DETERMINING SPECTRAL EMISSION CHARACTERISTICS OF INCIDENT RADIATION
    13.
    发明公开
    DETERMINING SPECTRAL EMISSION CHARACTERISTICS OF INCIDENT RADIATION 审中-公开
    确定事故辐射的光谱辐射特性

    公开(公告)号:EP3191811A1

    公开(公告)日:2017-07-19

    申请号:EP15840035.8

    申请日:2015-09-08

    Abstract: The present disclosure describes optical radiation sensors and detection techniques that facilitate assigning a specific wavelength to a measured photocurrent. The techniques can be used to determine the spectral emission characteristics of a radiation source. In one aspect, a method of determining spectral emission characteristics of incident radiation includes sensing at least some of the incident radiation using a light detector having first and second photosensitive regions whose optical responsivity characteristics differ from one another. The method further includes identifying a wavelength of the incident radiation based on a ratio of a photocurrent from the first region and a photocurrent from the second region.

    Abstract translation: 本公开描述了便于将特定波长分配给测量的光电流的光学辐射传感器和检测技术。 这些技术可用于确定辐射源的光谱发射特性。 在一个方面中,确定入射辐射的光谱发射特性的方法包括使用具有光学响应特性彼此不同的第一和第二光敏区域的光检测器来检测至少一些入射辐射。 该方法还包括基于来自第一区域的光电流与来自第二区域的光电流的比率来识别入射辐射的波长。

    OPTO-ELECTRONIC MODULES AND METHODS OF MANUFACTURING THE SAME
    16.
    发明公开
    OPTO-ELECTRONIC MODULES AND METHODS OF MANUFACTURING THE SAME 审中-公开
    美国德黑兰大学学报(自然科学版)

    公开(公告)号:EP2659510A2

    公开(公告)日:2013-11-06

    申请号:EP12743355.5

    申请日:2012-07-10

    Abstract: Manufacturing opto-electronic modules (1) includes providing a substrate wafer (PW) on which detecting members (D) are arranged; providing a spacer wafer (SW); providing an optics wafer (OW), the optics wafer comprising transparent portions (t) transparent for light generally detectable by the detecting members and at least one blocking portion (b) for substantially attenuating or blocking incident light generally detectable by the detecting members; and preparing a wafer stack (2) in which the spacer wafer (SW) is arranged between the substrate wafer (PW) and the optics wafer (OW) such that the detecting members (D) are arranged between the substrate wafer and the optics wafer. Emission members (E) for emitting light generally detectable by the detecting members (D) can be arranged on the substrate wafer (PW). Single modules (1) can be obtained by separating the wafer stack (2) into separate modules.

    Abstract translation: 制造光电模块(1)包括提供其上布置有检测构件(D)的衬底晶片(PW); 提供间隔晶片(SW); 提供光学晶片(OW),所述光学晶片包括对于通常可由检测构件检测的光透明的透明部分(t)和用于基本上衰减或阻挡通常由检测构件可检测的入射光的至少一个阻挡部分(b) 以及准备其中所述间隔晶片(SW)布置在所述衬底晶片(PW)和所述光学晶片(OW)之间的晶片堆叠(2),使得所述检测构件(D)布置在所述衬底晶片和所述光学晶片之间 。 用于发射由检测部件(D)可以通常检测的光的发射部件(E)可以布置在基板晶片(PW)上。 可以通过将晶片堆叠(2)分离成单独的模块来获得单个模块(1)。

    OPTO-ELECTRONIC MODULE AND DEVICES COMPRISING THE SAME
    17.
    发明公开
    OPTO-ELECTRONIC MODULE AND DEVICES COMPRISING THE SAME 有权
    光电模块和设备

    公开(公告)号:EP2659282A1

    公开(公告)日:2013-11-06

    申请号:EP12813763.5

    申请日:2012-12-18

    CPC classification number: G01V8/12 G01J1/0411 G01J5/08 G01S7/4811 G01S17/026

    Abstract: The opto-electronic module (1) comprises a detecting channel (30) comprising a detecting member (D) for detecting light and an emission channel (20) comprising an emission member (E) for emitting light generally detectable by said detecting member. Therein, a radiation distribution characteristic for an emission of light from said emission channel is non rotationally symmetric; and/or a sensitivity distribution characteristic for a detection in said detecting channel of light incident on said detection channel is non rotationally symmetric; and/or a central or main emission direction for an emission of light from said emission channel and a central or main detection direction for a detection of light incident on said detection channel are aligned not parallel to each other; and/or at least a first one of the channels comprises at least one of the following: e1) at least two passive optical components (52, 52'; 53, 53') each having an optical axis (Α2, Α2'; Α3, Α3'), wherein these components are arranged such that these optical axes do not coincide; e2) at least one passive optical component (52, 52',53, 53') having an optical axis, wherein this component is arranged with respect to the detecting member (D) and the emission member (E), respectively, comprised in that first channel such that this optical axis does not coincide with a central axis (c2; c3) of detection and emission, respectively, of the detecting or emission member comprised in said first channel; e3) at least one passive optical component (52, 52', 53, 53') constituting a non rotationally symmetric beam forming element or a portion thereof; e4) at least one passive optical component (52, 52', 53, 53') arranged so as to accomplish that a main direction (m2; m3) or a central direction (c2; c3) of light entering and exiting, respectively, the first channel is angled with respect to a such a direction, of light entering or exiting the first channel without presence of said at least one passive optical component in said first channel.

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