Abstract:
Devices and methods for analog to digital conversion are provided. The device can have a supply voltage coupled to a bootstrap circuit operable to provide a boosted voltage during a first period defined by a sample phase (Ps) signal and a hold phase (Ph) signal. The device can also have a sampling circuit having an input node and operable to sample an input signal supplied to the input node. The device can also have a switching circuit having a first switch and a second switch. The switching circuit can be coupled to the bootstrap circuit and to the sampling circuit. The switching circuit can be configured to isolate the input node from shorting currents to the supply voltage for a portion of the first period.
Abstract:
In described examples, a circuit (300) includes a first analog to digital converter (ADC) (306) that generates a coarse output in response to a first input (302) and a second input (304). The first ADC (306) generates the coarse output in a differential phase. A pipeline ADC (320) generates a differential signal (330) in response to the coarse output, the first input (302) and the second input (304). The pipeline ADC (320) generates the differential signal (330) in a common-mode phase. The first ADC (306) generates a common mode signal (310) in the common-mode phase.
Abstract:
In described examples, a method of testing linearity of an ADC includes receiving (1310) a trigger signal indicating an ADC input voltage step adjustment, and reading (1311) an ADC output sample upon receiving the trigger signal. The ADC output sample has a value range of N integer values that correspond to N discrete ADC output codes. Also, the method includes computing (1312) a histogram of code occurrences for M consecutive ADC output codes. The histogram includes M number of bins corresponding to the M consecutive ADC output codes, where M is less than N. Further, the method includes updating a DNL value and an INL value according to the histogram at an interval of K number of ADC output sample readings, and shifting (1330) the histogram by one ADC output code after updating the DNL and the INL values.
Abstract:
In described examples of systems and methods for load current compensation for analog input buffers, an input buffer (300) may include: a first transistor (Q 1 ) having a collector terminal coupled to a power supply node and a base terminal coupled to a first input node (vinp); a second transistor (Q 2 ) having a collector terminal coupled to an emitter terminal of the first transistor (Q 1 ); a third transistor (Q 3 ) having an emitter terminal coupled to an emitter terminal of the second transistor (Q 2 ) and to a ground node, a collector terminal coupled to a current source (I bias ), and a base terminal coupled to the collector terminal and to a base terminal of the second transistor (Q 2 ); and a capacitor (C 1 ) coupled to the base terminals of the second and third transistors (Q 2 and Q 3 ) and to a second input node (v inn ), wherein the first and second input nodes (v inp and V inn ) are differential inputs.
Abstract:
A time-interleaved (TI) analog-to-digital converter (ADC) architecture employs a low resolution coarse ADC channel that samples an input analog signal at a Nyquist rate and facilitates background calibration of timing-skew error without interrupting normal operation to sample/convert the input signal. The coarse ADC channel provides a timing reference for multiple higher resolution TI ADC channels that respectively sample the input signal at a lower sampling rate. The coarse ADC digital output is compared to respective TI ADC digital outputs to variably adjust in time corresponding sampling clocks of the TI ADC channels so as to substantially align them with the sampling clock of the coarse ADC channel, thus reducing timing-skew error. In one example, the coarse ADC output provides the most significant bits (MSBs) of the respective TI ADC digital outputs to further improve conversion speed and reduce power consumption in these channels.
Abstract:
Relative capacitance of a plurality of capacitive sensors may be monitored by using only one ADC conversion. A plurality of capacitive sensors individually charges a sample and hold capacitor. After all of the plurality of capacitive sensors have charged the sample and hold capacitor, a digital conversion of the resulting analog on the sample and hold capacitor is made and stored in a memory. This stored digital collective voltage is compared to a previously stored one and if different then a proximity/touch event may have occurred. Therefore, an entire panel of capacitive sensors may be quickly monitored for a change in the "group" capacitance thereof, or portions of the capacitive sensors may be monitored for a change in the "subgroup" capacitance thereof. By knowing which subgroup of capacitive sensors has changed its collective capacitive value, a more focused and selective capacitive sensor measurement can be made that uses less power.
Abstract:
A transmitter includes a delta-sigma modulator (100) characterized by a noise transfer function having a multitude of zeroes positioned substantially near a frequency band of a receive signal. The transmitter further includes, in part, a multi-phase digital-to-analog converter, DAC (200), converting an output signal of the delta- sigma modulator to an analog signal. The DAC is characterized by a transfer function that passes the desired signal to its output and attenuates a multitude of images of the sampling clock signal. The transmitter transmits at a frequency defined by an odd multiple of a fraction of the sampling clock signal frequency. The DAC includes a number of stages each pair of which is associated with one of the images being attenuated. The delta-sigma modulator includes a multitude of stages each associated with a different one of the zeroes. Each stage of said delta-sigma modulator optionally receives three tap coefficients.
Abstract:
An approach to linearization relaxes the requirements on the digitization of the analog output signal while maintaining the benefits of a high sampling rate of the output signal. The digitization approach extracts sufficient information to characterize the output signal over a wide bandwidth without necessarily determining sufficient information to fully represent the output signal, for example, without sampling the output signal at the Nyquist sampling rate with a sufficient precision to accurately represent the signal.