摘要:
A method in which during the formation of damascene features in a semiconductor structure, a planarization material is added to vias formed in the dielectric to protect the vias during subsequent lithographic processing. The planarization material preferred is a developable photosensitive material which can be exposed and developed to define the damascene features rather than etching as is conventional.
摘要:
A dual damascene structure and method of fabrication thereof. An insulating layer comprises a first dielectric material and a second dielectric material, the second dielectric material being different from the first dielectric material. First conductive regions having a first pattern are formed in the first dielectric material, and second conductive regions having a second pattern are formed in the second dielectric material, the second pattern being different from the first pattern. One of the first dielectric material and the second dielectric material comprises an organic material, and the other dielectric material comprises an inorganic material. One of the first and second dielectric materials is etchable selective to the other dielectric material. A method of cleaning a semiconductor wafer processing chamber while a wafer remains residing within the chamber is also disclosed.
摘要:
In damascene processing, metal hardmask sputtering redeposition that occurs during reactive ion etching (RIE) is exploited to produce, during the RIE process, a desired barrier metal liner on the etched feature.
摘要:
A method for fabricating a vertical three-dimensional metal-insulator-metal capacitor (MIM capacitor) structure is disclosed. The present invention utilized a vertical three-dimensional MIM capacitor structure on the substrate to decrease the structure area of the MIM capacitor in logic integrated circuit and integration for copper dual damascene process at an identical capacitance on a chip; therefore, the capacitance density of the vertical three-dimensional capacitor can be increased. Furthermore, the present invention is provided a method for fabricating the vertical three-dimensional MIM capacitor structure that compatible with the fabrication of the copper dual damascene structure such that the number of the photomask during the fabrication process can be reduced.
摘要:
An air cleaner includes a housing, a fan, one or more filtering elements, and a washing system. The housing is provided with an air inlet and an air outlet. The fan is mounted in the housing at a location corresponding to the air outlet and rotated by a motor. The filtering elements are arranged in the housing below the air outlet while above the air inlet. The washing system includes a drain pan, at least one sprinkler, a water tank and a pump, is located in the housing. The drain pan is provided with a drainage port and obliquely arranged below the filtering elements. The sprinkler is arranged above the filtering elements. The water tank and the pump are mounted at a bottom of the housing. An injection pipe is connected to the water tank and extends out of the housing for filling the water tank with water and/or detergent.
摘要:
A cooler includes a body, a water tank installed in the body for storing cooling water, a pump fixed in the water tank, a water pipe connected to the pump and extending upward, a spray pipe connected to the water pipe, at least one gas cooling device located above the spray pipe, at least one fan fixed on top of the body, at least one wind hole formed in a side of the body, at least one cooling pipe uprightly installed in the body and having an upper portion passing through heat-dispersing chips of the gas cooling device and a lower portion passing through heat-dispersing chips of the water cooling device, and at least one water-heat exchanger below the spray pipe and having a heat-dispersing element. The cooler has two stages of cooling by air and water, having a high effect of swift cooling high temperature to low temperature.
摘要:
A semiconductor structure and method of manufacturing the semiconductor structure, and more particularly to a semiconductor structure having reduced metal line resistance and a method of manufacturing the same in back end of line (BEOL) processes. The method includes forming a first trench extending to a lower metal layer Mx+1 and forming a second trench remote from the first trench. The method further includes filling the first trench and the second trench with conductive material. The conductive material in the second trench forms a vertical wiring line extending orthogonally and in electrical contact with an upper wiring layer and electrically isolated from lower metal layers including the lower metal layer Mx+1. The vertical wiring line decreases a resistance of a structure.
摘要:
A powder fuel engine includes a battery, a cylinder and a generator. The battery is connected with an air compressor linked with an air tank, and the generator. The air tank is connected with a mixer and two powder tanks respectively via a pressurization tube. The powder tanks are to store different powders and respectively connected with a powder tube connected with the mixer. A powder jetting device connected to the mixer is connected with the cylinder that is provided with a powder combustion chamber, a piston, a spark plug and an outlet. The piston is connected with a connecting rod that is connected with a shaft. The generator is connected with an ignition device that is connected with the spark plug.
摘要:
A method of forming a via using a dual damascene process can include removing a material from a recess in a low-k material using an ashing process while maintaining a protective spacer on an entire side wall of the recess to cover the low-k material in the recess.
摘要:
A semiconductor structure and method of manufacturing the semiconductor structure, and more particularly to a semiconductor structure having reduced metal line resistance and a method of manufacturing the same in back end of line (BEOL) processes. The method includes forming a first trench extending to a lower metal layer Mx+1 and forming a second trench remote from the first trench. The method further includes filling the first trench and the second trench with conductive material. The conductive material in the second trench forms a vertical wiring line extending orthogonally and in electrical contact with an upper wiring layer and electrically isolated from lower metal layers including the lower metal layer Mx+1. The vertical wiring line decreases a resistance of a structure.