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公开(公告)号：US20240329110A1
公开(公告)日：2024-10-03
申请号：US18128942
申请日：2023-03-30
申请人： XILINX, INC.
摘要： Using “in-situ on-die time-domain reflectometry (TDR)” with data signal paths of integrated circuits, printed circuit boards, and data processing equipment and systems allows testing, verification and troubleshooting of data channel signal path impedance variations including the package, escape routing, socket, board, and cable/connectors provides fast characterization thereof. Operation of “in-situ on-die TDR” uses existing analog-to-digital converter (ADC) and data transmitter (TX) drivers of an integrated circuit to act as a TDR sampling head by performing a user interface-based TDR sampling with a step-waveform generated by an integrated circuit TX driver. Then sampling the step-waveform with the ADC of the integrated circuit using spline interpolation to obtain the over-sampled waveform. Once the sampled step-waveform is obtained, the TDR profile of the sampled data channels may be calculated. Large amounts of impedance variation data may thus be collected during either integrated circuit manufacturer or customer-built data communications channel testing.
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2.发明公开公开(公告)号：US20240319254A1
公开(公告)日：2024-09-26
申请号：US18613205
申请日：2024-03-22
申请人： ECSite, Inc.
CPC分类号： G01R31/088 , G01R31/11
摘要： Systems and methods of identifying errors in RF cabling using system level distance to fault. A method of determining system level RF health in an RF deployment, the method including predicting an RF health of the deployment based on a known attribute of the deployment; receiving a distance to fault (DTF) measurement from the deployment, wherein receiving the DTF measurement includes: transmitting a test signal into a cable associated with the RF deployment; and receiving a return signal from the cable, the return signal including a reflection; comparing the predicted RF health to the received DTF measurement; and identifying mismatches between the predicted RF health and the received DTF measurement based on the comparing.
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公开(公告)号：US12000880B2
公开(公告)日：2024-06-04
申请号：US17621578
申请日：2020-06-11
IPC分类号： G01R31/11
CPC分类号： G01R31/11
摘要： A method for generating a reflectometry signal intended to be injected into a transmission line in order to identify the presence of at least one possible fault on the line, the method includes the steps of: generating a first multi-carrier digital signal on a first set of frequency carriers, generating a second corrective multi-carrier digital signal on a second set of frequency carriers separate from the first set, summing the first digital signal and the second corrective digital signal so as to generate a reflectometry signal, normalizing the frequency carriers of the reflectometry signal, the second corrective digital signal being determined so as to reduce the peak to average power ratio of the reflectometry signal with respect to the first digital signal.
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4.发明公开公开(公告)号：US20240168076A1
公开(公告)日：2024-05-23
申请号：US18272827
申请日：2022-01-13
申请人： LAPP ENGINEERING AG
发明人： Stefan Hilsenbeck
摘要： A device for monitoring a supply line of a frequency converter-fed electrical machine is used to predict failure, wear and/or ageing of the electrical supply line. The electrical supply line is designed and installed to connect an electrical machine in an industrial machine or plant or in a land or aircraft vehicle to a frequency converter. The frequency converter is designed and intended to supply the electrical machine with a single-phase or multi-phase alternating voltage with preferably variable voltage amplitude and pulse duration through the electrical supply line, wherein a change in pulse duration and/or voltage amplitude of the alternating voltage serves to change a speed or torque of the electrical machine. The frequency converter is set up and intended to provide each phase of the AC voltage as a sequence of square-wave pulses with a high edge steepness for feeding the electrical machine.
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公开(公告)号：US11927617B2
公开(公告)日：2024-03-12
申请号：US17267841
申请日：2019-08-13
摘要： There is provided an apparatus (20) for monitoring a condition of an electrical power transmission medium (22), the apparatus (20) comprising: a signal source (24) for transmitting a signal (30) to travel along the electrical power transmission medium (22); and a monitoring device (26) configured to detect one or more reflected signals (34) in the electrical power transmission medium (22), wherein the monitoring device (24) is configured to use the or each detected reflected signal (34) to determine a change in capacitance of the electrical power transmission medium (22).
