公开(公告)号：US08044675B2

公开(公告)日：2011-10-25

申请号：US12766935

申请日：2010-04-26

申请人： Yung-Yu Wu ,  Huei-Huang Chen ,  Wei-Fen Chiang

发明人： Yung-Yu Wu ,  Huei-Huang Chen ,  Wei-Fen Chiang

IPC分类号： G01R31/00

CPC分类号： G01R1/0408 ,  H05K1/0296 ,  H05K2201/09027 ,  H05K2201/09227 ,  H05K2201/10325

摘要： A testing apparatus includes a public test board, a single DUT (device under test) test board and a holder. The public test board includes a plurality of public test channel sets each having a plurality of public signal terminals for receiving test signals. On the single DUT test board, a plurality first signal terminals are arranged according to the pin layout of a DUT, a plurality second signal terminals are arranged according to the terminal layout of a public channel set, and a plurality traces are arranged for electrically connecting corresponding first and second signal terminals. The holder can connect the pins of the DUT to corresponding first signal terminals.

摘要翻译： 测试设备包括公共测试板，单个DUT（被测器件）测试板和持有器。 公共测试板包括多个公共测试通道组，每个公共测试通道组具有用于接收测试信号的多个公共信号端子。 在单个DUT测试板上，根据DUT的引脚布局布置多个第一信号端子，根据公共通道组的端子布局布置多个第二信号端子，并且布置多个迹线用于电连接 对应的第一和第二信号端子。 保持器可以将DUT的引脚连接到相应的第一个信号端子。

公开(公告)号：US07830163B2

公开(公告)日：2010-11-09

申请号：US12247040

申请日：2008-10-07

申请人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Wei-Fen Chiang ,  Yung-Yu Wu ,  Hung-Wei Chen ,  Huei-Huang Chen

发明人： Cheng-Yung Teng ,  Li-Jieu Hsu ,  Wei-Fen Chiang ,  Yung-Yu Wu ,  Hung-Wei Chen ,  Huei-Huang Chen

IPC分类号： G01R31/02

CPC分类号： G01R31/2889

摘要： The invention discloses a testing circuit board for placing a device under test and further testing the device under test according to a plurality of testing signals generated by a tester. The testing circuit board includes a circuit board and a plurality of sets of sockets. The circuit board includes a plurality of connecting holes. The plurality of sets of sockets are located on a plurality of connecting holes and electrically connects to the device under test via a plurality of connecting interfaces for transferring the plurality of testing signals to test the device under test.

摘要翻译： 本发明公开了一种用于放置被测器件的测试电路板，并根据由测试仪产生的多个测试信号进一步测试被测器件。 测试电路板包括电路板和多套插座。 电路板包括多个连接孔。 多组插座位于多个连接孔上，并通过多个连接接口与被测设备电连接，用于传送多个测试信号以测试待测设备。

公开(公告)号：US20100271041A1

公开(公告)日：2010-10-28

申请号：US12766935

申请日：2010-04-26

申请人： Yung-Yu Wu ,  Huei-Huang Chen ,  Wei-Fen Chiang

发明人： Yung-Yu Wu ,  Huei-Huang Chen ,  Wei-Fen Chiang

IPC分类号： G01R31/02

CPC分类号： G01R1/0408 ,  H05K1/0296 ,  H05K2201/09027 ,  H05K2201/09227 ,  H05K2201/10325

摘要： A testing apparatus includes a public test board, a single DUT (device under test) test board and a holder. The public test board includes a plurality of public test channel sets each having a plurality of public signal terminals for receiving test signals. On the single DUT test board, a plurality first signal terminals are arranged according to the pin layout of a DUT, a plurality second signal terminals are arranged according to the terminal layout of a public channel set, and a plurality traces are arranged for electrically connecting corresponding first and second signal terminals. The holder can connect the pins of the DUT to corresponding first signal terminals.

