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    OPTICAL CHARACTERIZATION OF PHOTONIC INTEGRATED CIRCUITS
    1.
    发明申请
    OPTICAL CHARACTERIZATION OF PHOTONIC INTEGRATED CIRCUITS 审中-公开
    光电集成电路的光学特性

    公开(公告)号：WO2008137848A2

    公开(公告)日：2008-11-13

    申请号：PCT/US2008062660

    申请日：2008-05-05

    Applicant: MASSCHUSETTS INST OF TECHNOLOG ,  HOLYOKE MOUNT ,  HUDGINGS JANICE A ,  FARZANEH MARYAM ,  RAM RAJEEV J

    Inventor： HUDGINGS JANICE A ,  FARZANEH MARYAM ,  RAM RAJEEV J

    IPC: G01K11/12 ,  G01N25/72

    CPC classification number: G01K11/125

    Abstract: In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnositic tool for characterizing the devices/ciccuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplied spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to charaterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.

    Abstract translation: 一方面，本发明提供了用于光子器件和/或电路的光学表征的技术和装置。 作为示例，这些技术可用于识别光子集成电路中的损坏设备。 在一些实施例中，使用热成像作为诊断工具，用于表征被调查的装置/电路。 例如，在一个实施例中，集成级联半导体放大器可以使用来自一个放大器的放大自发发射作为对另一个放大器的热调制输入进行表征。 第二放大器的反射反射图像可以显示缺陷（如果存在）。 此外，在一些实施例中，可以采用结合总能量模型的热成像来光学地表征光子电路的元件和/或映射整个电路中的光功率分布。

    HIGH PERFORMANCE CCD-BASED THERMOREFLECTANCE IMAGING USING STOCHASTIC RESONANCE
    5.
    发明申请
    HIGH PERFORMANCE CCD-BASED THERMOREFLECTANCE IMAGING USING STOCHASTIC RESONANCE 审中-公开
    使用STOCHASTIC共振的高性能基于CCD的热变像成像

    公开(公告)号：WO2006099453A1

    公开(公告)日：2006-09-21

    申请号：PCT/US2006/009235

    申请日：2006-03-15

    Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY (MIT) ,  LUEERSSEN, Dietrich ,  RAM, Rajeev, J. ,  HUDGINGS, Janice, A. ,  MAYER, Peter, M.

    Inventor： LUEERSSEN, Dietrich ,  RAM, Rajeev, J. ,  HUDGINGS, Janice, A. ,  MAYER, Peter, M.

    IPC: G01N21/17 ,  G01N25/18 ,  G06T5/50

    CPC classification number: G01J5/0003 ,  G01K11/125 ,  G01N21/1717 ,  G01N21/55 ,  G01N25/18 ,  G01N2021/1731

    Abstract: The invention is directed to systems and methods of digital signal processing and in particular to systems and methods for measurements of thermoreflectance signals, even when they are smaller than the code width of a digital detector used for detection. For example, in some embodiments, the number of measurements done is selected to be sufficiently large so as to obtain an uncertainty less than the code width of the detector. This allows for obtaining images having an enhanced temperature resolution. The invention is also directed to methods for predicting the uncertainty in measurement of the signal based on one or more noise variables associated with the detection process and the number of measurement iterations.

    Abstract translation: 本发明涉及数字信号处理的系统和方法，特别涉及用于测量热反射信号的系统和方法，即使它们小于用于检测的数字检测器的代码宽度。 例如，在一些实施例中，完成的测量数量被选择为足够大，以便获得小于检测器的代码宽度的不确定性。 这允许获得具有增强的温度分辨率的图像。 本发明还涉及用于基于与检测过程相关联的一个或多个噪声变量和测量迭代次数来预测信号测量的不确定性的方法。

    INTEGRATED DUAL-WAVEGUIDE ACOUSTO-OPTIC MODULATOR
    7.
    发明申请
    INTEGRATED DUAL-WAVEGUIDE ACOUSTO-OPTIC MODULATOR 审中-公开

    公开(公告)号：WO2022265722A1

    公开(公告)日：2022-12-22

    申请号：PCT/US2022/025025

    申请日：2022-04-15

    Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY ,  WEST, Gavin ,  RAM, Rajeev, J.

    Inventor： WEST, Gavin ,  RAM, Rajeev, J.

