摘要:
One or more snapshots of data stored over a period of time are maintained in a hybrid storage device comprising a magnetic disk and a solid state disk, wherein a selected snapshot stores information that allows recovery of data that is stored in the hybrid storage device at a selected point in time of the period of time. The hybrid storage device receives an input/output (I/O) command from a computational device. A category of a plurality of categories to which the I/O command belongs is determined, wherein the plurality of categories comprise writing to an unused block, writing to a used block, reading from an unused block, and reading from a used block. In response to determining the category to which the I/O command belongs, the I/O command is handled by one of the magnetic disk and the solid state disk based on the determined category.
摘要:
One or more snapshots of data stored over a period of time are maintained in a hybrid storage device comprising a magnetic disk and a solid state disk, wherein a selected snapshot stores information that allows recovery of data that is stored in the hybrid storage device at a selected point in time of the period of time. The hybrid storage device receives an input/output (I/O) command from a computational device. A category of a plurality of categories to which the I/O command belongs is determined, wherein the plurality of categories comprise writing to an unused block, writing to a used block, reading from an unused block, and reading from a used block. In response to determining the category to which the I/O command belongs, the I/O command is handled by one of the magnetic disk and the solid state disk based on the determined category.
摘要:
A position control system for a scanning probe microscope which performs calculations so that the natural resonant frequency of a piezoelectric element may be as flat as possible, and then controls the scanning voltage of the piezoelectric element. The scanning signal from outside a position control circuit is inputted to an integral compensator via a comparator. The output of the integral compensator is supplied from an adder to the piezoelectric element via a high-voltage amplifier and also to a reference model section. The output of the piezoelectric element, together with the output of the reference model section, is supplied to a comparator and at the same time, is fed back to the comparator via a displacement sensor. Furthermore, the comparator inputs a correcting voltage Va to an adder via an adaptive mechanism section. The scanning voltage added at the adder is amplified at the high-voltage amplifier, which supplies the amplified voltage to the piezoelectric element as a control voltage Vp.
摘要:
Light is reflected from a cantilever, and the reflected light, except that part which is reflected from the back of the cantilever, is applied to a light-receiving device. A distance between the probe of the cantilever and a sample is determined in accordance with changes in the light in order to protect both the sample and the probe and to shorten the time the probe requires to reach the sample. The probe is moved toward the sample at high speed until the probe reaches a point close to the sample. A mechanism is provided which detects changes in a probe-displacement signal representing the displacement of the probe. A differentiation section provided in the mechanism differentiates the probe-displacement signal and generates a signal. The signal is supplied to a threshold determination section, which determines whether or not the output signal of the differentiation section exceeds a predetermined threshold value. When the signal is found to exceed the threshold value, an approaching interruption section generates an interruption command, which is supplied to a motor driver, stopping, a motor. As a result, a coarse adjustment mechanism stops moving the prove toward the sample. A voltage at a predetermined level is then immediately applied to a piezoelectric member, causing the piezoelectric member to contract in the Z direction, thereby moving the probe away from the sample.