Abstract:
An analog to digital converter (10) including a plurality of multiple independent gate field effect transistors (MIGFET) (14, 16, 18, 20) that provide a plurality of digital output signals, is provided. Each MIGFET (14) of the plurality of MIGFETs (14, 16, 18, 20) may have first gate (60) for receiving an analog signal, a second gate (62) for being biased, and a current electrode for providing a digital output signal from among the plurality of the digital output signals. Each MIGFET of the plurality of MIGFETs may have a combination of body width, channel length that is unique among the plurality of MIGFETs to result in a threshold voltage that is unique among the plurality of MIGFETs. A digital to analog converter including a plurality of MIGFETs is also provided.
Abstract:
A voltage controlled oscillator (VCO) (40) has a plurality (42, 44, 46) of series-connected inverters. Within each inverter a first transistor (48) has a first current electrode coupled to a first power supply voltage terminal (VDD), a second current electrode, a first control electrode coupled to an output terminal of another inverter of the plurality of series-connected inverters, and a second control electrode for receiving a first bias signal. A second transistor (50) has a first current electrode coupled to the second current electrode of the first transistor, a second current electrode coupled to a second power supply voltage terminal (VSS), and a first control electrode coupled to the first control electrode of the first transistor. The second control electrode of the first transistor of each inverter receives a same or separate analog control signal (VGP, VPP OR DNP) to adjust the threshold voltage of the first transistors thereof to affect frequency and phase of the VCO's signal.
Abstract:
A voltage controlled oscillator (VCO) (40) has a plurality (42, 44, 46) of series-connected inverters. Within each inverter a first transistor (48) has a first current electrode coupled to a first power supply voltage terminal (VDD), a second current electrode, a first control electrode coupled to an output terminal of another inverter of the plurality of series connected inverters, and a second control electrode for receiving a first bias signal. A second transistor (50) has a first current electrode coupled to the second current electrode of the first transistor, a second current electrode coupled to a second power supply voltage terminal (Vss), and a first control electrode coupled to the first control electrode of the first transistor. The second control electrode of the first transistor of each inverter receives a same or separate analog control signal (VGp, VPP OR DNP) to adjust the threshold voltage of the first transistors thereof to affect frequency and phase of the VCO's signal.
Abstract:
A memory system (10) including a one time programmable (OTP) memory (16) is provided. The memory system (10) further includes a write enable verification circuit (14) including an asymmetric inverter stage (30) and a symmetric inverter stage (32) coupled at a node (34). The write enable verification circuit (14) is configured to receive a write enable signal. When the write enable signal changes from a first voltage level to a second voltage level, a voltage at the node (34) changes at a first rate and wherein when the write enable signal changes from the second voltage level to the first voltage level, the voltage at the node (34) changes at a second rate higher than the first rate. The write enable verification circuit (14) is further configured to generate a verified write enable signal for enabling programming of the OTP memory (16).
Abstract:
A memory system (10) including a one time programmable (OTP) memory (16) is provided. The memory system (10) further includes a write enable verification circuit (14) including an asymmetric inverter stage (30) and a symmetric inverter stage (32) coupled at a node (34). The write enable verification circuit (14) is configured to receive a write enable signal. When the write enable signal changes from a first voltage level to a second voltage level, a voltage at the node (34) changes at a first rate and wherein when the write enable signal changes from the second voltage level to the first voltage level, the voltage at the node (34) changes at a second rate higher than the first rate. The write enable verification circuit (14) is further configured to generate a verified write enable signal for enabling programming of the OTP memory (16).