Abstract:
Apparatus for illuminating the surface of a material, comprising an illuminating device (101) for illuminating the surface of the material (103) with a calibrating light (105), a recording device (107) for recording a measuring light (109), emitted by the surface of the material (103) in response to the calibrating light (105), and a processor device (111) for recording the spectral characteristic of the measuring light (109) that characterizes a diffuse spectral reflectance of the surface of the material (103), wherein the illuminating device (101) is designed to produce an illuminating light (113) for illuminating the surface of the material (103) that has a spectral characteristic that corresponds to the spectral characteristic of the measuring light (109).
Abstract:
A method and apparatus for producing with a gas discharge laser an output laser beam comprising output laser light pulses, for delivery as a light source to a utilizing tool is disclosed which may comprise a beam path and a beam homogenizer in the beam path. The beam homogenizer may comprise at least one beam image inverter or spatial rotator, which may comprise a spatial coherency cell position shifter. The homogenizer may comprise a delay path which is longer than, but approximately the same delay as the temporal coherence length of the source beam. The homogenizer may comprise a pair of conjoined dove prisms having a partially reflective coating at the conjoined surfaces of each, a right triangle prism comprising a hypotenuse face facing the source beam and fully reflective adjoining side faces or an isosceles triangle prism having a face facing the source beam and fully reflective adjoining side faces or combinations of these, which may serve as a source beam multiple alternating inverted image creating mechanism. The beam path may be part of a bandwidth measuring the bandwidths of an output laser beam comprising output laser light in the range of below 500 femtometers at accuracies within tens of femtometers. The homogenizer may comprise a rotating diffuser which may be a ground glass diffuser which may also be etched. The wavemeter may also comprise a collimator in the beam path collimating the diffused light; a confocal etalon creating an output based upon the collimated light entering the confocal etalon; and a detector detecting the output of the confocal etalon and may also comprise a scanning mechanism scanning the angle of incidence of the collimated light entering the confocal etalon which may scan the collimated light across the confocal etalon or scan the etalon across the collimated light, and may comprise an acousto-optical scanner. The confocal etalon may have a free spectral range approximately equal to the E95 width of the beam being measured. The detector may comprise a photomultiplier detecting an intensity pattern of the output of the confocal etalon.
Abstract:
The present technology relates to solid-state image sensor and an imaging system which are capable of providing a solid-state image sensor and an imaging system which are capable of realizing a spectroscopic/imaging device for visible/near-infrared light having a high sensitivity and high wavelength resolution, and of achieving two-dimensional spectrum mapping with high spatial resolution. There are provided a two-dimensional pixel array, and a plurality of types of filters that are arranged facing a pixel region of the two-dimensional pixel array, the filters each including a spectrum function and a periodic fine pattern shorter than a wavelength to be detected, wherein each of the filters forms a unit which is larger than the photoelectric conversion device of each pixel on the two-dimensional pixel array, where one type of filter is arranged for a plurality of adjacent photoelectric conversion device groups, wherein the plurality of types of filters are arranged for adjacent unit groups to form a filter bank, and wherein the filter banks are arranged in a unit of N×M, where N and M are integers of one or more, facing the pixel region of the two-dimensional pixel array.
Abstract:
The invention provides a dynamically swept tunable laser system and method for measuring sensor characteristics obtained from an array of optical sensors comprising means for dividing the total wavelength sweep of the laser into different regions in any particular order where each region contains single or multiple contiguous sweep segments and where each sweep segment is referenced by a start and a stop reference and can have different lengths compared to the other sweep segments. The sensor characteristics are determined from each region swept by the tunable laser. The invention provides for the tunable laser to be adapted to operate in a quasi-continuous mode to select segments in any order. The relative sweep rates of regions can be changed such that some regions can be swept more times than other regions.
Abstract:
A system for remotely sensing a target material in situ include a broad-band laser source, at least one tunable filter coupled to the source laser for generating a swept-frequency signal an optical device for splitting the swept-frequency signal into a first illumination signal and second illumination signal, a first optical path for directing the first illumination signal unto the target material and receiving a reflected signal from the target material, a second optical path for receiving the second illumination signal and generating a spectral reference signal, and a controller coupled to the first optical path and the second optical path for adjusting the frequency and spatial resolution of the laser source based at least in part on a comparison of the spectral reference signal and the reflected signal.
Abstract:
In a method of generating synthesized appearance property data of a simulated material a Bidirectional Texture Function BTF representing the simulated material is used. The BTF is suitable for input into a rendering engine capable of generating a visual representation of the material on a monitor. In the method a densely populated original BTF (B) of a reference material (M R ) and sparse reflectance values (D) of a source material (M S ) are provided. A modified BTF (B') is then built by transferring said sparse reflectance values (D) into said original BTF (B).
Abstract:
A spectroscopic measurement device includes a variable wavelength interference filter, an imaging section (an imaging element and a light intensity acquisition section) adapted to image the light dispersed by the variable wavelength interference filter to obtain a spectral image, and a data output section (a storage section and a communication section) adapted to output profile-generating data used to generate a profile of an image display device, and the data output section outputs measurement data, which includes light intensity in each pixel of each of the spectral images and a coordinate value of the pixel associated with each other, as profile-generating data in a case in which the imaging section obtains the spectral images with respect to a color pattern including a plurality of colors of color patches output from the image display device.
Abstract:
A sample gas analyzing device (100) that quantitatively analyzes one or more measurement target components in a sample gas by performing a multivariate analysis using a spectral spectrum obtained by irradiating light to the sample gas, wherein the analyzing device is adapted to switch the library data between a first generation condition in a period of a predetermined time lapse after starting the sample gas generation and a second generation condition after the predetermined time lapse, wherein under the first generation condition, a plurality of measurement target components are quantitatively analyzed using the first library data obtained by compensating interference influence of measurement extra-target components; and under the second generation condition, the quantitative analysis of a plurality of measurement target components is performed using second library data obtained without compensating interference influence of the measurement extra-target components.
Abstract:
A spectrometer (11) recognizes a measurement target on the basis of the spectral data set of observed light detected by a spectral sensor (14) capable of measuring wavelength information and light intensity information. The spectrometer is provided with a spectral data processor (16). Spectral data sets are detected at two different positions by the spectral sensor, and the processor subtracts a first spectral data set from a second spectral data set, or divides the first spectral data set by the second spectral data set to calculate one phase correlation spectral data set, which is correlated to the spectral data sets at the two different positions. The processor simultaneously identifies the measurement target corresponding to the two different positions on the basis of the correlation spectral data set.