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公开(公告)号：US20240272208A1
公开(公告)日：2024-08-15
申请号：US18644470
申请日：2024-04-24
IPC分类号： G01R19/165 , G01R15/18 , G01R33/07 , H05K1/18
CPC分类号： G01R19/16504 , G01R15/181 , G01R33/072 , H05K1/181 , H05K2201/10151
摘要： A current sensor assembly can include: a coil structure having a first coil and a second coil connected in series, the coil structure configured to generate a differential magnetic field responsive to an electrical current passing through the first and second coils; a first magnetic field sensing element disposed proximate to the first coil and operable to generate a first signal responsive to the differential magnetic field passing through the first magnetic field sensing element in a first direction; a second magnetic field sensing element disposed proximate to the second coil and operable to generate a second signal responsive to the differential magnetic field passing through the second magnetic field sensing element in a second direction; and a circuit operable to subtract the first and second signals to generate a differential signal proportional to the electrical current.
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公开(公告)号：US11906554B2
公开(公告)日：2024-02-20
申请号：US18078426
申请日：2022-12-09
发明人： Stanislaw Zurek , Jeffrey Jones
IPC分类号： G01R25/00 , G01R19/00 , G01R19/165 , G01R27/14
CPC分类号： G01R19/003 , G01R19/16504 , G01R19/16566 , G01R27/14
摘要： In a meter for performing a measurement of an electrical parameter, an output from a sensor is sampled to produce at least one sample, and an iterative method is performed comprising: producing further samples; holding in memory a stored array of samples comprising the at least one sample and each of the further samples from each iteration; determining a measure of statistical variability of a mean for the respective iteration from a measure of statistical variability and from the number of samples used to generate the measure of statistical variability; comparing the measure of statistical variability of the mean with a pre-determined threshold; and generating an electrical signal indicating a state of the measurement if the measure of statistical variability of the mean of the samples taken during the measurement is less than or equal to the pre-determined threshold.
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公开(公告)号：US20170370881A1
公开(公告)日：2017-12-28
申请号：US15632440
申请日：2017-06-26
IPC分类号： G01N27/60 , G01N33/28 , G01R19/00 , G01R19/165
CPC分类号： G01N27/60 , F16C19/52 , F16C41/00 , F16C2360/31 , G01N33/28 , G01N33/2888 , G01R19/0069 , G01R19/16504
摘要： An arrangement with a first electrode (101), a second electrode (103), at least one measuring device (107) and at least one voltage source (109). The voltage source (109) is designed to apply a first electric voltage to the first electrode (101) and the measuring device (107) is designed to measure a second electric voltage at the second electrode (103). At least part of the first electrode (101) and at least part of the second electrode (103) are immersed in a flowing liquid.
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公开(公告)号：US20150214933A1
公开(公告)日：2015-07-30
申请号：US14473922
申请日：2014-08-29
发明人： Rajeev Sehgal , Srinivas Mandavilli , Pradish Mathews , Ajit Singh , Henry Potts
IPC分类号： H03K3/286 , H03K19/0175 , H03K19/096
CPC分类号： H03K19/017509 , G01R19/16504 , G06F11/14 , H03K3/013 , H03K3/0375 , H03K3/2865 , H03K19/096
摘要： This application discloses a system to detect meta-stable glitches in a signal, such as an output of latch or other storage element. The system can include a sampling circuit configured to sample an output of a storage element. The system can include a mono-shot circuit configured to monitor the output of the storage element and generate a pulse when the monitored output of the storage element differs from the sampled output. The system can include a drive circuit configured to generate a glitch signal based, at least in part, on the sampled output, and to output the glitch signal in response to the pulse from the mono-shot circuit. The system can include an error detection circuit configured to receive the sampled output from the sampling circuit and the glitch signal from the drive circuit, and to generate an error signal when the sampled output differs from the glitch signal.
摘要翻译： 本申请公开了一种用于检测诸如锁存器或其他存储元件的输出的信号中的元稳定毛刺的系统。 该系统可以包括被配置为对存储元件的输出进行采样的采样电路。 该系统可以包括被配置为监视存储元件的输出并且当监视的存储元件的输出与采样输出不同时产生脉冲的单触发电路。 该系统可以包括驱动电路，其被配置为至少部分地基于采样输出产生毛刺信号，并且响应于来自单声道电路的脉冲输出毛刺信号。 该系统可以包括错误检测电路，其被配置为从采样电路接收采样的输出和来自驱动电路的毛刺信号，并且当采样输出与毛刺信号不同时产生误差信号。
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公开(公告)号：US20240332289A1
公开(公告)日：2024-10-03
申请号：US18618485
申请日：2024-03-27
申请人： ROHM CO., LTD.
发明人： Tatsuro SHIMIZU
IPC分类号： H01L27/06 , G01R19/165
CPC分类号： H01L27/0682 , G01R19/16504
摘要： The present disclosure provides a semiconductor integrated circuit. The semiconductor integrated circuit includes a set pin. An external resistor and an external capacitor are connected in parallel between the set pin and an external fixed voltage line. A parameter acquisition circuit is connected to the set pin to obtain a first parameter and a second parameter defined by a resistive value of the external resistor and a capacitive value of the external capacitor.
