- 专利标题: Generation of compact alumina passivation layers on aluminum plasma equipment components
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申请号: US14486105申请日: 2014-09-15
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公开(公告)号: US09903020B2公开(公告)日: 2018-02-27
- 发明人: Sung Je Kim , Laksheswar Kalita , Yogita Pareek , Ankur Kadam , Prerna Sonthalia Goradia , Bipin Thakur , Dmitry Lubomirsky
- 申请人: Applied Materials, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Kilpatrick Townsend & Stockton LLP
- 主分类号: C23C22/48
- IPC分类号: C23C22/48 ; C23C22/56 ; C23C22/66 ; C23C14/22 ; C23C16/455 ; C23C16/50 ; H01J37/32 ; H01L21/67 ; H01L21/673 ; C23F1/32 ; C23F1/36 ; C23F1/16 ; C23F1/20
摘要:
A process for generating a compact alumina passivation layer on an aluminum component includes rinsing the component in deionized water for at least one minute, drying it for at least one minute, and exposing it to concentrated nitric acid, at a temperature below 10° C., for one to 30 minutes. The process also includes rinsing the component in deionized water for at least one minute, drying it for at least one minute, and exposing it to NH4OH for one second to one minute. The process further includes rinsing the component in deionized water for at least one minute and drying it for at least one minute. A component for use in a plasma processing system includes an aluminum component coated with an AlxOy film having a thickness of 4 to 8 nm and a surface roughness less than 0.05 μm greater than a surface roughness of the component without the AlxOy film.
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