Abstract:
A resistance based memory sensing circuit (302) has reference current transistors (310, 312) feeding a reference node (204) and a read current transistor (308) feeding a sense node, each transistor has a substrate body at a regular substrate voltage during a stand-by mode and biased during a sensing mode at a body bias voltage lower than the regular substrate voltage. In one option the body bias voltage is determined by a reference voltage on the reference node. The substrate body at the regular substrate voltage causes the transistors to have a regular threshold voltage, and the substrate body at the body bias voltage causes the transistors to have a sense mode threshold voltage, lower than the regular threshold voltage.
Abstract:
In a Spin Transfer Torque Magnetoresi stive Random Access Memory (STT-MRAM) a bit cell array can have a source line substantially parallel to a word line. The source line can be substantially perpendicular to bit lines. A source line control unit includes a common source line driver and a source line selector configured to select individual ones of the source lines. The source line driver and source line selector can be coupled in multiplexed relation. A bit line control unit includes a common bit line driver and a bit line selector in multiplexed relation. The bit line control unit includes a positive channel metal oxide semiconductor (PMOS) element coupled between the common source line driver and bit line select lines and bit lines. Write disturb is prevented by setting a voltage associated with unselected ones of the bit lines equal to a selected source line.
Abstract:
Systems and methods of controlled value reference signals of resistance based memory circuits are disclosed. In a particular embodiment, a circuit device is disclosed that includes a first input configured to receive a reference control signal. The circuit device also includes an output responsive to the first input to selectively provide a controlled value reference voltage to a sense amplifier coupled to a resistance based memory cell.
Abstract:
A biochip including conductive particle and a device for detecting target antigen comprising the biochip are disclosed. According to the present invention, a target antigen can be effectively detected using a small amount of target antigen alone, whereby nonspecific detection signal can be reduced and an amplified signal can be detected.
Abstract:
Provided is a uranyl ion specific DNA aptamer. Also provided is a uranyl ion specific DNA aptamer which is bound to a solid support. Also provided is a method for isolating uranyl ions from a sample by using the uranyl ion specific DNA aptamer. The DNA aptamer of the present invention binds to uranyl ions with high specificity, such that uranium can be efficiently extracted from marine and other such environments.
Abstract:
Disclosed is a kit for amplifying detected signal in immunosensor and a method for detecting target antigen using the same according to the present invention, whereby a target antigen can be effectively detected even by a small amount of target antibody to thereby reduce nonspecific detection signal and to detect an amplified signal.
Abstract:
A resistance-based memory with a reduced voltage I/O device is disclosed. In a particular embodiment, a circuit includes a data path including a first resistive memory cell and a first load transistor. A reference path includes a second resistive memory cell and a second load transistor. The first load transistor and the second load transistor are input and output (I/O) transistors adapted to operate at a load supply voltage similar to a core supply voltage of a core transistor within the circuit.
Abstract:
A circuit includes a degeneration p-channel metal - oxide - semiconductor (PMOS) transistor (102), a load PMOS transistor (104), and a clamp transistor (110) configured to clamp a voltage applied to a resistance based memory element (112) during a sensing operation. A gate of the load PMOS transistor is controlled by an output of a not- AND (NAND) circuit (106).
Abstract:
A circuit (101) includes a degeneration p-channel metal - oxide - semiconductor (PMOS) transistor (102), a load PMOS transistor (104), and a clamp transistor (110) configured to clamp a voltage applied to a resistance based memory element (112) during a sensing operation. A gate of the load PMOS transistor (118) is controlled by an output (120) of an operational amplifier (106).