公开(公告)号：WO2019133079A1

公开(公告)日：2019-07-04

申请号：PCT/US2018/050059

申请日：2018-09-07

Applicant: XCERRA CORPORATION

Inventor： TREIBERGS, Valts ,  NELSON, Mitchell

IPC: G01R1/04 ,  G01R1/067

CPC classification number: G01R1/045 ,  G01R1/0466 ,  G01R1/0483 ,  G01R1/06722 ,  G01R1/06727 ,  G01R1/06772

Abstract: A test socket assembly includes a socket housing having one or more spring probes therein, and a lead frame assembly including one or more cantilever members. The test socket assembly further includes at least one linear spring damper disposed within the socket housing adjacent the lead frame assembly and supporting the cantilever members, the at least one linear spring damper extending from a first end to a second end, the second end disposed adjacent to a second movable end portion of the one or more cantilever members.

公开(公告)号：WO2006062911A1

公开(公告)日：2006-06-15

申请号：PCT/US2005/043969

申请日：2005-12-06

Applicant: K & S INTERCONNECT, INC. ,  WILLIAMS, Scott, R.

Inventor： WILLIAMS, Scott, R.

IPC: G01R1/04

CPC classification number: G01R1/045 ,  G01R1/0483

Abstract: A test socket for use with test equipment to test an electronic component is provided. The test socket includes a conductive body (130) defining a plurality of through holes (160), and a plurality of contact elements (170), each of the contact elements extending at least partially through a respective one of the through holes.

Abstract translation: 提供了一种用于测试电子元件测试设备的测试插座。 测试插座包括限定多个通孔（160）的导电体（130）和多个接触元件（170），每个接触元件至少部分地延伸通过相应的一个通孔。

公开(公告)号：WO01092898A2

公开(公告)日：2001-12-06

申请号：PCT/DE2001/001949

申请日：2001-05-22

IPC: G01R31/26 ,  G01R1/04 ,  G01R31/28 ,  G01R31/01

CPC classification number: G01R1/045 ,  G01R1/0466 ,  G01R31/2822

Abstract: The invention relates to a method and a device for measuring electric components, in particular for the high-frequency measurement of said components. The invention is characterized by the use of contact elements that can be displaced between an initial position and a measuring position. In the latter, the respective contact elements lie against a stop of the component and a measuring contact. Said contact elements are retained in supports consisting of electrically insulated material.

Abstract translation: 在一种方法和用于电气部件的测量装置，特别是用于高频测量接触元件被使用，其是一个起始位置和测量位置，其中每个接触元件抵靠该装置的连接，并针对一个测量接触之间运动。 接触元件被保持在电绝缘材料的支撑。

公开(公告)号：WO98041943A1

公开(公告)日：1998-09-24

申请号：PCT/US1998/004861

申请日：1998-03-13

IPC: G01R1/04 ,  G06F19/00 ,  G06Q50/22 ,  G06Q50/24 ,  H05K7/10

CPC classification number: G06Q50/24 ,  G01R1/045 ,  G01R1/0466 ,  G01R1/0483 ,  G06F19/00 ,  G06F19/325 ,  G06F19/3418 ,  G06Q50/22 ,  G16H10/60 ,  G16H15/00 ,  G16H40/20 ,  G16H80/00 ,  H05K7/1069

Abstract: A medical consultation support system in which a client computer, such as a personal computer or a terminal of an existing medical support system, is employed to transfer a structured request for consultation from a primary care physician to a supervisory host computer. The structured request may be accompanied by additional information related to the request, such as existing data files containing patient history information, medical image data, laboratory results, pathologies, etc., forming a transmittable, machine-readable collection of information relating to the consultation request. At the supervisory computer, the request is displayed for preliminary review by a receiving staff physician who designates a specialist and retrieves and assembles selected tutorial and background information, including related published articles, tutorial background lessons, practise and protocol documentation, and records of prior consultations which are related to the current consultation request, all of which are stored in one or more databases of medical information accessible to the supervisory host computer. The supervisory computer then transmits the request for consultation, together with at least the identification of the assembled supporting documentation, to the selected specialist for review, and thereafter receives the responsive comment from the selected specialist. The supervisory computer further stores the request for consultation, including the specialist's responsive comment and an indentification of the cited supporting material, as a structured case history item in the database of medical information where it may be accessed for future reference. Each consultation is further stored as a recorded learning event associated with the requesting primary care physician, and used to generate a report of continuing legal education credits earned by the requesting physician while participating in the managed consultation sessions.

