公开(公告)号：EP3081163A2

公开(公告)日：2016-10-19

申请号：EP16164562.7

申请日：2016-04-08

Applicant: Taiwan Biophotonic Corporation

Inventor： LI, YU-TANG ,  CHU, CHANG-SHENG ,  HO, KUAN-JUI ,  HO, PEI-CHENG ,  CHUNG, SHUANG-CHAO ,  FAN, CHIH-HSUN ,  CHEN, JYH-CHERN

IPC: A61B5/145 ,  A61B5/1455 ,  A61B5/00 ,  A61B3/10

CPC classification number: G01N21/21 ,  A61B3/10 ,  A61B3/152 ,  A61B5/1455 ,  G01B11/272 ,  G01N33/483 ,  G01N2201/0633 ,  G01N2201/0683 ,  G01N2201/126

Abstract: The present disclosure generally relates to an optical measurement module, an optical measurement device, and a method for optical measurement. The optical measurement module provides optical architecture to measure the optical properties of an analyte. The optical measurement device comprising the optical measurement module is configured to measure the optical properties of an analyte. The method for the optical measurement provides steps for optical measurement.

公开(公告)号：EP3055433A1

公开(公告)日：2016-08-17

申请号：EP14851985.3

申请日：2014-10-09

Applicant: University of Rochester ,  The UAB Research Foundation

Inventor： MILLER, Benjamin, L. ,  NAHM, Moon, H.

IPC: C12Q1/70

CPC classification number: G01N33/56944 ,  G01N21/211 ,  G01N21/55 ,  G01N33/54373 ,  G01N2201/06113 ,  G01N2201/0683 ,  G01N2333/3156

Abstract: According to aspects illustrated herein, there are provided a sensor chip suitable for serological detection of Streptococcus pneumoniae, a method for detecting serotypes of Streptococcus pneumoniae using the sensor chip, a detection system that includes the sensor chip, and a method for detecting serotypes of Streptococcus pneumoniae using the detection system described herein.

Abstract translation: 根据本文所述的方面，提供了适用于肺炎链球菌的血清学检测的传感器芯片，使用传感器芯片检测肺炎链球菌血清型的方法，包括传感器芯片的检测系统和检测链球菌血清型的方法 使用本文所述的检测系统的肺炎链球菌。

公开(公告)号：EP3042239A1

公开(公告)日：2016-07-13

申请号：EP14758923.8

申请日：2014-09-03

Applicant: Leica Microsystems CMS GmbH

Inventor： KRISHNAMACHARI, Vishnu Vardhan

IPC: G02B27/28 ,  G02B21/00

CPC classification number: G01N21/21 ,  G01N21/65 ,  G01N2201/067 ,  G01N2201/0683 ,  G02B21/002 ,  G02B21/0032 ,  G02B21/0068 ,  G02B27/283 ,  G02B27/286

Abstract: The invention relates to a method for examining a sample, the sample being subjected to illumination light and detection light coming from the sample being directed to a detector, and the illumination light being directed through an acousto-optical component with which the sample can be temporarily interrupted from being subjected to illumination light. The method is characterized in that the sample is illuminated by a first illumination light bundle that has a first linear polarization direction and by a second illumination light bundle, the linear polarization direction of which is continuously switched between the first linear polarization direction and a second linear polarization direction that is different from the first linear polarization direction. The illumination light of the first linear polarization direction runs along a first light path and the illumination light of the second linear polarization direction runs along a second light path, and the acousto-optical component unites the light paths.

公开(公告)号：EP2909624A4

公开(公告)日：2016-06-08

申请号：EP13846901

申请日：2013-10-16

Applicant: SCIENCES GP LLC K

Inventor： KORMAN VALENTIN

IPC: G01N33/48 ,  A61B5/145 ,  A61B5/1455 ,  G01N21/21

CPC classification number: A61B5/14532 ,  A61B5/1455 ,  A61B5/14558 ,  A61B5/6815 ,  A61B5/7225 ,  A61B2560/0443 ,  A61B2562/0238 ,  G01N21/21 ,  G01N2201/062 ,  G01N2201/0683

Abstract: A glucose sensor comprising an optical energy source having an emitter with an emission pattern; a first polarizer intersecting the emission pattern; a second polarizer spaced a distance from the first polarizer and intersecting the emission pattern, the second polarizer rotated relative to the first polarizer by a first rotational amount Θ; a first optical detector intersecting the emission pattern; a second optical detector positioned proximal to the second polarizer, the first polarizer and the second polarizer being positioned between the optical energy source and the second optical detector, the second optical detector intersecting the emission pattern; a compensating circuit coupled to the second optical detector; and a subtractor circuit coupled to the compensating circuit and the first optical detector.

