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    Detection and analysis of chemical or biological substances using passive emission spectroscopy
    31.
    发明公开
    Detection and analysis of chemical or biological substances using passive emission spectroscopy 审中-公开
    检测和化学或生物物质的分析通过被动发射光谱法

    公开(公告)号：EP1484597A1

    公开(公告)日：2004-12-08

    申请号：EP04013124.5

    申请日：2004-06-03

    Applicant: Northrop Grumman Corporation

    Inventor： Chou, Mau-Song ,  Behrens, H. Wilhelm ,  Sullivan, Brian M. ,  Brock, John C.

    IPC: G01N21/35 ,  G01J3/443

    CPC classification number: G01N21/274 ,  G01J3/443 ,  G01N21/3518

    Abstract: A system (10) for detecting and analyzing chemical and biological constituents in a sample (12). The system (10) includes a spectrometer (18) for passively receiving emissions (22) from the sample (12) to detect the constituents therein. A cold device (28) is positioned within the field-of-view of the spectrometer (18) at an opposite side of the sample (12) from the spectrometer (18). The cold device (28) provides a low temperature background relative to the sample (12) so as to increase the emissions (22) from the sample (12) and also to reduce the background emission. The system may further comprise a sample chamber (14) for containing the sample. Alternatively, the system may comprise a transmission sample window onto which the sample is provided or the system may be arranged for remotely investigating a sample cloud in the free atmosphere.

    Abstract translation: 一种用于检测和样品（12）在分析化学和生物成分系统（10）。 该系统（10）包括用于从所述样品（12），以检测成分。其中被动接收排放物（22）的光谱仪（18）。 冷装置（28）是在光谱仪的光谱仪（18）的从所述（18）的样品（12）的相对侧上的场的视图内定位。 冷装置（28）提供温度背景相对于样本（12），以便增加从所述样品（12），因此排放物（22），以减少背景发射的低。 该系统可进一步包括用于容纳所述样品的样品室（14）。 可替代地，该系统可包括在其上提供的样品或系统可以远程设置的用于调查在免费的气氛中的样品气雾的发送样本窗口。

    A method for analysing metals in the fundamental state utilizing the statistical distribution of elements
    32.
    发明公开
    A method for analysing metals in the fundamental state utilizing the statistical distribution of elements 审中-公开
    通过元素的统计分布的装置，用于以所述原始状态的金属分析的方法

    公开(公告)号：EP1355145A1

    公开(公告)日：2003-10-22

    申请号：EP03009038.5

    申请日：2003-04-17

    Applicant: Central Iron & Steel Research Institute

    Inventor： Haizhou, Wang ,  Chen, Jiwen ,  Zhijun, Yang ,  Xinsheng, Yang ,  Hongbin, Gao ,  Yunhai, Jia ,  Liangjing, Yuan ,  Wenjun, Qu ,  Zhening, Weng

    IPC: G01N21/67 ,  G01N21/86 ,  G01N33/20 ,  G01J3/443

    CPC classification number: G01N33/20 ,  G01J3/443 ,  G01N21/67

    Abstract: The present invention relates to a new analysis method to determine chemical compositions and states of metal materials. It includes the continuous steps of: using metallic discharge electrodes to perform the continuous spark discharge on the sample which is moved relative to the electrodes; dispersing the excited spark spectrum to form the linear spectrum with preset wavelength; recording the positions of every single spark discharge and the spectrum signals rapidly and at real-time; transferring the spectrum signals into electrical signals which are then inputted into signal memory; using a computer to statistically analyze the linear spectrum obtained from the single spark discharge, by which the distribution of chemical compositions, segregation, porosity and inclusion in the sample are resulted and then outputting these results. According to the present invention, the sample is subject to continuous excitation and synchronous scanning without pre-sparking, and every single spark spectrum signals is rapid collected and digital analyzed. Thus the original state of inclusion in sample without re-melting is obtained and various parameters for elements in sample, such as chemical compositions, segregation, porosity and inclusion content and distribution of these parameters are able to be simultaneously determined with one time scanning.

