Abstract:
In an aspect of the disclosure, an apparatus is provided. In one aspect, the apparatus is a memory apparatus. The memory apparatus includes a memory. The memory includes first and second bitcell arrays. The memory apparatus also includes a sense amplifier. The sense amplifier is shared by the first and the second bitcell arrays. Additionally, the sense amplifier is configured to amplify data stored in the memory during a read operation. The memory apparatus also includes a write circuit. The write circuit is configured to write data to the memory during a write operation. The memory apparatus also includes a controller. The controller is configured to disable the write circuit during the read operation.
Abstract:
A dual-power-domain SRAM is disclosed in which the dual power domains may be powered up or down in whatever order is desired. For example, a (CX) power domain may be powered up first, followed by a memory (MX) power domain. Conversely, the MX power domain may be powered up prior to the CX domain.
Abstract:
A memory circuit includes a set of subarrays of memory cells and a set of write assist circuits for generating negative voltages on bitlines pertaining to the set of subarrays, respectively. A set of distinct signals initiate the write assist circuits in generating the negative voltages for subarrays, respectively. The distinct signals may have particular state to cause a subset of the write assist circuits to generate the negative voltages if the corresponding subarrays are target of a writing operation, and another state to cause another subset of the write assist circuits to not generate the negative voltages if the corresponding subarrays are not target of the writing operation. This avoids the unnecessary generation of negative voltages for subarrays that are not the target of a writing operation so as to reduce power consumption. The generation of the distinct signals may be based on a set of write mask signals.
Abstract:
A write precharge period for a pseudo-dual-port memory is initiated by an edge (rising or falling) of a read precharge signal. The same edge type (rising or falling) of a write precharge signal signals the end of the write precharge period.
Abstract:
A static random access memory is provided in which the word line assertion during a write operation is delayed until the discharge of a dummy bit line is detected.
Abstract:
A method and an apparatus for generating an internal memory clock are provided. The apparatus includes a pulse generator configured to receive a first clock signal (320) in a first power domain (302) and initiate a second clock signal (324) in a second power domain (304) in response to the first clock signal. The first power domain provides a first voltage for logic operations and the second power domain provides a second voltage for memory operations. The apparatus includes a tracking circuit (350) configured to generate a reset signal (322) based on a voltage level of the first power domain. The reset signal may be configured to reset the pulse generator in the first power domain. The apparatus may further include a latch (306) configured to receive the second clock signal in the second power domain.
Abstract:
A read path for a memory is provided that includes an integrated sense mixing and redundancy shift stage coupled between a sense amplifier and a data latch. The data latch is integrated with a level shifter. A first transistor is coupled between a first output node of the sense amplifier and a first input node to the data latch. A first logic gate is configured to assert a combined sense enable and redundancy shift-off signal in response to an assertion of both a sense enable signal and a redundancy shift-off signal, wherein the first transistor is configured to switch on in response to the assertion of the combined sense enable and redundancy shift-off signal.
Abstract:
A memory and method of performing a write operation in a memory are disclosed. In one aspect of the disclosure, the memory includes a memory cell, a pair of bit lines (BL; BLB) coupled to the memory cell, a multiplexer (404), and a pull-up circuit (418) coupled to the multiplexer. The multiplexer may be configured to select the pair of bit lines coupled to the memory cell during the write operation. To increase the write performance of the memory cell, the pull-up circuit is configured to select which of the pair of bit lines is a non¬ zero bit line during the write operation and to clamp the non-zero bit line through read pass transistors (rpO, rpbO) of the multiplexer to approximately a power rail voltage (VDD). Thus, the pull-up circuit (418) may increase the voltage difference between the non-zero bit line and the zero bit line during the write operation and thus decrease the area and power consumed by a boost capacitance of a conventional write driver.
Abstract:
A write driver is provided that includes a first write driver inverter that inverts a data signal to drive a gate of a second write driver transistor. The write driver transistor has a terminal coupled to a bit line and another terminal coupled to a boost capacitor. A ground for the first write driver inverter floats during a write assist period to choke off leakage of boost charge from the boost capacitor through the write driver transistor.
Abstract:
Aspects of the present disclosure control aging of a signal path in an idle mode to mitigate aging. In one example, an input of the signal path is alternately parked low and high over multiple idle periods to balance the aging of devices (e.g., transistors) in the signal path. In another example, a clock signal (e.g., a clock signal with a low frequency) is input to the signal path during idle periods to balance the aging of devices (e.g., transistors) in the signal path. In another example, the input of the signal path is parked high or low during each idle period based on an aging pattern.