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公开(公告)号：US12061217B2
公开(公告)日：2024-08-13
申请号：US18071415
申请日：2022-11-29
发明人： Ian B. Vabnick , Michael Malone
IPC分类号： G01R19/165 , G01R31/54 , G01R31/58 , G01R31/327
CPC分类号： G01R19/16504 , G01R19/16528 , G01R31/54 , G01R31/58 , G01R31/3277
摘要： Circuit test devices and methods are provided. The method includes measuring a voltage between first and second conductor points (CPs) of a circuit under test (CUT), and determining if the measured voltage is less than a low voltage threshold value (LVTV) indicative of electrical continuity (EC) between the first and second CPs. In response to determining that the measured voltage is less than the LVTV, the method includes: transmitting a test signal (TS) to the first or second CP, and determining if the test signal is received after being transmitted. In response to determining that the TS is received, a presence of EC between the first and second conductor points is reported, and in response to determining that the TS is not received, absence of EC between the first and second CPs, or a lack of electrical contact between the VMC and the first and/or second CP(s), is reported.
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7.发明公开公开(公告)号：US20230375600A1
公开(公告)日：2023-11-23
申请号：US18317806
申请日：2023-05-15
发明人： David J. Clarke , Stephen Denis Heffernan , Nijun Wei , Alan J. O'Donnell , Patrick Martin McGuinness , Shaun Bradley , Edward John Coyne , David Aherne , David M. Boland
IPC分类号： G01R19/165 , G01R31/00 , G01R31/28 , H02H9/04 , H01L27/02 , H01L23/60 , H01L23/62 , H01L23/525 , H02H9/00
CPC分类号： G01R19/16504 , G01R31/002 , G01R31/2832 , G01R31/2856 , H02H9/042 , H01L27/0288 , H01L23/60 , H01L23/62 , H01L23/5256 , H02H9/00
摘要： The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes;
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公开(公告)号：US09891289B2
公开(公告)日：2018-02-13
申请号：US14727956
申请日：2015-06-02
发明人： Ljubomir A. Kojovic
CPC分类号： G01R31/40 , G01R15/181 , G01R19/10 , G01R19/16504 , H02H3/28 , H02H7/045
摘要： Techniques for detecting an inrush current in a power transformer in are disclosed. For example, the presence of an inrush current on a current path in a power transformer may be determined by receiving a signal from a Rogowski coil positioned on a current path of a power transformer, the signal corresponding to a current flowing in the current path; sampling the received signal to produce samples of the received signal; and analyzing the samples of the received signal relative to at least two criteria to determine whether an inrush current is present. When an inrush current is present, operation of a protective relay is blocked.
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公开(公告)号：US06747486B2
公开(公告)日：2004-06-08
申请号：US10244810
申请日：2002-09-16
申请人： Wolfgang Horn
发明人： Wolfgang Horn
IPC分类号： H03K522
CPC分类号： G01R19/16504
摘要： A comparator includes an adjustable offset and particularly dimensioned and configured components. The particular configuration and dimensioning of the comparator ensure that the offset voltage can be set precisely and permanently to a value, which can vary within a large range. The setting of an offset voltage does not lead to the degradation of other properties of the comparator, in particular to a slower reaction to changes in the input voltages.
摘要翻译： 比较器包括可调偏移和特别尺寸和构造的部件。 比较器的特定配置和尺寸确保了偏移电压可以精确而永久地设置为一个可以在很大范围内变化的值。 偏移电压的设置不会导致比较器的其他属性的劣化，特别是对输入电压变化的反应较慢。
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公开(公告)号：US12055569B2
公开(公告)日：2024-08-06
申请号：US18317806
申请日：2023-05-15
发明人： David J. Clarke , Stephen Denis Heffernan , Nijun Wei , Alan J. O'Donnell , Patrick Martin McGuinness , Shaun Bradley , Edward John Coyne , David Aherne , David M. Boland
IPC分类号： G01R19/165 , G01R31/00 , G01R31/28 , H01L23/525 , H01L23/60 , H01L23/62 , H01L27/02 , H02H9/00 , H02H9/04
CPC分类号： G01R19/16504 , G01R31/002 , G01R31/2832 , G01R31/2856 , H01L23/5256 , H01L23/60 , H01L23/62 , H01L27/0288 , H02H9/00 , H02H9/042
摘要： The disclosed technology generally relates to electrical overstress protection devices, and more particularly to electrical overstress monitoring devices for detecting electrical overstress events in semiconductor devices. In one aspect, an electrical overstress monitor and/or protection device includes a two different conductive structures configured to electrically arc in response to an EOS event and a sensing circuit configured to detect a change in a physical property of the two conductive structures caused by the EOS event. The two conductive structures have facing surfaces that have different shapes.
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