公开(公告)号：EP2889603A4

公开(公告)日：2016-04-20

申请号：EP13846617

申请日：2013-08-30

Applicant: SONY CORP

Inventor： TAKEUCHI TAICHI ,  IMANISHI SHINGO

IPC: G01N15/14

CPC classification number: G01N15/1436 ,  G01N15/1429 ,  G01N15/1434 ,  G01N15/1459 ,  G01N21/21 ,  G01N21/47 ,  G01N21/49 ,  G01N21/53 ,  G01N21/645 ,  G01N2015/0065 ,  G01N2015/1006 ,  G01N2021/6478 ,  G01N2201/06113 ,  G01N2201/0638 ,  G01N2201/0683

Abstract: A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I. 1.5 �¢ f ‰¤ L ‰¤ 2.5 �¢ f

公开(公告)号：EP2963627A1

公开(公告)日：2016-01-06

申请号：EP14175734.4

申请日：2014-07-04

Applicant: Amrona AG

Inventor： Siemens, Andreas

IPC: G08B17/107 ,  G01N30/74 ,  G01N21/03

CPC classification number: G01N21/53 ,  G01N2021/473 ,  G01N2201/062 ,  G01N2201/0642 ,  G01N2201/0683 ,  G08B17/107 ,  G08B17/113

Abstract: Es wird eine Anordnung (100) zum Abschwächen auftreffenden Lichts eines Strahlenbündels mit endlicher Aufweitung angegeben. Mit dem Ziel, eine zuverlässige Abschwächung insbesondere direkt auftreffenden Lichts zu erzielen, sieht die erfindungsgemäße Lösung vor, dass die Anordnung eine Lichtquelle (10) zum Erzeugen eines Lichtbündels unpolarisierten Lichts, vorzugsweise unpolarisierten monochromatischen Lichts, einen Nutzlichtbereich (50), den das unpolarisierte Licht durchläuft und vorzugsweise ausgehend von der Lichtquelle (10) geradlinig durchläuft sowie eine dem Nutzlichtbereich (50) nachgeordnete und vorzugsweise in direkter Strahlrichtung des Lichtbündels nachgeordneter Absorptionseinrichtung (30) zum zumindest teilweisen Absorbieren auftreffenden Lichts aufweist, wobei die Absorptionseinrichtung (30) mindestens eine in Richtung des Lichtbündels angeordnete Polarisationseinrichtung (31, 32) aufweist.

Abstract translation: 提供了一种用于衰减有限扩张的光束的入射光的组件（100）。 以实现与一个可靠衰减特定直接入射光，本发明的解决方案提供了，所述装置包括用于产生非偏振光的光束的光源（10），优选非偏振单色光，一个Nutzlichtbereich（50）与所述非偏振光的目的 通行证，并且优选地，从光源开始（10）穿过的直线以及在直接光束的光束方向上的所述Nutzlichtbereich（50）的下游，并且优选下游吸收装置（30）用于至少部分地吸收入射光，所述吸收装置（30）的至少一个方向 的光偏振装置的布置光束（31，32）。

公开(公告)号：EP2205949A1

公开(公告)日：2010-07-14

申请号：EP08845082.0

申请日：2008-11-03

Applicant: Deka Products Limited Partnership

Inventor： HELMORE, Simon, C. ,  SACHS, Jason ,  SCARPACI, Jacob, W.

IPC: G01J4/00

CPC classification number: G01N21/21 ,  A61M1/14 ,  G01J4/04 ,  G01N21/90 ,  G01N2201/0612 ,  G01N2201/0683

Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/−45 degrees relative to the first and second light source polarization axes.

