摘要:
In its various embodiments, the method collects data from process and metrology tools in a semiconductor manufacturing environment, generates statistics from that data, detects tool failures, processing errors, and other conditions that can jeopardize product output, and performs high level process control in the form of tool shutdowns, lot holds, and lot releases. One method as disclosed automates the collection and recording of data from process and metrology tools, automates configuration of data collection, and automates process equipment shut downs, all within the existing framework of existing MES systems and engineering data collection systems. Automation of configurations and data collection is conducted by creation of data collection plans, data collection capability specifications, and other versioned documents within a process control and data collection system as disclosed herein. These versioned documents may be generated through a common graphical user interface and presented via an Internet web browser or other network interface.
摘要:
A method is presented wherein an engineering data collection (EDC) subsystem of a process control system as embodied is responsible for configuring data collection, distributing collected data, and storing collected data, and is supported through underlying interfaces in a transaction and performance monitoring system. In an embodiment, an engineering data collection (EDC) broker accepts data from equipment interfaces or a tap subsystem, then distributes the data to all subscribers such as data history, the engineering data analysis (EDA) system interface, and the statistical process control (SPC) subsystem as disclosed herein. Engineering data analysis system interface is responsible for transmitting raw data and process control system data to engineering data analysis system. Data history subscribes to all data and stores it in the transaction and performance monitoring system's online transaction processing (OLTP) database. User input to engineering data collection subsystem is accomplished via web interface or a keyboard data entry client.
摘要:
The functionality of various process control and data collection system embodiments may be improved by employing the database methodology disclosed herein during the requirements-analysis phase for data collection and process control in a semiconductor manufacturing environment. The relational database storage technology as disclosed herein consists of a set of interconnected tables, where each table has a field or an amalgamation of fields (primary key) that uniquely identifies each record (tuple) in the table. In addition, the method as disclosed herein utilizes foreign keys, which represent the value of a primary key for a related table. Aggregation levels are also employed in the method as disclosed herein to associate data from various production
摘要:
The statistical process control (SPC) subsystem is the heart of the data collection and process control system for semiconductor manufacturing in the various embodiments as disclosed herein. SPC is responsible for performing calculations to generate statistics on collected measurement data, applying rules to the statistics, and executing error actions when those rules are violated. SPC subsystem plays a role in corrective actions as well by lifting restrictions previously imposed on tools or lots as a result of rule violations. In an embodiment, SPC is supported through underlying transaction and performance monitoring system components. In an embodiment, SPC procedure is a statistical engine that performs what the process control strategy (PCS) describes, hence there is at least one SPC procedure for each PCS. Components in SPC send data to the chart client subsystem as embodied herein, which allows visualization of statistics generated by SPC procedure in graphical chart form via a web browser. SPC communicates with MES via an interface.
摘要:
Disclosed in some examples are methods, systems and machine readable medium for recommending an out-of-network communication by determining a set of potential recommended members of a social networking service based upon one or more recommendation criteria. In some examples the recommendation criteria may include: a profile similarity to a previous target of an out-of-network communication, a degree of correspondence between an interest and intent of the sending member, and a likelihood of response.
摘要:
A process, architecture, and computer program product for using the inheritance features of an object-oriented system to enable multiple programmers to modify different behaviors of an object concurrently. A first method and a second method to be performed on the object are identified. The first method is developed in a first application having a first subclass of the object's class. A first application-specific object is an instantiation of the first subclass. The second method is concurrently developed in a second application having a second subclass of the object's class. A second application-specific object is an instantiation of the second subclass. Invoking the first method performs the first method on the first application-specific object, such that the object communicates as if the first method were performed on the object. Modifying the first method does not affect the second method, and vice versa.
摘要:
A method, system and computer program product to isolate information related to performing a manufacturing process, called a configuration document, from the context in which the information is used. A context/configuration association can be independently established between a process context and a context-free configuration document including instructions for performing a manufacturing process. Because the context/configuration association is independent of both the process context and the context-free configuration document, the context/configuration association can be independently reviewed and approved without affecting other process contexts or configuration documents.
摘要:
An architecture for integrating data between a plurality of software applications in a factory environment comprises a factory system and a domain application. The factory system comprises a domain object superclass and at least two first-level subclasses of the domain object superclass. An instantiation of one of the first-level subclasses corresponds to a domain object, which represents an item in a factory. The factory system also includes a service, which provides an operation related to the domain object. The service comprises at least one component, where each component is operable to perform the operation related to the domain object. The architecture also includes a domain application, which implements a component of the service of the factory system to perform the operation related to the domain object. The architecture can optionally include a system manager for managing hardware and software in the factory.