Semiconductor memory devices for alternately selecting bit lines
    1.
    发明授权
    Semiconductor memory devices for alternately selecting bit lines 有权
    用于交替选择位线的半导体存储器件

    公开(公告)号:US09183910B2

    公开(公告)日:2015-11-10

    申请号:US13907223

    申请日:2013-05-31

    IPC分类号: G11C11/16 G11C7/12

    摘要: A semiconductor memory device includes a cell array including one or more bank groups, where each of the one or more bank groups includes a plurality of banks and each of the plurality of banks includes a plurality of spin transfer torque magneto resistive random access memory (STT-MRAM) cells. The semiconductor memory device further includes a source voltage generating unit for applying a voltage to a source line connected to the each of the plurality of STT-MRAM cells, and a command decoder for decoding a command from an external source in order to perform read and write operations on the plurality of STT-MRAM cells. The command includes a combination of at least one signal of a row address strobe (RAS), a column address strobe (CAS), a chip selecting signal (CS), a write enable signal (WE), and a clock enable signal (CKE).

    摘要翻译: 半导体存储器件包括一个单元阵列,其包括一个或多个存储体组,其中一个或多个存储体组中的每个组包括多个存储体,并且多个存储体中的每一个存储体包括多个自旋传递转矩磁阻随机存取存储器(STT -MRAM)细胞。 半导体存储器件还包括用于向连接到多个STT-MRAM单元中的每一个的源极线施加电压的源极电压产生单元,以及用于对来自外部源的命令进行解码的命令解码器,以执行读取和 对多个STT-MRAM单元进行写入操作。 该命令包括行地址选通(RAS),列地址选通(CAS),片选信号(CS),写使能信号(WE)和时钟使能信号(CKE)的至少一个信号 )。

    METHOD OF RECONFIGURING DQ PADS OF MEMORY DEVICE AND DQ PAD RECONFIGURABLE MEMORY DEVICE

    公开(公告)号:US20180189219A1

    公开(公告)日:2018-07-05

    申请号:US15677475

    申请日:2017-08-15

    申请人: Chan-Kyung Kim

    发明人: Chan-Kyung Kim

    IPC分类号: G06F13/40 G06F13/12 G06F3/00

    摘要: A method and a memory device therefor for reconfiguring a DQ pad organization of the memory device on-the-fly. A DQ organization reconfiguration control unit generates a control signal for reconfiguring the DQ pad organization into a desired mode based on a user command. A DQ organization reconfiguration unit is provided between P DQ pads and memory cell arrays and reconfigures organization P DQ pads on-the-fly in any one among Xi DQ pad modes, where i=1, 2, 4, 8, 16, 32, 64, and 128, based on the control signal. For the reconfiguration of the organization of the DQ pads, a plurality of bus lines for data transfer, being switchable by a control signal, are provided. The bus lines are implemented utilizing at least one of the M3 and M4 metal layers of the memory device.

    Temperature sensing circuit and method
    7.
    发明申请
    Temperature sensing circuit and method 有权
    温度检测电路及方法

    公开(公告)号:US20050001670A1

    公开(公告)日:2005-01-06

    申请号:US10884684

    申请日:2004-07-02

    CPC分类号: G01K7/01 H03K2017/0806

    摘要: A temperature sensing circuit and method are provided. An example temperature sensing circuit includes a temperature sensing unit that outputs a temperature signal indicating whether the temperature in the semiconductor device is higher or lower than a reference temperature in response to a first current control signal or a second current control signal by using a first current level that is increased when the temperature rises and a second current level that is reduced when the temperature rises. The temperature sensing unit also includes a storage unit that stores and outputs the temperature signal, and a controller that changes the first current level or the second current level in response to the temperature signal output from the storage unit and generates the first current control signal or the second current control signal used to control the reference temperature.

