- 专利标题: Manufacturer self-test for solid-state drives
-
申请号: US15423692申请日: 2017-02-03
-
公开(公告)号: US10410736B2公开(公告)日: 2019-09-10
- 发明人: Zhengang Chen , David Patmore , Yingji Ju , Erich F. Haratsch
- 申请人: Seagate Technology LLC
- 申请人地址: US CA Cupertino
- 专利权人: Seagate Technology LLC
- 当前专利权人: Seagate Technology LLC
- 当前专利权人地址: US CA Cupertino
- 代理机构: Setter Roche LLP
- 代理商 Kirk A. Cesari
- 主分类号: G11C29/42
- IPC分类号: G11C29/42 ; G11C29/44 ; G11C29/36 ; H03M13/11 ; H04L1/00 ; G06F11/00 ; G11C7/10 ; G06F3/06 ; G11C11/56 ; G11C29/52 ; G11C16/10 ; G11C16/00
摘要:
An apparatus includes a memory and a controller. The memory may be configured to store data. The controller may be configured to process a plurality of input/output requests to a plurality of blocks of the memory that are not marked as bad on a block list, perform a code rate test that programs the plurality of blocks of the memory at three or more code rates of an error correction code scheme, and mark any of the plurality of blocks identified as bad during the code rate test on the block list.
公开/授权文献
- US20170148530A1 MANUFACTURER SELF-TEST FOR SOLID-STATE DRIVES 公开/授权日:2017-05-25
信息查询