Abstract:
Provided is an apparatus for analyzing an electroluminescence sample, which comprises: a pulse generator for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector for receiving electroluminescence which is emitted from the electroluminescence sample according to the application of the pulse driving signal, thereby acquiring a light-receiving signal; a temperature variator for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit for analyzing a change in a time division section of the light-receiving signal delayed depending on a change of the temperature of the electroluminescence sample, and acquiring information on a defect-type charge trap which exists in the electroluminescence sample.
Abstract:
We describe apparatuses, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of liquid samples in a clinical point of care setting.
Abstract:
We describe apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation. They are particularly well suited for conducting automated sampling, sample preparation, and analysis in a multi-well plate assay format. For example, they may be used for automated analysis of particulates in air and/or liquid samples derived therefrom in environmental monitoring.
Abstract:
An evaluation apparatus is taught to nondestructively characterize the electroluminescence behavior of the semiconductor-based or organic small-molecule or polymer-based light-emitting material as the finished light-emitting device functions through electroluminescence. An electrode probe is used to temporarily form a light-emitting device through forming an intimate electrical contact to the surface of the light emitting material. A testing system is provided for applying an electrical stimulus to the electrode probe and temporarily formed device and for measuring the electrical and optical/electroluminescence response to the electrical stimulus. The electrical and optical properties of the light-emitting material can be nondestructively determined from the measured response. Optionally a light stimulus is used to perform the photoluminescence characterization together with the electroluminescence characterization, and both characterizations can be performed at the same sample location or/and at the wafer level.