    摘要翻译: 提供了温度检测电路和方法。 一个示例性温度感测电路包括温度感测单元,其通过使用第一电流输出指示半导体器件中的温度是响应于第一电流控制信号还是第二电流控制信号而高于或低于参考温度的温度信号 当温度升高时增加的电平和当温度升高时降低的第二电流水平。 温度检测单元还包括存储并输出温度信号的存储单元,以及响应于从存储单元输出的温度信号而改变第一电流电平或第二电流电平的控制器,并且产生第一电流控制信号或 用于控制参考温度的第二电流控制信号。

    Memory device for compensating for a clock skew causing a centering error and a method for compensating for the clock skew
    8.
    发明授权
    Memory device for compensating for a clock skew causing a centering error and a method for compensating for the clock skew 失效
    用于补偿引起定心误差的时钟偏移的存储器件和用于补偿时钟偏移的方法

    公开(公告)号:US07143303B2

    公开(公告)日:2006-11-28

    申请号:US10804530

    申请日:2004-03-19

    IPC分类号: G06F1/04

    摘要: The present invention comprises a memory device for compensating for a clock skew that generates a centering error, and a method of compensating for the clock skew. To compensate for a clock skew that causes a centering error between an external clock signal and an output data signal, the memory device includes a phase detector (PD) and an up-down counter. The PD detects a phase difference between the output data signal and the external clock signal and generates an up signal or a down signal depending on the detected phase difference. The up-down counter is enabled by a calibration signal that directs a compensation of the skew and generates an offset code in response to the up signal or the down signal. The offset code is fed back to a delay locked loop (DLL) circuit and aligns the middle points of the output data signal with the edges of the external clock signal.

    摘要翻译: 本发明包括用于补偿产生定心误差的时钟偏差的存储器件以及补偿时钟偏移的方法。 为了补偿引起外部时钟信号和输出数据信号之间的定心误差的时钟偏移,存储器件包括相位检测器(PD)和升降计数器。 PD检测输出数据信号和外部时钟信号之间的相位差,并根据检测到的相位差产生上行信号或下降信号。 升降计数器通过校准信号启用,该校准信号指导偏斜的补偿,并响应于向上信号或下降信号产生偏移代码。 偏移码反馈到延迟锁定环路(DLL)电路,并将输出数据信号的中点与外部时钟信号的边沿对齐。

    Temperature sensing circuit and method
    9.
    发明授权
    Temperature sensing circuit and method 有权
    温度检测电路及方法

    公开(公告)号:US07078955B2

    公开(公告)日:2006-07-18

    申请号:US10884684

    申请日:2004-07-02

    IPC分类号: H01L35/00

    CPC分类号: G01K7/01 H03K2017/0806

    摘要: A temperature sensing circuit and method are provided. An example temperature sensing circuit includes a temperature sensing unit that outputs a temperature signal indicating whether the temperature in the semiconductor device is higher or lower than a reference temperature in response to a first current control signal or a second current control signal by using a first current level that is increased when the temperature rises and a second current level that is reduced when the temperature rises. The temperature sensing unit also includes a storage unit that stores and outputs the temperature signal, and a controller that changes the first current level or the second current level in response to the temperature signal output from the storage unit and generates the first current control signal or the second current control signal used to control the reference temperature.

    摘要翻译: 提供了温度检测电路和方法。 一个示例性温度感测电路包括温度感测单元,其通过使用第一电流输出指示半导体器件中的温度是响应于第一电流控制信号还是第二电流控制信号而高于或低于参考温度的温度信号 当温度升高时增加的电平和当温度升高时降低的第二电流水平。 温度检测单元还包括存储并输出温度信号的存储单元,以及响应于从存储单元输出的温度信号而改变第一电流电平或第二电流电平的控制器,并且产生第一电流控制信号或 用于控制参考温度的第二电流控制信号。

    Output driver circuit with pre-emphasis function
    10.
    发明申请
    Output driver circuit with pre-emphasis function 失效
    输出驱动电路具有预加重功能

    公开(公告)号:US20060071687A1

    公开(公告)日:2006-04-06

    申请号:US11129469

    申请日:2005-05-13

    申请人: Chan-Kyung Kim

    发明人: Chan-Kyung Kim

    IPC分类号: H03K19/0175

    CPC分类号: H04L25/0272

    摘要: In an output driver circuit and method, a control circuit generates a control signal in response to a current internal data signal. An output driver generates an output data signal in response to the control signal. A pre-emphasis circuit adjusts a current flowing through a node having the control signal generated thereon in response to a previous internal data signal. The pre-emphasis circuit may also adjust the output signal in response to the previous internal data signal.

    摘要翻译: 在输出驱动器电路和方法中,控制电路响应于当前的内部数据信号产生控制信号。 输出驱动器响应于控制信号产生输出数据信号。 预加重电路响应于先前的内部数据信号来调节流过具有其上产生的控制信号的节点的电流。 预加重电路还可以响应于先前的内部数据信号来调整输出信号。