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公开(公告)号：US20240061047A1
公开(公告)日：2024-02-22
申请号：US18269219
申请日：2022-08-30
发明人： In Hwan CHO , Sang Dae PARK , Ju Mi LEE , Ju Young KIM
IPC分类号： G01R31/382 , G01N27/20 , G01R31/11
CPC分类号： G01R31/382 , G01N27/20 , G01R31/11
摘要： An apparatus is provided for detecting an internal defect of a battery cell. The apparatus may include a time domain reflectometry (TDR) module configured to apply an electrical pulse to the battery cell and compare a reference waveform with a measurement waveform generated by detecting a reflected wave of the electrical pulse to determine whether a defect has occurred, and a signal line configured to electrically connect the TDR module to an electrode lead of the battery cell. The electrical pulse may be applied in a longitudinal direction of the battery cell. A method of detecting an internal defect of a battery cell is also provided.
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公开(公告)号：US20230375610A1
公开(公告)日：2023-11-23
申请号：US18265901
申请日：2021-12-06
发明人： Peter SEALEY , Martin KESSLER , Dan BOYKO , Md Kamruzzaman SHUVO , Matthew PUZEY
CPC分类号： G01R31/11 , G01R31/083
摘要： Systems and techniques for line diagnostics. In particular, disclosed herein are systems and techniques for line diagnostics that sense a state of an electrical cable by using multiple, time-spaced stimuli and detecting their signal reflection time at different threshold levels. Information derived from multiple reflections may be used to determine cable characteristics (e.g., “wire short,” “wire open,” “correctly terminated,” etc.). The systems and techniques disclosed herein may advantageously require less complex hardware and implementation algorithms than conventional time domain reflectometry (TDR) approaches, and thus may be implemented in settings in which TDR was previously unsuitable. Further, if a cable issue is detected, the systems and techniques disclosed herein may determine the approximate location of the cable issue along the cable, accelerating correction of the issue.
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公开(公告)号：US20230273251A1
公开(公告)日：2023-08-31
申请号：US18015441
申请日：2021-07-12
申请人： Hitachi Astemo, Ltd.
摘要： A communication device includes: a transmitting circuit that repeatedly outputs a first prescribed signal to a transmission path at a prescribed cycle; a receiving circuit that receives a second prescribed signal repeatedly output at the prescribed cycle from another communication device via the transmission path; a waveform equivalence processing unit that performs waveform equivalence processing on the signal received by the receiving circuit; a holding unit that holds parameters of the waveform equivalence processing; a storage unit that stores information on a signal propagation speed in the transmission path, duration of a prescribed cycle, and a transmission rate; and an abnormality position determining unit that calculates a distance to a position of an abnormality in the transmission path using information on the parameter caused by the abnormality of the transmission path among the parameters and the information stored in the storage unit.
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公开(公告)号：US11740276B2
公开(公告)日：2023-08-29
申请号：US17019936
申请日：2020-09-14
发明人： Chan-Sik Kwon , Jin Duck Park , Jin Wook Jang , Ji-Yeon Han
IPC分类号： G01R31/11 , H01L23/58 , H01L23/00 , H01L23/528
CPC分类号： G01R31/11 , H01L23/528 , H01L23/562 , H01L23/585 , H01L24/06 , H01L2224/06131
摘要： A crack detection chip includes a chip which includes an internal region and an external region surrounding the internal region, a guard ring formed inside the chip along an edge of the chip to define the internal region and the external region, an edge wiring disposed along an edge of the internal region in the form of a closed curve and a pad which is exposed on a surface of the chip and is connected to the edge wiring. The edge wiring is connected to a Time Domain Reflectometry (TDR) module which applies an incident wave to the edge wiring through the pad, and detects a reflected wave formed in the edge wiring to detect a position of a crack.
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公开(公告)号：US11635457B2
公开(公告)日：2023-04-25
申请号：US16994797
申请日：2020-08-17
发明人： Julian Schmid , Reiner Hausdorf , Josef Breher
摘要： A time domain reflectometry measurement apparatus and method is provided. Measurement data of a time domain reflectometry measurement are analyzed with respect to previously acquired empirical measurement data of error-free or faulty devices with known failures. In this way, failures can be identified in the device under test without the need of opening the device.
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