Abstract translation: 一种医疗咨询支持系统，其中使用诸如个人计算机或现有医疗支持系统的终端的客户端计算机将结构化咨询请求从初级保健医师转移到监督主计算机。 结构化请求可以伴随有与请求相关的附加信息，例如包含患者历史信息，医学图像数据，实验室结果，病理学等的现有数据文件，形成与咨询有关的信息的可传输的，机器可读的信息集合 请求。 在监督计算机上，显示该请求以由接收人员医师进行初步审查，该医师指定专家并检索并组合所选择的教导和背景信息，包括相关的已发表文章，教程背景课程，实践和协议文档以及事先协商的记录 其与当前的咨询请求相关，所有这些请求都存储在监视主计算机可访问的医疗信息的一个或多个数据库中。 然后，监督计算机将咨询请求以及至少组装的支持文件的识别信息发送给所选择的专家进行审查，然后从所选择的专家接收响应意见。 监督计算机进一步将咨询请求存储在医疗信息数据库中作为结构化案例历史项目，其中可以访问以供将来参考的咨询请求，包括专家的响应评论和引用的支持材料的识别。 每次咨询进一步存储为与请求的初级保健医师相关联的记录的学习事件，并且用于在参与管理的咨询会话期间生成请求医生获得的继续法律教育学分的报告。

公开(公告)号：WO2019133097A1

公开(公告)日：2019-07-04

申请号：PCT/US2018/056694

申请日：2018-10-19

Applicant: XCERRA CORPORATION

Inventor： MROCZKOWSKI, Jason ,  HAN, Dongmei ,  LANDA, Victor

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R1/045 ,  G01R31/2886

Abstract: A test socket assembly includes a contactor body having one or more compliant interconnects, and a socket opening sized and configured to receive a device under test therein. The test socket assembly further includes a lead frame assembly disposed within the contactor body and electrically coupled with the one or more compliant interconnects, and one or more antennas at least partially disposed within the contactor body, the one or more antennas configured to directly and wirelessly communicate to the device under test when the device is disposed within the socket opening.

公开(公告)号：WO2004025309A1

公开(公告)日：2004-03-25

申请号：PCT/IB2003/003899

申请日：2003-09-04

Applicant: KONINKLIJKE PHILIPS ELECTRONICS N.V. ,  JARDIN-LEMAGNEN, Frédéric ,  SAVIN, Emannuel ,  LERUEZ, Sébastien

Inventor： JARDIN-LEMAGNEN, Frédéric ,  SAVIN, Emannuel ,  LERUEZ, Sébastien

IPC: G01R1/04

CPC classification number: G01R1/0408 ,  G01R1/045 ,  G01R1/0466 ,  G01R1/07378

Abstract: The invention relates to a test device for testing an integrated circuit called circuit to be tested, comprising one of a plurality of housings in a printed circuit called main circuit. The device comprises an insulating membrane of soft material having two opposite surfaces covered by two conductive layers interconnected by via holes and intended to be in contact with the circuit to be tested and the main circuit respectively, under the influence of a pressure exerted during the test. Protrusions are arranged on at least one of the two layers in a predefined pattern as a function of pins, tabs, pads etc. of the circuit to be tested so as to ensure a contact quality between said layer and the circuit (to be tested or the main circuit) having contact with said layer under the influence of said pressing action.

Abstract translation: 本发明涉及一种用于测试称为被测电路的集成电路的测试装置，包括被称为主电路的印刷电路中的多个外壳之一。 该装置包括一个软质材料的绝缘膜，两个相对的表面被两个导电层覆盖，两个导电层通过通孔互相连接，并且在试验过程中施加压力的影响下分别与被测试电路和主电路接触 。 作为待测电路的引脚，突片，焊盘等的函数，预定图案中的突起被布置在两层中的至少一层上，以确保所述层与电路之间的接触质量（待测试或 所述主电路）在所述按压动作的影响下与所述层接触。

公开(公告)号：WO02099930B1

公开(公告)日：2003-10-23

申请号：PCT/US0216389

申请日：2002-05-23

Applicant: MOLEX INC ,  NAKANO TOMOHIRO

Inventor： NAKANO TOMOHIRO

IPC: G01R31/26 ,  G01R1/067 ,  G01R1/073 ,  H01L23/32 ,  H01R13/11 ,  H01R13/24 ,  H01R33/74 ,  H01R33/76

CPC classification number: G01R1/045 ,  G01R1/0483 ,  H01R12/57 ,  H01R13/11 ,  H01R2201/20

Abstract: A socket connector and a contact for use in a socket connector is disclosed. The socket connector includes a plurality of contacts arranged in a grid shape and a socket body provided with the respective contacts. The contact includes a first contact piece and a second contact piece out of contact with each other in a first condition and in contact with each other in a second condition. When the first and second contact piece are in conctact with each other, the electric path length is shortened to reduce a self-inductance, thereby allowing the socket connector of the present invention to be used in high frequency application and in test and evaluation sockets.

