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    METHOD FOR SAMPLE PREPARATION FOR CRYOELECTRON MICROSCOPY (CEM), MICROREACTOR AND LOADING PLATFORM
    1.
    发明申请
    METHOD FOR SAMPLE PREPARATION FOR CRYOELECTRON MICROSCOPY (CEM), MICROREACTOR AND LOADING PLATFORM 审中-公开
    电子显微镜（CEM），微机和加载平台的样品制备方法

    公开(公告)号：WO2008010718A2

    公开(公告)日：2008-01-24

    申请号：PCT/NL2007050364

    申请日：2007-07-23

    Applicant: UNIV DELFT TECH ,  ZANDBERGEN HENDRIK WILLEM ,  AHN CHI-WON

    Inventor： ZANDBERGEN HENDRIK WILLEM ,  AHN CHI-WON

    IPC: G01N1/42 ,  H01J37/20

    CPC classification number: G01N1/42 ,  H01J2237/2003

    Abstract: A method for sample preparation for cryoelectron microscopy (CEM), wherein the sample is held in a microreactor, wherein the conditions in the microreactor are regulated relative to the environment, wherein the sample in the microreactor is frozen according to a quench freeze process, whereupon the sample, in frozen condition, is placed in the electron microscope. A microreactor for use with cryoelectron microscopy (CEM), comprising a first and second membrane, which membranes, at least in a condition of use, enclose a chamber, while the membranes are configured to last until at least the beginning of a quench freeze process.

    Abstract translation: 一种用于冷冻电子显微镜（CEM）的样品制备方法，其中将样品保持在微反应器中，其中相对于环境调节微反应器中的条件，其中微反应器中的样品根据骤冷冻结过程冷冻， 将样品在冷冻条件下放置在电子显微镜中。 一种用于与冷冻电子显微镜（CEM）一起使用的微反应器，包括第一和第二膜，至少在使用条件下，膜包围室，同时膜被配置为持续至少至骤冷骤冷开始 。

    HIGH TEMPERATURE SUPERCONDUCTORS
    3.
    发明申请
    HIGH TEMPERATURE SUPERCONDUCTORS 审中-公开
    高温超导体

    公开(公告)号：WO1996017808A1

    公开(公告)日：1996-06-13

    申请号：PCT/NL1995000410

    申请日：1995-12-05

    Applicant: NATIONAAL ONDERZOEKPROGRAMMA HOGE-TEMPERATUUR SUPERGELEIDERS ,  KES, Pieter, Hendrik ,  LI, Ting-wei ,  ZANDBERGEN, Hendrik, Willem ,  MENOVSKY, Alois, Antonius

    Inventor： NATIONAAL ONDERZOEKPROGRAMMA HOGE-TEMPERATUUR SUPERGELEIDERS

    IPC: C04B35/45

    CPC classification number: H01L39/126 ,  C04B35/4521

    Abstract: Superconducting compounds defined by either general formulae (I): A2+ eta B2+ epsilon Can- lambda Cun+1O6+2n+ delta :Me or (II): A'1+ eta B2+ epsilon Can- lambda Cun+1O5+2n+ delta :Me, wherein A represents one or more elements chosen from thallium (T1), lead (Pb), bismuth (Bi) or mercury (Hg); B represents one or more elements chosen from calcium (Ca), strontium (Sr), barium (Ba), lanthanum (La) or yttrium (Y); Me represents a doped metal; A' represents one or more elements chosen from thallium (Tl), bismuth (Bi) or mercury (Hg); n represents a natural number; delta represents a positive or negative deviation from the stoichiometric quantity of oxygen (O), wherein | delta |

