Abstract:
The present disclosure relates to an apparatus for cleaning a wafer table surface and/or an object disposed thereon. The apparatus comprises: a wafer table assembly comprising a wafer table providing the wafer table surface, the wafer table surface configured for securely holding the object disposed thereon; at least one cleaning device disposed above the wafer table surface such that a spatial gap is formed between each cleaning device and the wafer table surface along a normal axis of the wafer table surface, each cleaning device carrying a set of orifices directed in a non-normal direction toward the wafer table surface; a set of internal chambers fluidically coupled to the set of orifices of each cleaning device; a pump assembly fluidically coupled to the set of internal chambers, the pump assembly operable for fluid communication with the set of internal chambers; and a displacement mechanism configured for automatically displacing the wafer table such that the set of orifices travels across at least portions of the wafer table surface. Fluid communication of the pump assembly with the set of internal chambers creates a pressure differential between the set of internal chambers and an environment external to the set of orifices to enable fluid transfer across the spatial gap between at least one orifice and the wafer table surface. The fluid transfer across the spatial gap causes particulate matter on the wafer table surface and/or the object to be removed therefrom, thereby cleaning the wafer table surface and/or the object.
Abstract:
A multi-reel handling apparatus is configured for aligning a first tape reel having a first winding axis with a feeding position and/or a corresponding tape transport axis; disposing a second tape reel having a second winding axis a standby position offset from the feeding position; performing first tape transfer operations directed to the first tape reel; and after the first tape transfer operations, simultaneously displacing the first and second tape reels by (a) linearly shuttling the first and second tape reels in a common direction perpendicular to the tape transport axis, or (b) changing the physical locations of the first and second tape reels by rotating the first and second tape reels about a common pivot axis oriented perpendicular to the first and second winding axes to thereby (i) dispose the second tape reel at the feeding position, and (ii) dispose the first tape reel at a standby position.
Abstract:
A tape reel turret apparatus for a tape and reel machine includes a central hub and a plurality of arms radially extending therefrom. A first actuator can collectively rotate the plurality of arms such that one arm rotates toward a feeding position simultaneous with rotation of the other arms away from the feeding position. Once a given arm resides at the feeding position, a second actuator can spin a tape reel carried by the arm such that a flexible linear tape carrying components can be loaded onto or offloaded from a tape reel carried by this arm. After tape reel loading or unloading, the first actuator collectively rotates the plurality of arms about the first axis of rotation to dispose a next arm at the feeding position, such that the flexible linear tape can be loaded onto or unloaded from a next tape reel carried by this arm. Arms disposed away from the feeding position can have tape reels decoupled / removed therefrom, and/or receive new tape reels, while a tape reel corresponding to the feeding position is spun.
Abstract:
A multifunction wafer and film frame handling system includes a wafer table assembly having a wafer table providing an ultra-planar wafer table surface configured for carrying a wafer or a film frame, and at least one of: a flattening apparatus configured for automatically applying a downward force to portions of a warped or non-planar wafer in a direction normal to the wafer table surface; a displacement limitation apparatus configured for automatically constraining or preventing uncontrolled lateral motion of a wafer relative to the wafer table surface after cessation of an applied negative pressure and application of a positive pressure to the underside of the wafer via the wafer table; and a rotational misalignment compensation apparatus configured for automatically compensating for a rotational misalignment of a wafer mounted on a film frame.