    Abstract translation: 本发明涉及一种新的分析方法来确定性地矿的化学成分和金属材料的状态。 它包括的连续步骤：使用金属放电电极来进行样品上的连续火花放电的所有其被相对于所述电极移动; 激发火花光谱分散，以形成具有预定波长的线性谱; 记录每一个火花放电而迅速，并在实时的频谱信号的位置; 传递环频谱信号转换成电信号然后被输入到信号存储器; 使用计算机进行统计分析从单火花放电，通过该化学成分，偏析，孔隙率和夹杂物在样品中的分布产生，然后输出开始合成结果获得的线性谱。 。根据本发明，所述样品经受连续激发和同步扫描没有预火花，每颗火花频谱信号被快速收集和数字分析。 THUS列入样品的原始状态，而不会再熔融获得并用于在样品中，颜色元件的各种参数：如化学组合物，偏析，孔隙度和夹杂物含量和的合成参数分布是能够同时确定与一个时间扫描开采。

    Spectroscopic analysis apparatus
    34.
    发明公开
    Spectroscopic analysis apparatus 有权
    Gerätzur spektroskopischen分析

    公开(公告)号：EP1167932A2

    公开(公告)日：2002-01-02

    申请号：EP01112798.2

    申请日：2001-05-28

    Applicant: HORIBA, LTD.

    Inventor： Uemura, Takeshi

    IPC: G01J3/20

    CPC classification number: G01J3/20 ,  G01J3/2803 ,  G01J3/443

    Abstract: This invention presents a spectroscopic analyzing apparatus, which can increase the SN ratio, by executing an optimal spectroscopic analysis of light from a light source, which gives different light spectrum inherent to the component to be measured and has a different strength distribution according to the light emitting position therein, for example, light emitted from ICP.
    This invention comprises a light source (2), which emits different light spectra, each light spectrum being inherent to a component to be measured and having a different strength distribution according to the respective light emitting position; a spectroscope (6) for dispersing the light from the light source (2) according to its wavelength; at least one CTD photo sensor (8a - 8c) for sensing light being dispersed by the spectroscope (6) and lying within a specific wavelength range; and an optical system(9) for analyzing the light sensed by said at least one CTD photo sensor (8a - 8c), thereby making an image of the light source (2).

    Abstract translation: 本发明提出一种光谱分析装置，其可以通过对来自光源的光的最佳光谱分析来提高SN比，该光谱分析装置给出待测部件固有的不同光谱，并且根据光具有不同的强度分布 例如从ICP发射的光。 本发明包括发射不同光谱的光源（2），每个光谱是要测量的部件固有的，并且根据各个发光位置具有不同的强度分布; 用于根据其波长分散来自光源（2）的光的分光镜（6）; 至少一个用于感测由分光镜（6）分散并位于特定波长范围内的光的CTD光传感器（8a-8c）; 以及用于分析由所述至少一个CTD光传感器（8a-8c）感测的光的光学系统（9），从而形成光源（2）的图像。

    SPECTROMETER WITH DISCHARGE LIMITING MEANS
    35.
    发明公开
    SPECTROMETER WITH DISCHARGE LIMITING MEANS 失效
    只要资金放电限制谱仪

    公开(公告)号：EP0799408A1

    公开(公告)日：1997-10-08

    申请号：EP95941976.0

    申请日：1995-12-19

    Applicant: VARIAN AUSTRALIA PTY. LTD.

    Inventor： GLIDDON, Craig, William

    IPC: G01J3 ,  H01J49

    CPC classification number: H01J49/067 ,  G01J3/443 ,  H01J49/105

    Abstract: An inductively coupled plasma spectrometer including shielding/sampling means (1) located between a plasma torch (3) and an optical system (4) of the spectrometer, wherein said shielding/sampling (1) means is associated with an enclosure (9) for the plasma torch such that a relatively high independance path (10, 11) is established for limiting flow of electrical current between said shielding/sampling means (1) and said enclosure (9).

    Energy resolved emission microscopy system and method
    37.
    发明公开
    Energy resolved emission microscopy system and method 失效
    Emissionsmikroskop。

    公开(公告)号：EP0559313A1

    公开(公告)日：1993-09-08

    申请号：EP93300288.3

    申请日：1993-01-18

    Applicant: ADVANCED MICRO DEVICES, INC.

    Inventor： Bruce, Victoria J.

    IPC: H04N7/18 ,  G01N21/88

    CPC classification number: G02B21/00 ,  G01J3/2803 ,  G01J3/443 ,  G01N21/62 ,  G02B21/0016

    Abstract: An emission microscope system includes in various embodiments a catadioptric optical microscope and/or a computer automated optical dispensing system and/or a cryogenically cooled back thinned CCD camera. The system also includes a computer controlled data acquisition system with specially tailored software.

    Abstract translation: 放射显微镜系统在各种实施例中包括反射折射光学显微镜和/或计算机自动光学分配系统和/或低温冷却背部薄化CCD照相机。 该系统还包括具有专门定制软件的计算机控制数据采集系统。

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