STACKED METALENS SURFACES FOR 3D SENSORS
    2.
    发明申请

    公开(公告)号:WO2022204044A1

    公开(公告)日:2022-09-29

    申请号:PCT/US2022/021177

    申请日:2022-03-21

    摘要: Embodiments of the present disclosure relate to a sensor apparatuses with stacked metasurfaces suitable for small form factors. The apparatus is a sensing apparatus operable to be used in sensing applications. The apparatus includes a light source and an optical device. The optical device includes multiple metasurfaces. The optical device includes a collimation metasurface disposed on a substrate to collimate one or more laser beams from the light source. The one or more laser beams propagate through the substrate to a diffractive metasurface. The diffractive metasurface diffracts the collimated one or more laser beams into diffraction beams.

    INTERFACIAL LAYER FOR OPTICAL FILM PERFORMANCE

    公开(公告)号:WO2022203949A1

    公开(公告)日:2022-09-29

    申请号:PCT/US2022/020871

    申请日:2022-03-18

    IPC分类号: G02B6/13 G02B27/01

    摘要: A method of forming an optical device is provided. The method includes disposing an optical device substrate on a substrate support in a process volume of a process chamber, the optical device substrate having a first surface; and forming a first optical layer on the first surface of the optical device substrate during a first time period when the optical device substrate is on the substrate support, wherein the first optical layer comprises one or more metals in a metal-containing oxide, a metal¬ containing nitride, or a metal-containing oxynitride, and the first optical layer is formed without an RF-generated plasma over the optical device substrate; and forming a second optical layer with an RF-generated plasma over the first optical layer during a second time period when the optical device substrate is on the substrate support.

    METHOD OF MEASURING EFFICIENCY FOR OPTICAL DEVICES

    公开(公告)号:WO2022197480A1

    公开(公告)日:2022-09-22

    申请号:PCT/US2022/019162

    申请日:2022-03-07

    IPC分类号: G01M11/02 G02B5/18

    摘要: Embodiments of the present disclosure relate to measurement systems and methods of measuring efficiency of optical devices. In one example, the measurement systems include a light source, a mirror, an illumination source, and a sensor. The light source provides a light beam to the optical device to be diffracted into diffraction beams having diffraction orders. The diffractions beams form a diffraction pattern. The method includes positioning the optical device in the measurement system and directing the diffraction beams to the sensor. The sensor is operable to measure the efficiency of the optical device by measuring the diffraction pattern.

    OPTICAL DEVICE METROLOGY SYSTEMS AND RELATED METHODS

    公开(公告)号:WO2022115461A1

    公开(公告)日:2022-06-02

    申请号:PCT/US2021/060585

    申请日:2021-11-23

    IPC分类号: G01M11/02 G02B1/10

    摘要: A method of optical device metrology is provided. The method includes providing a first type of light into a first optical device during a first time period; measuring a quantity of the first type of light transmitted from a first location on the top surface or the bottom surface during the first time period; coating at least a portion of an edge of the one or more edges with a first coating of optically absorbent material during a second time period that occurs after the first time period; providing the first type of light into the first optical device during a third time period that occurs after the second time period; and measuring a quantity of the first type of light transmitted from the first location on the top surface or the bottom surface during the third time period.

    ILLUMINATION SYSTEM FOR AR METROLOGY TOOL
    6.
    发明申请

    公开(公告)号:WO2022115457A1

    公开(公告)日:2022-06-02

    申请号:PCT/US2021/060576

    申请日:2021-11-23

    摘要: Embodiments described herein provide for light engines of a measurement system and methods of using the light engines. The measurement system includes a light engine operable to illuminate a first grating of an optical device. The light engine projects a pattern with a light from a light engine. The light engine projects a pattern to the first grating such that a metrology metric may be extracted from one or more images captured by a detector of the measurement system. The metrology metrics are extracted by processing the image. The metrology metrics determine if the optical device meets image quality standards.

    NANO IMPRINT STAMPS
    7.
    发明申请
    NANO IMPRINT STAMPS 审中-公开

    公开(公告)号:WO2022026073A1

    公开(公告)日:2022-02-03

    申请号:PCT/US2021/037807

    申请日:2021-06-17

    IPC分类号: G03F7/00 B82Y40/00

    摘要: An apparatus for manufacturing a nano-imprint lithography stamp from a master template stamp, including a stamp chuck configured to selectively secure a stamp backing material thereto, a master chuck configured to support a master template stamp, the master template stamp including a master pattern thereon, the master chuck configured to support the master template stamp in facing relationship to the stamp backing material when selectively secured to the stamp chuck, wherein the master template stamp includes an electromagnetic energy curable material on and in the master pattern, and the stamp chuck is configured and arranged to position a portion of the backing material thereon spaced therefrom and in contact with the electromagnetic energy curable material, and the stamp chuck is further configured to position the portion of the backing material in contact with the energy curable material, after it is cured, in contact with the stamp chuck.

    METHODS AND APPARATUS OF PROCESSING TRANSPARENT SUBSTRATES

    公开(公告)号:WO2021173271A1

    公开(公告)日:2021-09-02

    申请号:PCT/US2021/014589

    申请日:2021-01-22

    摘要: Aspects of the present disclosure relate generally to methods and apparatus of processing transparent substrates, such as glass substrates. In one implementation, a film stack for optical devices includes a glass substrate including a first surface and a second surface. The film stack includes a device function layer formed on the first surface, a hard mask layer formed on the device function layer, and a substrate recognition layer formed on the hard mask layer. The hard mask layer includes one or more of chromium, ruthenium, or titanium nitride. The film stack includes a backside layer formed on the second surface. The backside layer formed on the second surface includes one or more of a conductive layer or an oxide layer.

    MASK ORIENTATION
    10.
    发明申请
    MASK ORIENTATION 审中-公开

    公开(公告)号:WO2021141706A1

    公开(公告)日:2021-07-15

    申请号:PCT/US2020/063782

    申请日:2020-12-08

    摘要: A method of forming patterned features on a substrate is provided. The method includes positioning a plurality of masks arranged in a mask layout over a substrate. The substrate is positioned in a first plane and the plurality of masks are positioned in a second plane, the plurality of masks in the mask layout have edges that each extend parallel to the first plane and parallel or perpendicular to an alignment feature on the substrate, the substrate includes a plurality of areas configured to be patterned by energy directed through the masks arranged in the mask layout. The method further includes directing energy towards the plurality of areas through the plurality of masks arranged in the mask layout over the substrate to form a plurality of patterned features in each of the plurality of areas.