Semiconductor memory devices for alternately selecting bit lines
    1.
    发明授权
    Semiconductor memory devices for alternately selecting bit lines 有权
    用于交替选择位线的半导体存储器件

    公开(公告)号:US09183910B2

    公开(公告)日:2015-11-10

    申请号:US13907223

    申请日:2013-05-31

    IPC分类号: G11C11/16 G11C7/12

    摘要: A semiconductor memory device includes a cell array including one or more bank groups, where each of the one or more bank groups includes a plurality of banks and each of the plurality of banks includes a plurality of spin transfer torque magneto resistive random access memory (STT-MRAM) cells. The semiconductor memory device further includes a source voltage generating unit for applying a voltage to a source line connected to the each of the plurality of STT-MRAM cells, and a command decoder for decoding a command from an external source in order to perform read and write operations on the plurality of STT-MRAM cells. The command includes a combination of at least one signal of a row address strobe (RAS), a column address strobe (CAS), a chip selecting signal (CS), a write enable signal (WE), and a clock enable signal (CKE).

    摘要翻译: 半导体存储器件包括一个单元阵列,其包括一个或多个存储体组,其中一个或多个存储体组中的每个组包括多个存储体,并且多个存储体中的每一个存储体包括多个自旋传递转矩磁阻随机存取存储器(STT -MRAM)细胞。 半导体存储器件还包括用于向连接到多个STT-MRAM单元中的每一个的源极线施加电压的源极电压产生单元,以及用于对来自外部源的命令进行解码的命令解码器,以执行读取和 对多个STT-MRAM单元进行写入操作。 该命令包括行地址选通(RAS),列地址选通(CAS),片选信号(CS),写使能信号(WE)和时钟使能信号(CKE)的至少一个信号 )。

    Current sense amplifying circuit in semiconductor memory device
    2.
    发明授权
    Current sense amplifying circuit in semiconductor memory device 有权
    半导体存储器件中的电流检测放大电路

    公开(公告)号:US09257166B2

    公开(公告)日:2016-02-09

    申请号:US14311824

    申请日:2014-06-23

    摘要: Disclosed is a current sense amplifier suitable for a nonvolatile memory device such as a magnetic random access memory. In the current sense amplifier, a reference memory cell for sensing is implemented by a memory cell equal to a normal memory cell without fabricating different reference memory cells. The current sense amplifier is formed of first and second cross coupled differential amplifiers being covalent bonded. The current sense amplifier compares a current flowing to a sensing node of a memory cell directly with currents flowing to reference sensing nodes.

    摘要翻译: 公开了一种适用于诸如磁随机存取存储器的非易失性存储器件的电流检测放大器。 在电流检测放大器中,用于感测的参考存储单元由等于正常存储单元的存储单元实现,而不需要制造不同的参考存储单元。 电流检测放大器由共价键合的第一和第二交叉耦合差分放大器形成。 电流感测放大器将流过存储单元的感测节点的电流直接与流向参考感测节点的电流进行比较。