Abstract translation: 公开了一种插座连接器和用于插座连接器中的触点。 插座连接器包括布置成格子状的多个触点和设置有各个触点的插座主体。 触点包括在第一状态下彼此接触并在第二状态下彼此接触的第一接触片和第二接触片。 当第一接触片和第二接触片彼此接合时，电路长度被缩短以减小自感，从而允许本发明的插座连接器在高频应用和测试和评估插座中使用。

公开(公告)号：WO2003048795A1

公开(公告)日：2003-06-12

申请号：PCT/JP2002/012672

申请日：2002-12-03

Applicant: 科学技術振興事業団 ,  佐々木 守

Inventor： 佐々木 守

IPC: G01R31/3187

CPC classification number: G01R31/31905 ,  G01R1/045 ,  G01R1/0483 ,  G01R31/2889 ,  G01R31/31716 ,  G01R31/318533 ,  G01R31/31926

Abstract: A testing method and a tester for a semiconductor integrated circuit device comprising a high−speed input/output element, which enable the test of a high−speed I/O element rapidly exceeding 1GHz with a simple board configuration without any alterations the test system for every I/O specification. A load board (3) provided with a loopback path (4) for connecting the external output terminal and external input terminal of a semiconductor integrated circuit device (1) comprising a high−speed input/output element (2) with a transmission line is loaded with the semiconductor integrated circuit device (1). A testing means (5) provided in the semiconductor integrate circuit device (1) and the loopback path (4) are utilized to test the action of the high−speed input/output element (2) in the semiconductor integrated circuit device (1).

Abstract translation: 一种用于半导体集成电路器件的测试方法和测试器，包括高速输入/输出元件，其能够以简单的板配置测试快速超过1GHz的高速I / O元件，而无需任何改变 每个I / O规范。 设置有用于连接包括具有传输线的高速输入/输出元件（2）的半导体集成电路器件（1）的外部输出端子和外部输入端子的环回路径（4）的负载板（3） 装载有半导体集成电路器件（1）。 设置在半导体集成电路装置（1）和环回路径（4）中的测试装置（5）用于测试半导体集成电路装置（1）中的高速输入/输出元件（2）的动作， 。

公开(公告)号：WO0192898A3

公开(公告)日：2002-07-25

申请号：PCT/DE0101949

申请日：2001-05-22

Applicant: SILLNER GEORG RUDOLF

Inventor： SILLNER GEORG RUDOLF

IPC: G01R31/26 ,  G01R1/04 ,  G01R31/28 ,  G01R31/01

CPC classification number: G01R1/045 ,  G01R1/0466 ,  G01R31/2822

Abstract: The invention relates to a method and a device for measuring electric components (1), in particular for the high-frequency measurement of said components. The invention is characterized by the use of contact elements (16) that can be displaced between an initial position and a measuring position. In the latter, the respective contact elements lie against a stop (3) of the component and a measuring contact (15). Said contact elements (16) are retained in supports (17) consisting of electrically insulated material.

Abstract translation: 在一种方法和用于电气部件（1）的测量装置，特别是可以使用的接触元件（16），用于高频测量，这是一个起始位置和测量位置之间移动，其中在每个情况下，接触元件对所述设备的和针对（3）的连接 一个测量接触垫（15）。 接触元件（16）被保持在一个电绝缘材料支承件（17）。

公开(公告)号：WO01051935A1

公开(公告)日：2001-07-19

申请号：PCT/DE2000/004564

申请日：2000-12-20

IPC: G01R31/26 ,  G01R1/04 ,  G01R1/067 ,  G01R1/073 ,  G01R31/28 ,  H01R33/76 ,  G01R31/316

CPC classification number: G01R1/0466 ,  G01R1/045 ,  G01R31/2822

Abstract: The invention relates to a test device for a semiconductor component, whereby the semiconductor component comprises at least one first contact. The test device comprises at least one second contact for producing an electrical connection with the first contact. The second contact is arranged in a fixed manner relative to the test device.

Abstract translation: 本发明提出了一种半导体器件，其中所述半导体组件包括至少一个第一接触的测试装置。 该测试装置包括用于建立到所述第一触点的电连接的至少一个第二接触。 在这种情况下，第二接触相对于测试设备的设置固定。