    Abstract translation: 由通式（I）定义的超导化合物：A2 + eta B2 +ε-CuCun + 1O6 + 2n +δ：Me或（II）：A'1 + eta B2 +ε-λCun + 1O5 + 2n + 其中A表示选自铊（T1），铅（Pb），铋（Bi）或汞（Hg）的一种或多种元素; B表示选自钙（Ca），锶（Sr），钡（Ba），镧（La）或钇（Y）中的一种或多种元素; Me表示掺杂金属; A'表示选自铊（Tl），铋（Bi）或汞（Hg）的一种或多种元素; n表示自然数; δ表示与化学计量的氧（O）的正或负偏差，其中| delta | <1; eta，ε和λ表示与化学计量量分别为A或A'，B和Ca的正或负偏差，其中| eta | <1，| epsilon | <1和| lambda | <1，其中化合物Cu原子被O原子包围并且被排列在导电CuO 2层中，并且化合物的晶格由连续的平行层AO，BO，n（CuO 2，Ca），CuO 2， BO，AO，其中n（CuO 2，Ca）表示一对堆叠层（CuO 2，Ca）的n倍层叠，该化合物包括由掺杂金属例如钛诱导的至少一个平面晶格缺陷 Ti），并且其基本上在垂直于所述平行层的方向上延伸。 包含这种化合物的电导体。

    METHOD AND APPARATUS FOR CONTROLLED MANUFACTURING OF NANOMETER-SCALE APERTURES
    6.
    发明申请
    METHOD AND APPARATUS FOR CONTROLLED MANUFACTURING OF NANOMETER-SCALE APERTURES 审中-公开
    用于控制制造纳米尺度孔径的方法和装置

    公开(公告)号：WO2004078640A1

    公开(公告)日：2004-09-16

    申请号：PCT/NL2004/000166

    申请日：2004-03-05

    Applicant: TECHNISCHE UNIVERSITEIT DELFT ,  STORM, Arnoldus, Jan ,  ZANDBERGEN, Hendrik, Willem

    Inventor： STORM, Arnoldus, Jan ,  ZANDBERGEN, Hendrik, Willem

    IPC: B81B1/00

    CPC classification number: G01N33/48721 ,  B81B1/004 ,  B81B2203/0127 ,  B81C1/00087 ,  B81C2201/0143 ,  H01J37/31

    Abstract: The invention relates to a method for manufacturing nanometer-scale apertures, wherein, in an object, in a conventional manner, at least one aperture is provided with a nanometer-scale surface area, after which, by means of an electron beam, energy is supplied to at least the edge of said at least one aperture, such that the surface area of the respective aperture is adjusted, wherein the surface area of the aperture is controlled during adjustment and the supply of energy is regulated on the basis of the surface area change.

    Abstract translation: 本发明涉及一种制造纳米尺度孔径的方法，其中在一个目的中，以常规方式，至少一个开口具有纳米级的表面积，之后借助于电子束，能量是 供应到所述至少一个孔的至少边缘，使得调节相应孔的表面积，其中在调节期间控制孔的表面积，并且基于表面积调节能量供应 更改。

    SPECIMEN HOLDER FOR AN ELECTRON MICROSCOPE, AND METHOD FOR REDUCING THERMAL DRIFT IN A MICROSCOPE
    8.
    发明申请
    SPECIMEN HOLDER FOR AN ELECTRON MICROSCOPE, AND METHOD FOR REDUCING THERMAL DRIFT IN A MICROSCOPE 审中-公开
    用于电子显微镜的样品座，以及用于降低微量显影剂中的热量的方法

    公开(公告)号：WO2004023514A1

    公开(公告)日：2004-03-18

    申请号：PCT/NL2003/000467

    申请日：2003-06-24

    Applicant: TECHNISCHE UNIVERSITEIT DELFT ,  ZANDBERGEN, Hendrik, Willem

    Inventor： ZANDBERGEN, Hendrik, Willem

    IPC: H01J37/20

    CPC classification number: H01J37/20

    Abstract: A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control means are provided to control the temperature of the rod-shaped part and/or the clamping means, such that this rod-shaped part and the clamping means substantially have the same temperature, at least at the location of their contact surfaces.

    Abstract translation: 一种用于电子显微镜的样本保持器，包括杆形部分，其一端设置有尖端，该尖端布置成接收样本，所述杆状部分在使用中至少延伸至尖端 电子显微镜由存在于电子显微镜中的夹持装置保持，其中提供第一温度控制装置以控制棒状部件和/或夹紧装置的温度，使得该棒状部件和夹紧装置基本上 至少在其接触表面的位置具有相同的温度。

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