摘要:
A microscope imaging apparatus and a biological-specimen examination system that can accurately carry out measurement even for an object under examination having substantial brightness non-uniformity are provided. The microscope imaging apparatus includes a stage that holds the object under examination, an illumination unit that illuminates the object under examination, an image-acquisition unit that acquires images of the object under examination, and a motion unit that moves the stage and the image-acquisition unit relative to each other. The image-acquisition unit includes an imaging device capable of image acquisition using a time delay integration method. When acquiring a plurality of images of the object under examination, the exposure time during which accumulated charge is produced in the imaging device is made different for each of the acquired images, and the plurality of images are combined into a single image.
摘要:
A microscope imaging apparatus and a biological-specimen examination system that can accurately carry out measurement even for an object under examination having substantial brightness non-uniformity are provided. The microscope imaging apparatus includes a stage that holds the object under examination, an illumination unit that illuminates the object under examination, an image-acquisition unit that acquires images of the object under examination, and a motion unit that moves the stage and the image-acquisition unit relative to each other. The image-acquisition unit includes an imaging device capable of image acquisition using a time delay integration method. When acquiring a plurality of images of the object under examination, the exposure time during which accumulated charge is produced in the imaging device is made different for each of the acquired images, and the plurality of images are combined into a single image.
摘要:
An object is to provide a biological sample observation system wherein light damage to the biological sample is decreased, and observation can be performed accurately and quickly over a long period of time. A biological sample observation system which continuously obtains information on a biological sample that is cultured inside of a culturing container has: an imaging section which observes mutually different regions that are previously selected, among regions to be observed including the biological sample, through an object lens for observing the biological sample in the culturing container through a part of the culturing container; an autofocus section which detects the focusing of the object lens with respect to a predetermined region among the regions to be observed; and a focusing drive control section which controls the focusing of the object lens when the biological sample is observed using the imaging section, based on the detection result of the focusing previously performed by the autofocus section. After the focus detection is performed by the autofocus section, without being intervened by the focus detection using the autofocus section, and the different regions are continuously observed by the imaging section, with the focusing controlled by the focusing drive control section.
摘要:
A microscope imaging apparatus and a biological-specimen examination system that can accurately carry out measurement even for an object under examination having substantial brightness non-uniformity are provided. The microscope imaging apparatus includes a stage that holds the object under examination, an illumination unit that illuminates the object under examination, an image-acquisition unit that acquires images of the object under examination, and a motion unit that moves the stage and the image-acquisition unit relative to each other. The image-acquisition unit includes an imaging device capable of image acquisition using a time delay integration method. When acquiring a plurality of images of the object under examination, the exposure time during which accumulated charge is produced in the imaging device is made different for each of the acquired images, and the plurality of images are combined into a single image.
摘要:
A microscope imaging apparatus and a biological-specimen examination system that can accurately carry out measurement even for an object under examination having substantial brightness non-uniformity are provided. The microscope imaging apparatus includes a stage that holds the object under examination, an illumination unit that illuminates the object under examination, an image-acquisition unit that acquires images of the object under examination, and a motion unit that moves the stage and the image-acquisition unit relative to each other. The image-acquisition unit includes an imaging device capable of image acquisition using a time delay integration method. When acquiring a plurality of images of the object under examination, the exposure time during which accumulated charge is produced in the imaging device is made different for each of the acquired images, and the plurality of images are combined into a single image.
摘要:
A microscope imaging apparatus and a biological-specimen examination system that can accurately carry out measurement even for an object under examination having substantial brightness non-uniformity are provided. The microscope imaging apparatus includes a stage that holds the object under examination, an illumination unit that illuminates the object under examination, an image-acquisition unit that acquires images of the object under examination, and a motion unit that moves the stage and the image-acquisition unit relative to each other. The image-acquisition unit includes an imaging device capable of image acquisition using a time delay integration method. When acquiring a plurality of images of the object under examination, the exposure time during which accumulated charge is produced in the imaging device is made different for each of the acquired images, and the plurality of images are combined into a single image.
摘要:
A measuring instrument has a light source for irradiating light including rays of light having the wavelength of excitation light, an objective lens for focusing light irradiated from the light source to a predetermined focusing position, a first mirror for directly reflecting light from the objective lens, a second mirror for reflecting light reflected by the first mirror, the second mirror having an aperture P, and a measuring device for measuring light generated from a sample and having a wavelength different from the wavelength of excitation light, and the sample being arranged between the first mirror and the second mirror, the focusing position of the objective lens being made to agree with the position of the aperture P, and the measuring device being adapted to measure light of a wavelength different from the wavelength of excitation light generated from the sample and passing through the aperture P.
摘要:
A measuring apparatus comprising: a reference member held in fixed position and orientation with respect to a workpiece during measurement; a stylus for scanning a surface of the workpiece while being displaced upward and downward in accordance with unevenness of the surface of the workpiece; a displacement gauge for measuring a displacement of a specific part of the stylus relative to the reference member; and a scanner for causing the stylus to scan the workpiece along the surface; wherein the fixed position and orientation of the reference member with respect to the workpiece are not changed even during the operation of the scanner; the up-and-down displacement of the specific part of the stylus is measured relative to the reference member; a fine shape of the workpiece is detected in accordance with the measured displacement of the specific part of the stylus.
摘要:
In optical measurement utilizing total reflection, various types of measurement are selectively performed. The invention provides an optical measurement apparatus using total reflection, including a light source, a measurement optical system, and a light detector. The measurement optical system is an infinity-corrected positive lens formed of an optical member having a planar surface orthogonal to an optical axis of the measurement optical system at a front focal position. One side of the optical axis of the measurement optical system is used as a projection optical system for radiating measurement light onto a specimen, and another side is used as a photometric optical system for acquiring reflected light from the specimen. The light source is disposed at an entrance pupil position on the projection optical system side or at a position conjugate to the entrance pupil position and moves in an entrance pupil plane or in a plane conjugate to the entrance pupil position, along a straight line orthogonal to the optical axis, while a distance from the optical axis is detected. The light detector is disposed at an exit pupil position on the photometric optical system side or at a position conjugate to the exit pupil position. The optical-measurement apparatus comprises a light-source changing unit configured to change the position or shape of the light source.
摘要:
A wavelength-variable light source is configured to emit a light with a wavelength (λ), which is variable within a scan width (Δλ). An interferometer has a coherent length (ΔL), which is determinable from (Δλ) and (λ). A controller determines an appropriate magnitude of the scan width (Δλ) while a CCD camera captures a fringe image in an exposure time (Te), which is set longer than a time for wavelength scanning.