Invention Grant
- Patent Title: Sample observation device and sample observation method
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Application No.: US16629326Application Date: 2018-04-10
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Publication No.: US11340165B2Publication Date: 2022-05-24
- Inventor: Norikazu Sugiyama , Masanori Matsubara , Satoshi Yamamoto
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JPJP2017-135427 20170711
- International Application: PCT/JP2018/015093 WO 20180410
- International Announcement: WO2019/012765 WO 20190117
- Main IPC: G01N21/64
- IPC: G01N21/64 ; C12Q1/06 ; G01N1/30 ; G01N1/06 ; G01N21/51 ; G06T7/00 ; G01N15/14 ; G01N21/00 ; G01N1/31 ; G02B21/00 ; G02B21/18 ; G02B21/26 ; G02B21/36 ; G01N21/17 ; G01N15/10

Abstract:
A sample observation device includes an imaging unit that images observation light generated due to irradiation with the planar light that is transmitted through a membrane filter and outputs fluorescent light image data, a partial image generation unit that specifies a first area corresponding to a first sample holding space and a second area corresponding to a second sample holding space in the fluorescent light image data, and generates first partial image data corresponding to the first area and second partial image data corresponding to the second area, an observation image generation unit that generates first observation image data and second observation image data on the basis of the partial image data, and an analysis unit that analyzes a sample on the basis of the first observation image data and the second observation image data.
Public/Granted literature
- US20210116373A1 SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD Public/Granted day:2021-04-22
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