公开(公告)号：EP3293480A1

公开(公告)日：2018-03-14

申请号：EP17187873.9

申请日：2017-08-25

Applicant: SCHOTT AG

Inventor： WIEDENMANN, Hans ,  WITZMANN, André

IPC: G01B11/12

CPC classification number: G02B23/2461 ,  G01B11/12 ,  G01B11/24 ,  G01N21/954 ,  G01N2021/9548 ,  G01N2201/0683 ,  G02B23/02 ,  G02B23/04 ,  G02B27/288

Abstract: Die Erfindung betrifft eine Vorrichtung und ein Verfahren zur Abbildung der Innenkontur eines Rohres mit folgenden Schritten:
- Einstrahlung von Licht einer ersten Polarisationsrichtung auf ein erstes Rohrende in Längsrichtung des Rohres,
- Reflexion des Lichtes hinter einem zweiten Rohrende, wobei das durch das Rohr aufgrund der Reflexion zurücklaufende Licht eine zweite Polarisationsrichtung aufweist, die orthogonal zur ersten Polarisationsrichtung ist,
- Filterung des zurücklaufenden Lichts mit einem Polarisationsfilter zum Durchlass nur des zurücklaufenden Lichts.

Abstract translation: 本发明涉及一种装置和用于成像包括以下步骤的配管的内部轮廓的方法，包括： - 在管的纵向方向上的第一管端部的第一偏振方向的光的照射， - 后面的第二管端部的光的反射，其特征在于，所述通管由于 反射返回具有与第一偏振方向正交的第二偏振方向的光， - 用偏振滤波器对返回光进行滤波以仅透射返回光。

公开(公告)号：EP3130914A4

公开(公告)日：2017-12-06

申请号：EP14889152

申请日：2014-04-08

Applicant: KONICA MINOLTA INC

Inventor： NAKAMURA YUKITO ,  KAYA TAKATOSHI ,  NAGAE KOSUKE ,  NOZAKI AKITOSHI ,  NAGAI FUMIO ,  ISHIKAWA RYOUTA ,  NAMATAME AKIYUKI

IPC: G01N21/64

CPC classification number: G01N21/648 ,  G01J3/0224 ,  G01J3/4406 ,  G01N21/6428 ,  G01N21/6445 ,  G01N33/54373 ,  G01N2021/6439 ,  G01N2021/6463 ,  G01N2201/0612 ,  G01N2201/0683

Abstract: The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.

公开(公告)号：EP3088573A4

公开(公告)日：2017-09-20

申请号：EP14874952

申请日：2014-12-25

Applicant: SUMCO CORP

Inventor： SUDO TOSHIAKI ,  SATO TADAHIRO ,  KITAHARA KEN ,  KITAHARA ERIKO

IPC: C30B29/06 ,  C03B20/00 ,  C03C3/04 ,  C30B15/10 ,  G01L1/24 ,  G01L5/00 ,  G01N21/23 ,  H04N5/232

CPC classification number: G01N21/23 ,  C03C3/04 ,  C30B15/10 ,  C30B29/06 ,  G01L1/24 ,  G01L5/0047 ,  G01N2201/062 ,  G01N2201/0683 ,  H04N5/232

Abstract: A distortion distribution of an entire vitreous silica crucible is measured in a non-destructive way. A distortion-measuring apparatus comprises: a light source 11 which irradiates the vitreous silica crucible 1 from outside; a first polarizer 12 and a first quarter-wave plate 13 disposed between the light source 11 and an outer surface of the vitreous silica crucible 1 wall; a camera 14 disposed inside of the vitreous silica crucible 1; a camera control mechanism 15 configured to control a photographing direction of the camera 14; a second polarizer 16 and a second quarter-wave plate 17 disposed between the camera 14 and an inner surface of the vitreous silica crucible 1's wall. An optical axis of the second quarter-wave plate 17 inclines 90 degrees with respect to the first quarter-wave plate 13. The camera 14 conducts photographing of a light which is emitted from the light source 11 and passes through the first polarizer 12, the first quarter-wave plate 13, the wall of the vitreous silica crucible 1, the second quarter-wave plate 17, and the second polarizer 16.

Abstract translation: 以非破坏性的方式测量整个氧化硅玻璃坩埚的变形分布。 变形测量装置具备：从外部照射氧化硅玻璃坩埚1的光源11， 第一偏振器12和设置在光源11与氧化硅玻璃坩埚1壁的外表面之间的第一四分之一波片13; 设置在氧化硅玻璃坩埚1内的照相机14; 相机控制机构15，用于控制相机14的拍摄方向; 配置在照相机14与石英玻璃坩埚1的壁的内表面之间的第二偏振片16和第二四分之一波片17。 第二四分之一波片17的光轴相对于第一四分之一波片13倾斜90度。照相机14对从光源11发出并穿过第一偏振片12的光进行拍摄， 第一四分之一波片13，氧化硅玻璃坩埚1的壁，第二四分之一波片17以及第二偏振片16。