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公开(公告)号:WO2023086848A1
公开(公告)日:2023-05-19
申请号:PCT/US2022/079585
申请日:2022-11-09
Applicant: LAM RESEARCH CORPORATION
Inventor: BLANK, Richard M
IPC: H01L21/687 , H01L21/677 , B25J9/04 , B25J9/16 , B25J11/00 , B25J15/00
Abstract: Nesting wafer handling robot arms are provided that may be used to move semiconductor wafers between various wafer placement locations in a semiconductor processing tool. The nesting wafer handling robot arms may be configured so that each wafer handling may be able to translate along a translation system and pick and place wafers independent of what the other wafer handling may be doing. The two wafer handling robot arms may enter a nesting configuration so that each wafer handling robot may concurrently pick or place wafers from wafer placement locations where one wafer placement location is directly above the other.
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公开(公告)号:WO2023069463A1
公开(公告)日:2023-04-27
申请号:PCT/US2022/047055
申请日:2022-10-18
Applicant: LAM RESEARCH CORPORATION
Inventor: THAULAD, Peter S. , HERZIG, Brett M. , GENETTI, Damon Tyrone , REINS, Charles Byron
Abstract: Apparatuses and methods for assisting in the calibration of a wafer-handling robot for a semiconductor processing tool are provided herein. Some embodiments include a calibration wafer having a nominally circular disk shape having an outer edge with a nominal diameter of 200mm ± 1mm, 300mm ± 1mm, or 450mm ± 1mm, two or more cutouts arranged along the outer edge, and a plurality of fiducial markers, in which each cutout is at least partially defined by one or more edges, each cutout extends radially inwards at least 2mm from a reference circle defined by the outer edge, and one or more fiducial markers are adjacent to each cutout.
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公开(公告)号:WO2023009908A1
公开(公告)日:2023-02-02
申请号:PCT/US2022/072632
申请日:2022-05-27
Applicant: QUALCOMM INCORPORATED
Inventor: GUDIVADA, Naga Chandan Babu , TIWARI, Prakash , PALLERLA, Rakesh
IPC: G06V40/13
Abstract: Apparatuses, systems, and methods are provided for ultrasonic fingerprint sensors that feature an ultrasonic transmitter and multiple subsets of ultrasonic sensor pixels, each subset of ultrasonic sensor pixels associated with a different ultrasonically sensitive display surface, at least two of which are non-coplanar with one another. In some implementations, the ultrasonically sensitive display surfaces may be provided by different portions of a flexible display that has been flexed into a configuration in which two or more portions thereof are non-coplanar. In some instances, a controller may be provided that selectively reads ultrasonic sensor signals from subset(s) of the ultrasonic sensor pixels that are associated with the ultrasonically sensitive display surfaces that a touch-sensing system indicates are experiencing touch events.
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公开(公告)号:WO2022231987A1
公开(公告)日:2022-11-03
申请号:PCT/US2022/026049
申请日:2022-04-22
Applicant: LAM RESEARCH CORPORATION
Inventor: RATLIFF, Brian Lewis , BLANK, Richard M. , TOPPING, Stephen , LEESER, Karl Frederick
IPC: H01L21/677 , H01L21/67 , H01L21/687
Abstract: Rotational indexers are provided that allow for wafer-by-wafer centering to be performed in association with each wafer pedestal-to-pedestal transfer operation within a multi-station chamber. One such rotational indexer has a rotational center axis that is movable along one or more lateral directions in order to provide wafer centering capability; sealing arrangements with lateral movement capability are provided for such implementations. Another such rotational indexer uses additional rotational capability at the wafer supports of the indexer, in combination with deliberate off-center placement of the wafers on the wafer supports of the indexer, to provide wafer centering capability.