摘要翻译： 测试设备包括公共测试板，单个DUT（被测器件）测试板和持有器。 公共测试板包括多个公共测试通道组，每个公共测试通道组具有用于接收测试信号的多个公共信号端子。 在单个DUT测试板上，根据DUT的引脚布局布置多个第一信号端子，根据公共通道组的端子布局布置多个第二信号端子，并且布置多个迹线用于电连接 对应的第一和第二信号端子。 保持器可以将DUT的引脚连接到相应的第一个信号端子。

公开(公告)号：US20080063212A1

公开(公告)日：2008-03-13

申请号：US11616874

申请日：2006-12-28

申请人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Wei-Fen Chiang ,  Jack Lin ,  Li-Ying Chang

发明人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Wei-Fen Chiang ,  Jack Lin ,  Li-Ying Chang

IPC分类号： H04R29/00 ,  G01R13/00

CPC分类号： G01R31/31917 ,  G01R31/31932

摘要： The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output signal generated from the device under test to generate a filtered signal. The amplifying circuit amplifies the filtered signal to generate an amplified signal. The comparing module compares the amplified signal with at least one reference level to generate at least one result signal accordingly. The result-examining module examines the result signal to determine a test result for the device under test.

摘要翻译： 本发明公开了一种用于测试被测设备的电路测试装置。 电路测试装置包括滤波电路，放大电路，比较模块和结果检查模块。 滤波电路对从被测器件产生的模拟输出信号进行滤波以产生滤波信号。 放大电路放大经滤波的信号以产生放大信号。 比较模块将放大的信号与至少一个参考电平进行比较以相应地产生至少一个结果信号。 结果检查模块检查结果信号，以确定被测设备的测试结果。

公开(公告)号：US08228384B2

公开(公告)日：2012-07-24

申请号：US11616874

申请日：2006-12-28

申请人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Wei-Fen Chiang ,  Jack Lin ,  Li-Ying Chang

发明人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Wei-Fen Chiang ,  Jack Lin ,  Li-Ying Chang

IPC分类号： H04N17/00

CPC分类号： G01R31/31917 ,  G01R31/31932

摘要： The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a filtering circuit, an amplifying circuit, a comparing module, and a result-examining module. The filtering circuit filters an analog output signal generated from the device under test to generate a filtered signal. The amplifying circuit amplifies the filtered signal to generate an amplified signal. The comparing module compares the amplified signal with at least one reference level to generate at least one result signal accordingly. The result-examining module examines the result signal to determine a test result for the device under test.

摘要翻译： 本发明公开了一种用于测试被测设备的电路测试装置。 电路测试装置包括滤波电路，放大电路，比较模块和结果检查模块。 滤波电路对从被测器件产生的模拟输出信号进行滤波以产生滤波信号。 放大电路放大经滤波的信号以产生放大信号。 比较模块将放大的信号与至少一个参考电平进行比较以相应地产生至少一个结果信号。 结果检查模块检查结果信号，以确定被测设备的测试结果。

公开(公告)号：US20070268037A1

公开(公告)日：2007-11-22

申请号：US11608226

申请日：2006-12-07

申请人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Wei-Fen Chiang ,  Hung-Wei Chen

发明人： Cheng-Yung Teng ,  Yi-Chang Hsu ,  Wei-Fen Chiang ,  Hung-Wei Chen

IPC分类号： G01R31/26

CPC分类号： G01R31/3167

摘要： The present invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a signal transformation module, a meter, and a logic tester. The signal transformation module is coupled to the device under test and transforms an analog output signal generated by the device under test into a DC signal. The meter is coupled to the signal transformation module and measures the DC signal so as to generate a digital measuring result. The logic tester is coupled to the meter and determines a test result for the device under test according to the digital measuring result.

摘要翻译： 本发明公开了一种用于测试被测器件的电路测试装置。 电路测试装置包括信号变换模块，仪表和逻辑测试仪。 信号变换模块耦合到被测器件，并将由被测器件产生的模拟输出信号转换为直流信号。 仪表耦合到信号变换模块，测量直流信号，产生数字测量结果。 逻辑测试仪与仪表相连，根据数字测量结果确定被测设备的测试结果。