Abstract:
Eine optische Vorrichtung umfasst ein Beleuchtungsmodul (100) mit einem Träger (110), der beispielsweise mindestens einen lichtdurchlässigen Bereich (112) aufweist. Das Beleuchtungsmodul (100) umfasst mehrere Lichtquellen (111), die auf dem Träger (110) angeordnet sind.
Abstract:
A Light-Emitting Diode (LED) illuminator-condenser capable of supplying bright-field, dark-field, fluorescence, oblique, and phase-contrast illumination under Köhler-like conditions. A single lens may be permanently focused on the specimen plane. Illumination conditions may be made by a combination of uniform LEDs, collimating masks and diffusers. LEDs may be arranged in one or more ring-shaped patterns.
Abstract:
The present invention relates to digital pathology, and relates in particular to a digital pathology scanner illumination unit. In order to provide digital pathology scanning with improved illumination, a digital pathology scanner illumination unit (10) is provided that comprises a light source (12), a light mixing chamber (14), and a light diffuser (16). The light source comprises a plurality of light elements (18) that are arranged longitudinally along a linear extension direction. The mixing chamber comprises a transparent volume (22) providing a mixing distance (DM) between the plurality of the light elements and the light diffuser such that light with a uniform intensity is provided at a downstream edge (26) of the mixing chamber; and the mixing chamber is arranged, in terms of light propagation, between the plurality of the light elements and the light diffuser. Further, the light diffuser comprises a diffusing material such that the light is transformed into light that has uniformity at different angles, in particular low angles.
Abstract:
With a view to dependable imaging with a particularly high possible throughput of objects to be investigated, a method for microscopy imaging, in particular for high throughput imaging, is provided, wherein an image plane of an object to be investigated is defined, wherein multiple images are recorded in focus on the image plane of the object when the object is moved along a predeterminable path in an X-Y plane by means of a camera using a lens, and wherein a point in time of the image recordings is controlled path-dependently by way of a trigger signal with flash activation. The method is characterized in that automatic setting of the focus on the image plane is performed for the image recordings on the basis of Z position values of the object and/or the image plane that are obtained interferometrically in a Z direction. A corresponding device for microscopy imaging is also provided.
Abstract:
Systems and methods for structured illumination super-resolution phase microscopy are disclosed. According to an aspect, an imaging system includes a light source configured to generate light. The system also includes a diffraction grating positioned to receive and diffract the output light. The system also includes a sample holder positioned to receive the diffracted light for transmission through a sample. Further, the system includes an image detector positioned to receive the light transmitted through the sample and configured to generate image data based on the received light. The system also includes a computing device configured to apply subdiffraction resolution reconstruction to the image data for generating an image of the sample.
Abstract:
L'invention concerne un dispositif de projection homothétique d'un motif à la surface d'un échantillon (21) comportant une zone photosensible. Le dispositif comporte des moyens permettant de projeter un motif à la surface de l'échantillon et un système optique (12) permettant de contrôler de façon continue l'étendue du motif projeté à la surface de l'échantillon. L'invention concerne également un procédé de photolithographie utilisant un tel dispositif de projection, ainsi qu'un procédé de transformation d'un microscope optique en un tel dispositif de projection, ainsi qu'un kit de transformation d'un microscope optique en un tel dispositif de projection.
Abstract:
Apparatus and methods of four wave mixing (FWM) holography are described, including illuminating a sample with a first beam, a second beam, and a third beam, and combining the generated FWM signal with a reference beam at a imaging device to obtain holographic image data. In some examples, the first and second beams may be provided by a single pump-probe beam. The third beam may be a Stokes beam or an anti-Stokes beam. A representative example is coherent anti-Stokes Raman holography (CARS holography), which includes illuminating a sample with a pump/probe beam and a Stokes beam to obtain a CARS signal from the sample; and combining the CARS signal with a reference beam to obtain a CARS hologram.
Abstract:
During mask inspection it is necessary to identify defects which also occur during wafer exposure. Therefore, the aerial images generated in the resist and on the detector have to be as far as possible identical. In order to achieve an equivalent image generation, during mask inspection the illumination and, on the object side, the numerical aperture are adapted to the scanner used. The invention relates to a mask inspection microscope for variably setting the illumination. It serves for generating an image of the structure (150) of a reticle (145) arranged in an object plane in a field plane of the mask inspection microscope. It comprises a light source (5) that emits projection light, at least one illumination beam path (3, 87, 88), and a diaphragm for generating a resultant intensity distribution of the projection light in a pupil plane (135) of the illumination beam path (3, 87, 88) that is optically conjugate with respect to the object plane. According to the invention, the diaphragm is embodied in such a way that the resultant intensity distribution of the projection light has at least one further intensity value between a minimum and a maximum intensity value.
Abstract:
A microscope (200) for optical imaging of high optical scattering coefficient biological tissue, comprising an optical excitation source (201) for irradiating a scan area of the sample (205) and generating optical emissions, wherein the sample has a first face facing away from the source and a second face facing the source. A two dimensional element (207) for scanning the light over the sample; a focussing element (209) having a numerical aperture NAi to focus the light onto the sample; a first optical condenser (213) to collect light from the first face, the collected light comprising source transmitted light and first optical emission generated in the sample, the condenser having a NA2 larger than NAi; an optical filter(215) to block the transmitted source light; an aperture with a size corresponding to the irradiated area of the sample, the aperture at the conjugate image position of the sample generated by the condenser; and an optical detector (217) collecting light from the first face for detecting the first optical emission from the scan area.
Abstract:
Systems, apparatus and methods pertaining generally, in some embodiments, to improved illumination for microscopes. For example, certain embodiments relate to the use of an array of multiple wavelength light-emitting diodes that are coupled to an integrating sphere. Light exiting the sphere is relayed using a fused fiber optic bundle. The systems, etc., effectively improve the illumination system over the traditional illumination system used by most microscope manufacturers, and can be particularly useful when applied to photomicrography.