公开(公告)号：US11988617B2

公开(公告)日：2024-05-21

申请号：US17626624

申请日：2020-08-18

Applicant: John Bean Technologies Corporation

Inventor： Jeffrey C. Gill ,  Amer M. Butt ,  Richard D. Timperio

IPC: G01N23/087 ,  G01N23/083 ,  G01N23/18 ,  G01V5/22

CPC classification number: G01N23/18 ,  G01N23/083 ,  G01N23/087 ,  G01V5/223 ,  G01N2223/04 ,  G01N2223/1016 ,  G01N2223/3307 ,  G01N2223/3308 ,  G01N2223/505 ,  G01N2223/618 ,  G01N2223/643

Abstract: A scanner comprises an electromagnetic wave source; and a detector positioned to measure emissions from the electromagnetic wave source, wherein the electromagnetic wave source comprises a first technology, and the electromagnetic wave source is interchangeable with a second electromagnetic wave source comprising a second technology and/or wherein the detector comprises a first technology, and the detector is interchangeable with a second detector comprising a second technology. Training the scanner to inspect for contaminants includes generating electromagnetic wave emissions at a plurality of combinations of parameters; moving a conveyor belt to expose product having a plurality of contaminants of different sizes to the emissions generated at more than one combination of parameters; recording attenuated emissions that pass through the product at more than one combination of parameters; and selecting a combination of parameters to use when inspecting for the contaminant.