一种化学机械抛光液
    5.
    发明申请

    公开(公告)号:WO2009070968A1

    公开(公告)日:2009-06-11

    申请号:PCT/CN2008/001857

    申请日:2008-11-07

    CPC classification number: C09G1/02 C09K3/1463 H01L21/31053 H01L21/3212

    Abstract: A chemical-mechanical polishing liquid is disclosed, which comprises silica doped by aluminum, mixed corrosive inhibitors, water and one or more kinds of the following rate-accelerators: organic acid, fluoride, ammonia, quaternary amine salts and the derivatives thereof. The polishing liquid has higher polishing rate for higher dielectric (such as TEOS), and can secure higher polishing rate adjustability of Cu adjusted by the concentration of oxidizer, and has better the effect of defect-correction, so it can suitably be used in controlling and adjusting the abrasion degree at different line width in semiconductor device.

    改进二氧化硅溶胶及其制备方法和应用

    公开(公告)号:WO2009006784A1

    公开(公告)日:2009-01-15

    申请号:PCT/CN2008/001259

    申请日:2008-07-01

    CPC classification number: C09G1/02 C01B33/146 C09C1/3081 C09K3/1454

    Abstract: The invention discloses a modified silicon dioxide sol, manufacturing method and use of the same, and a polishing liquid containing the same. The surface of the silicon dioxide of the modified silicon dioxide sol is bonded with epoxy-group-containing silane coupling agent. Modification is performed after mixing the silicon dioxide sol, surfactant and epoxy-group-containing silane coupling agent. Among the modified silicon dioxide sol according to the invention, surfaces of the silicon dioxide particles are grafted with epoxy groups, and on the one hand it can change hydrophilicity of the silicon dioxide particles, and on the other hand it can change the interaction between the silicon dioxide particles and the surfaces of wafer or polishing pad. Due to the improvement of the two properties, it can achieve higher polishing rates of TEOS and BD, and can bring less effect on polishing of Ta and Cu.

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