Abstract:
An example sinter system includes a sinter gas inlet at a sinter furnace for a sinter gas, a tracer gas inlet at the sinter furnace for a tracer gas different from the sinter gas, and an outlet at the sinter furnace to output the sinter gas and the tracer gas. The example sinter system further includes: a support structure to support a sample green object in the sinter furnace, an opening at the support structure connected to the tracer gas inlet, the opening to output the tracer gas into the sinter furnace, and a detector to: determine an amount of the tracer gas flowing through the outlet during a sinter process as a sample green object positioned on the support structure changes shape during the sinter process with respect to the opening and modifies a flow rate of the tracer gas to the outlet; and determine when to stop the sinter process based on a determined amount of the tracer gas.
Abstract:
The invention relates to a high temperature furnace (100) comprising a heating chamber (1), at least one first burner (10) for heating said heating chamber, and a condensation device (30) arranged in fluid connection with said heating chamber via an exhaust outlet (31). The at least one first burner (10) is arranged for providing a water vapor atmosphere in the heating chamber (1), and the condensation device (30) is arranged for condensing an exhaust gas generated by the at least one first burner (10), such that there is no need for a chimney and no emission of air contaminants.
Abstract:
Sintervorrichtung (4) zum Sintern zumindest eines, insbesondere dentalen, Werkstücks (2) mit einem Sinterhohlraum (18) zur Aufnahme des zu sinternden Werkstücks (2) während des Sintervorgangs, wobei der Sinterhohlraum (18) von einer Basisfläche (6) der Sintervorrichtung (4) begrenzt ist, auf der das Werkstück während des Sintervorgangs ablegbar ist, wobei die Sintervorrichtung (4) zumindest eine Gaszuführung (5) zur Einleitung von Schutzgas in den Sinterhohlraum (18) aufweist, wobei die Gaszuführung (5) auf der dem Sinterhohlraum (18) entgegen gesetzten Seite der Basisfläche (6) angeordnet ist und die Basisfläche (6) zur Einleitung des von der Gaszuführung (5) kommenden Schutzgases in den Sinterhohlraum (18) zumindest einen für das Schutzgas durchlässigen Durchströmbereich (14) aufweist.
Abstract:
The invention relates to an apparatus and process for the prodution of polycrystalline silicon for photovoltaic applications. The apparatus is characterised in that it comprises of multiple chambers, preferably three(1, 2, 3), arranged longitudinally one after the other and equipped with: gas immission and extraction means; means for guiding (7) and moving the crucible (6) containing the silicon-based material; insulation and temperature control means; heating means; air-tightness means (8) for each chamber. One of said chambers constitutes the furnace of the apparatus and comprises an area (4) in which the smelting of the material contained in the crucible (6) is carried out, said furnace being equipped with heating means and bearing a heat-stable pedestal (5), suitable for moving the crucible vertically and thus for introducing it into, or extracting it from the smelting area (4), respectively.
Abstract:
A device (24) adapted for attachment to a thermal processing furnace (2), the device includes a housing (26) having first (8) and second (10) openings with a chamber (28) located therebetween, the second opening is operatively connected to a thermal processing furnace and in communication with the thermal processing furnace for receiving a thermal process generating gas stream containing combustibles from the thermal processing furnace, a gas supply (36) assembly located within the chamber for supplying a heated oxygen-containing gas (38) at a temperature and velocity sufficient to mix the combustible and the oxygen-containing gas to oxidize the combustibles into harmless by-products.
Abstract:
A film forming device, comprising a treating furnace, gas feeding means feeding treating gas into the processing furnace, heating means heating the inside of the treating furnace to a specified treating temperature, and a normal pressure exhaust system for exhausting the gas inside the treating furnace at a specified exhaust pressure near the atmospheric pressure, the normal pressure exhaust system further comprising a flow-adjustable and pressure-adjustable valve, wherein the exhaust pressure of the normal pressure exhaust system is detected by a pressure sensor, and a control part controls the valve based on the pressure detected by the pressure sensor, whereby a stable control is allowed without requiring the introduction of the atmosphere or inert gas, and the structure of the exhaust system is simplified so as to reduce the cost of the entire device.
Abstract:
A vertically oriented thermal processor (10) for processing batches of semiconductor wafers held within a processing chamber (16). The processing chamber (16) is contained within a processing vessel (18). A furnace liner (82) surrounds the processing vessel (18) in spaced relationship. A first flow of cooling fluid is supplied upwardly between the processing vessel (18) and furnace liner (82). The incoming first flow also serves to cool the base plate assembly (168) which is constructed to shield the processing chamber from off-gassing. A second flow path of cooling fluid is supplied downwardly between the furnace liner (82) and an inner wall of the furnace heater (88) in countercurrent relationship to the first flow. An outflow baffle (630) and outflow cooler (600) are also advantageously included to isolate the processing chamber and cool the exhausting gases. A preferred power supply system is also described.
Abstract:
Procédé de traitement thermique en volume d'une pièce (2) ayant une surface externe (22) délimitant son volume, le procédé comprenant les étapes suivantes : a. fournir une source laser (3) b. fournir la pièce (2) c. fournir des moyens de support (4) pour supporter la pièce (2); d. placer ladite pièce (2) de sorte qu'elle soit maintenue en position par lesdits moyens de support (4); e. irradier avec ladite source laser (3) au moins une portion (23) de la surface externe (22) de ladite pièce (2) avec une puissance et une durée d'exposition laser pour obtenir une élévation de température dans essentiellement l'ensemble du volume de la pièce (2).
Abstract:
In an example implementation, a sintering system includes a support structure in a sintering furnace to support a token green object during a sintering process. The system includes wires installed into the furnace and through the support structure to contact the object. An impedance meter is operatively coupled to the wires to determine electrical impedance of the object during the sintering process.