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公开(公告)号:WO2022020707A1
公开(公告)日:2022-01-27
申请号:PCT/US2021/042951
申请日:2021-07-23
Applicant: LAM RESEARCH CORPORATION
Inventor: PIOUX, Gabriel , RONNE, Allan
Abstract: A semiconductor processing chamber performs various wafer processing operations that involve at least one of pumping the chamber to high vacuum states and regulating a vacuum (e.g., during introduction of process gases, as gas infiltrates the chamber, as reactions emit gases, as a wafer off-gases, etc.). A vacuum valve may be fluidically coupled between a vacuum pumping system and at least a portion of the semiconductor processing chamber. The vacuum valve may be a high-conductance multi-stage poppet valve enabling a relatively high gas flow rate and/or low pressure drop. In an open state, the multi-stage design of the poppet valve may have larger cross-sectional openings, in aggregate, than a comparable single-stage poppet valve could achieve, thereby increasing conductance.
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6.
公开(公告)号:WO2021173498A1
公开(公告)日:2021-09-02
申请号:PCT/US2021/019099
申请日:2021-02-22
Applicant: LAM RESEARCH CORPORATION
Inventor: DREWERY, John Stephen , TAPPAN, James E.
IPC: H01L21/687 , H01J37/32
Abstract: Systems and techniques for providing for semiconductor processing chambers configured for use with two concentric edge rings with dual-lift mechanisms are disclosed. The dual-lift mechanisms may each have a first lifter structure and a second lifter structure which may be each at least partially independently actuatable. The first lifter structure may be used to move a lower edge ring of the edge rings between two or more vertically offset positions, and the second lifter structure may be used to raise and lower an upper edge ring of the edge rings. The dual-lift mechanism may be interfaced to the chamber housing of the semiconductor processing chamber.
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公开(公告)号:WO2021086745A1
公开(公告)日:2021-05-06
申请号:PCT/US2020/057028
申请日:2020-10-23
Applicant: LAM RESEARCH CORPORATION
Inventor: BLANK, Richard M. , PICCIGALLO, Marco , CHAN, Eric , JEYAPALAN, Arulselvam Simon
IPC: H01L21/68 , B25J9/04 , B25J9/16 , B25J11/00 , B25J19/02 , H01L21/677 , B25J13/088 , B25J9/042 , B25J9/046 , H01L21/67742 , H01L21/67766
Abstract: Disclosed are techniques and systems for automatically determining and correcting the levelness of a wafer handling robot end effector. The systems may use a tilt sensor or a gravitational field sensor which may be calibrated to the wafer handling robot. The output from the tilt sensor may be used to determine or estimate the tilt of an end effector of the wafer handling robot and to perform correctional positioning to reduce or eliminate the tilt, to automatically teach certain positions that have reduced tilt, to perform health checks on the robot, provide feedback to a user, etc.
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公开(公告)号:WO2019199527A1
公开(公告)日:2019-10-17
申请号:PCT/US2019/025397
申请日:2019-04-02
Applicant: ILLUMINA, INC.
Inventor: KUMAR, Ashish , NEWMAN, Peter Clarke
Abstract: An optical cleaning cartridge for automated cleaning of optical components of analysis instruments is disclosed.
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公开(公告)号:WO2019140057A1
公开(公告)日:2019-07-18
申请号:PCT/US2019/013000
申请日:2019-01-10
Applicant: LAM RESEARCH CORPORATION
Inventor: BLANK, Richard M. , LEESER, Karl F.
IPC: H01L21/677 , H01L21/68 , H01L21/687
CPC classification number: H01L21/67796 , H01L21/67706 , H01L21/67742 , H01L21/67745 , H01L21/68 , H01L21/68764
Abstract: A rotational indexer is provided that may be rotated to move semiconductor wafers or other items between various stations arranged in a circular array; the items being moved may be supported by arms of the indexer during such movement. The rotational indexer may be further configured to also cause the items being moved to rotate about other rotational axes to cause rotation of the items relative to the arms supporting them.
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公开(公告)号:WO2018128839A1
公开(公告)日:2018-07-12
申请号:PCT/US2017/067832
申请日:2017-12-21
Applicant: ILLUMINA, INC.
Abstract: A cartridge for use with chemical or biological analysis systems is provided. The cartridge may include a floating microfluidic plate that is held in the cartridge using one or more floating support brackets that incorporate gaskets that may seal against fluidic ports on the microfluidic plate. The floating support brackets may include indexing features that may align the microfluidic plate with the seals.
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