分提供给压电元件。 将压电元件的输出与参考模型部分的输出一起提供给比较器,并且同时经由位移传感器反馈到比较器。 此外,比较器经由自适应机构部向加法器输入校正电压Va。 在加法器处添加的扫描电压在高压放大器放大,其将放大的电压作为控制电压Vp提供给压电元件。

    Approaching device of scanning probe microscope
    4.
    发明授权
    Approaching device of scanning probe microscope 失效
    扫描探针显微镜接近装置

    公开(公告)号:US5847383A

    公开(公告)日:1998-12-08

    申请号:US723093

    申请日:1996-09-30

    申请人: Yi Tong

    发明人: Yi Tong

    摘要: Light is reflected from a cantilever, and the reflected light, except that part which is reflected from the back of the cantilever, is applied to a light-receiving device. A distance between the probe of the cantilever and a sample is determined in accordance with changes in the light in order to protect both the sample and the probe and to shorten the time the probe requires to reach the sample. The probe is moved toward the sample at high speed until the probe reaches a point close to the sample. A mechanism is provided which detects changes in a probe-displacement signal representing the displacement of the probe. A differentiation section provided in the mechanism differentiates the probe-displacement signal and generates a signal. The signal is supplied to a threshold determination section, which determines whether or not the output signal of the differentiation section exceeds a predetermined threshold value. When the signal is found to exceed the threshold value, an approaching interruption section generates an interruption command, which is supplied to a motor driver, stopping, a motor. As a result, a coarse adjustment mechanism stops moving the prove toward the sample. A voltage at a predetermined level is then immediately applied to a piezoelectric member, causing the piezoelectric member to contract in the Z direction, thereby moving the probe away from the sample.

    摘要翻译: 光从悬臂反射,除了从悬臂的背面反射的部分之外的反射光被施加到光接收装置。 根据光的变化来确定悬臂的探针与样品之间的距离,以便保护样品和探针,并缩短探针到达样品所需的时间。 探针以高速移动到样品,直到探头到达接近样品的点。 提供了一种机构,其检测表示探针的位移的探针位移信号的变化。 设置在该机构中的微分部分区分探针位移信号并产生信号。 信号被提供给阈值确定部分,其确定微分部分的输出信号是否超过预定阈值。 当发现信号超过阈值时,接近中断部分产生提供给电动机驱动器的停止命令,停止电动机。 结果,粗调机构停止向证件移动证明。 然后将一个预定电平的电压立即施加到压电元件上,使得压电元件在Z方向收缩,从而将探头移离样品。