    IPC: G02F1/335 ,  G02F1/125 ,  G02F1/33 ,  G02F1/11

    Abstract: An integrated acousto-optic modulator operates with an extremely high extinction ratio (e.g., > 50 dB) thanks to two widely separated two-dimensional (2D) waveguides. These 2D waveguides are formed on or adjacent to a one-dimensional (ID) waveguide far enough apart (e.g., 10-100 pm apart) to prevent evanescent coupling between them. An acoustic transducer formed on the surface of the ID waveguide switches light from one 2D waveguide to the other 2D waveguide via the ID waveguide. The acoustic wave emitted by the acoustic transducer forms a traveling grating that overlaps with one 2D waveguide, diffracting light from that 2D waveguide into the ID waveguide, which guides the light to the other 2D waveguide. A lateral grating coupler diffracts this light from the ID waveguide into a mode guided by the other 2D waveguide. This acoustic modulator acts as a switch suitable for use in quantum and atomic systems.

    MULTIPLEXED SENSOR NETWORK USING SWEPT SOURCE RAMAN SPECTROSCOPY
    9.
    发明申请
    MULTIPLEXED SENSOR NETWORK USING SWEPT SOURCE RAMAN SPECTROSCOPY 审中-公开

    公开(公告)号：WO2022026053A1

    公开(公告)日：2022-02-03

    申请号：PCT/US2021/035105

    申请日：2021-06-01

    Applicant: MASSACHUSETTS INSTITUTE OF TECHNOLOGY ,  RAM, Rajeev, J. ,  ATABAKI, Amir, H. ,  PERSITS, Nili ,  KIM, Jaehwan

    Inventor： RAM, Rajeev, J. ,  ATABAKI, Amir, H. ,  PERSITS, Nili ,  KIM, Jaehwan

    IPC: G01J3/44 ,  G01J3/02 ,  G01J3/06 ,  G01J3/36

    Abstract: Swept-source Raman spectroscopy uses a tunable laser and a fixed-wavelength detector instead of a spectrometer or interferometer to perform Raman spectroscopy with the throughput advantage of Fourier transform Raman spectroscopy without bulky optics or moving mirrors. Although the tunable laser can be larger and more costly than a fixed wavelength diode laser used in other Raman systems, it is possible to split and switch the laser light to multiple ports simultaneously and/or sequentially. Each site can be monitored by its own fixed-wavelength detector. This architecture can be scaled by cascading fiber switches and/or couplers between the tunable laser and measurement sites. By multiplexing measurements at different sites, it is possible to monitor many sites at once. Moreover, each site can be meters to kilometers from the tunable laser. This makes it possible to perform swept-source Raman spectroscopy at many points across a continuous flow manufacturing environment with a single laser.

    OPTICAL CHARACTERIZATION OF PHOTONIC INTEGRATED CIRCUITS
    10.
    发明申请
    OPTICAL CHARACTERIZATION OF PHOTONIC INTEGRATED CIRCUITS 审中-公开

    公开(公告)号：WO2008137848A3

    公开(公告)日：2008-11-13

    申请号：PCT/US2008/062660

    申请日：2008-05-05

    Applicant: MASSCHUSETTS INSTITUTE OF TECHNOLOGY (MIT) ,  HOLYOKE, Mount ,  HUDGINGS, Janice, A. ,  FARZANEH, Maryam ,  RAM, Rajeev, J.

    Inventor： HUDGINGS, Janice, A. ,  FARZANEH, Maryam ,  RAM, Rajeev, J.

    IPC: G01K11/12 ,  G01N25/72

    Abstract: In one aspect, the present invention provides techniques and apparatus for optical characterization of photonic devices and/or circuits. By way of example, the techniques can be used to identify damaged devices in photonic integrated circuits. In some embodiments, thermal imaging is employed as a diagnositic tool for characterizing the devices/ciccuits under investigation. For example, in one embodiment, integrated cascaded semiconductor amplifiers can be characterized using amplied spontaneous emission from one amplifier as a thermal modulation input to another amplifier. A thermoreflectance image of the second amplifier can reveal flaws, if present. Further, in some embodiments, thermal imaging in conjunction with a total energy model can be employed to charaterize the elements of photonic circuits optically and/or to map the optical power distribution throughout the circuits.

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