发明申请
- 专利标题: Charged particle beam apparatus and automatic astigmatism adjustment method
- 专利标题(中): 带电粒子束装置和自动散光调节方法
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申请号: US10980096申请日: 2004-11-02
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公开(公告)号: US20050092930A1公开(公告)日: 2005-05-05
- 发明人: Masahiro Watanabe , Hiroyuki Shinada , Atsuko Takafuji , Masami Lizuka , Yasuhiro Gunji , Kouichi Hayakawa , Masayoshi Takeda
- 申请人: Masahiro Watanabe , Hiroyuki Shinada , Atsuko Takafuji , Masami Lizuka , Yasuhiro Gunji , Kouichi Hayakawa , Masayoshi Takeda
- 申请人地址: JP Chiyoda-ku JP Kanagawa
- 专利权人: Hitachi, Ltd. Incorporation,Hitachi Information Technology Co., Ltd. Incorporation
- 当前专利权人: Hitachi, Ltd. Incorporation,Hitachi Information Technology Co., Ltd. Incorporation
- 当前专利权人地址: JP Chiyoda-ku JP Kanagawa
- 优先权: JP11-176681 19990623
- 主分类号: G01R31/307
- IPC分类号: G01R31/307 ; H01J37/153 ; G01K1/08 ; G21K5/10 ; H01J3/14 ; H01J3/26 ; H01J37/08
摘要:
According to the invention, techniques for automatically adjusting for astigmatism in a charged particle beam apparatus. Embodiments according to the present invention can provide a charged particle beam apparatus and an automatic astigmatism adjustment methods capable of automatically correcting astigmatism and a focal point in a relatively short period of time by finding a plurality of astigmatism correction quantities and a focal point correction quantity in a single operation from a relatively small number of 2 dimensional images. Specific embodiments can perform such automatic focusing while minimizing damages inflicted on subject samples. Embodiments include, among others, a charged particle optical system for carrying out an inspection, a measurement and a fabrication with a relatively high degree of accuracy by using a charged particle beam.
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