METHOD AND APPARATUS FOR DETERMINING THE WAVINESS OF GLASS PANES
    2.
    发明申请
    METHOD AND APPARATUS FOR DETERMINING THE WAVINESS OF GLASS PANES 审中-公开
    用于确定玻璃板的波浪的方法和装置

    公开(公告)号:WO2008049640A3

    公开(公告)日:2008-10-16

    申请号:PCT/EP2007009371

    申请日:2007-10-29

    CPC classification number: G01B11/306 G01N21/896

    Abstract: The invention is based on the object of improving the methods, which are hitherto known, for assessing the quality of glass surfaces and of designing the latter such that they can be applied for inline measurements. To this end, a method and an apparatus for determining the waviness of flat-glass substrates are provided, in which the deflection of light beams, which are transmitted by the substrate, at local deformations of the surface of the flat-glass substrate is detected in an optical and contactless manner and, using the detected deflection or at least a measurement variable resulting therefrom, the position and height of the local deformations are quantitatively determined, wherein the deflection values or variables derived therefrom are integrated over the measurement location in order to calculate the position and height of the local deformations.

    Abstract translation: 本发明的目的是改进用于评估玻璃表面质量的先前已知的方法并且适用于在线测量。 为了这个目的,用于确定的平坦的玻璃基板的波状起伏的方法和设备被提供,其中,光学和非接触检测出光的通过扁平玻璃基板的表面的局部变形的基板波束上发射并且基于从这样的事实检测到的偏转或至少一个偏转 结果量,局部变形的位置和高度定量地确定,其中为了计算局部变形的位置和高度,偏转值或由其导出的量在测量位置上被积分。

    METHOD AND DEVICE FOR SUBSEQUENTLY TREATING GLASS PANES
    3.
    发明申请
    METHOD AND DEVICE FOR SUBSEQUENTLY TREATING GLASS PANES 审中-公开
    用于再现玻璃板的方法和设备

    公开(公告)号:WO2007014732A3

    公开(公告)日:2007-06-14

    申请号:PCT/EP2006007551

    申请日:2006-07-31

    CPC classification number: C03C19/00 B24B7/224 B24B7/242 B24B13/015 B24B37/04

    Abstract: The invention relates to improved glass substrates, particularly for manufacturing TFT displays. To this end, the invention provides a method for subsequently treating sheet glass substrates, particularly sheet glass substrates for manufacturing flat screens. The substrate has an area of at least 3.2 m 2 , preferably an area of at least 3.6 m 2 , and the substrate, on an area of at least 3.2 m 2 , preferably an area of at least 3.6 m 2 , is subsequently processed by removing material on at least one side.

    Abstract translation: 本发明的目的是提供改进的玻璃基底,特别是用于生产TFT显示器。 为此,本发明提供了的平坦的玻璃基板的处理的方法,特别是扁平的玻璃基板用于平板生产之前,具有至少3.2米 2 ,优选的区域中的表面区域中的基材的至少 其中所述基材具有至少3.2m 2 /面积的面积,优选至少3.6m 2 / cm 2的面积, SUP>通过从至少一侧去除材料而后处理。

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