中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

286 records (took 0.016 seconds)

    Process of detection of light and associated device
    53.
    发明公开
    Process of detection of light and associated device 审中-公开
    Verfahren zur Detektion von Licht undzugehörigeVorrichtung

    公开(公告)号：EP2982950A1

    公开(公告)日：2016-02-10

    申请号：EP14180354.4

    申请日：2014-08-08

    Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE -CNRS- ,  Université de Strasbourg

    Inventor： Bowen, Martin ,  Halisdemir, Ufuk ,  Schleicher, Filip ,  Boukari, Samy ,  Beaurepaire, Eric

    IPC: G01J4/00 ,  B82Y25/00

    CPC classification number: G01J4/04

    Abstract: According to an aspect of the invention, it is provided a process of detection of light comprising:
    - a step of flowing an electric current through at least a first dielectric junction, said first dielectric junction comprising at least a first metallic layer extending along a first reference plane and a second metallic layer extending parallel to said first reference plane, said first and second metallic layers being separated from each other by a dielectric layer ensuring non-ohmic conduction between said first and second metallic layers;
    - a step of measuring the electric resistance of the first dielectric junction;
    - a step of determining the presence or the absence of light by using the measured electric resistance of the first dielectric junction.
    According to another aspect of the invention, it is provided a process of characterization of the degree to which detected light is polarized along a first spatial direction and/or along a second spatial direction and/or along a third spatial direction, using a device at the nanometre scale. This enables the detection of the orientation of the incoming light.

    Abstract translation: 根据本发明的一个方面，提供了一种检测光的方法，包括： - 使电流流过至少第一电介质结的步骤，所述第一介电结至少包括沿第一电介质延伸的第一金属层 参考平面和平行于所述第一参考平面延伸的第二金属层，所述第一和第二金属层通过介电层彼此分开，确保所述第一和第二金属层之间的非欧姆导电; - 测量第一电介质结的电阻的步骤; - 通过使用所测量的第一电介质结的电阻来确定存在或不存在光的步骤。 根据本发明的另一方面，提供了一种表征检测光沿着第一空间方向和/或沿着第二空间方向和/或沿着第三空间方向被偏振的程度的过程，该方法使用在 纳米级。 这使得能够检测入射光的取向。

    DISPOSITIF ET PROCÉDÉ D'ANALYSE POLARIMÉTRIQUE À DIVISION DE FRONT D'ONDE, SPECTROPOLARIMÈTRE, CAMÉRA POLARIMÉTRIQUE ET MICROSCOPE OPTIQUE UTILISANT UN TEL DISPOSITIF
    55.
    发明公开
    DISPOSITIF ET PROCÉDÉ D'ANALYSE POLARIMÉTRIQUE À DIVISION DE FRONT D'ONDE, SPECTROPOLARIMÈTRE, CAMÉRA POLARIMÉTRIQUE ET MICROSCOPE OPTIQUE UTILISANT UN TEL DISPOSITIF 有权
    FOR POLARIMETERIC波阵区划分析，spectropo-，POLARIMETERIC摄像机和光学显微镜这样的设备分析方法和设备

    公开(公告)号：EP2877822A1

    公开(公告)日：2015-06-03

    申请号：EP13756601.4

    申请日：2013-07-25

    Applicant: Horiba Jobin Yvon S.A.S.

    Inventor： ACHER, Olivier ,  RICHARD, Simon ,  NGUYEN, Thanh-Liem

    IPC: G01J4/02 ,  G01J4/04

    CPC classification number: G01J4/02 ,  G01J4/04

    Abstract: The invention relates to an accurate and robust wavefront-division polarimetric analysis device, allowing the quasi-instantaneous measurement of the polarisation states of a luminous object. The wavefront-division polarimetric analysis device of the invention can be used to produce a plurality of light beams, all polarised according to different polarisation states, from a single upstream light beam. The polarised light beams, which do not overlap and which carry information items that are complementary in terms of polarisation, are analysed simultaneously by a plurality of detectors that measure the luminous intensity of each beam. Processing means digitally process the luminous intensity values obtained in order to determine the polarisation state of the upstream light beam. According to the invention, the operations performed by the processing means on the luminous intensity values prevent luminous intensity variations in the divided light beams during the division of the wavefront of the upstream light beam. Therefore the wavefront-division polarimetric analysis device of the invention is robust and its accuracy is not hindered by the experimental conditions. The invention further relates to a wavefront-division polarimetric analysis method for determining the polarisation state of an upstream light beam.

    HETERODYNE POLARIMETER WITH A BACKGROUND SUBTRACTION SYSTEM
    57.
    发明公开
    HETERODYNE POLARIMETER WITH A BACKGROUND SUBTRACTION SYSTEM 审中-公开
    具有背景减弱系统的异体极化天体

    公开(公告)号：EP2331922A1

    公开(公告)日：2011-06-15

    申请号：EP09748154.3

    申请日：2009-09-23

    Applicant: Mellitor Ltd.

    Inventor： GOLDBERG, Doron ,  WEISSMAN, Zeev ,  YACOV, Yaniv

    IPC: G01J4/04

    CPC classification number: G01J4/04

    Abstract: The present invention relates to a method and a device capable of measuring the rotation of linearly polarized light, with improved resolution and accuracy, by employing an efficient background subtraction system. The method and device are suitable for applications such as the monitoring of the concentration of optically active substances in a solution. The detection device is a heterodyne polarimeter using coherent detection to measure optical rotation, with high sensitivity and resolution, while enabling the subtraction of all background signals, without the need to measure reference samples.

    Abstract translation: 本发明涉及一种通过采用高效的背景减除系统，能够以提高的分辨率和准确度测量线偏振光的旋转的方法和装置。 该方法和装置适用于诸如监测溶液中光学活性物质浓度的应用。 该检测设备是一个外差偏光计，利用相干检测来测量旋光度，具有高灵敏度和高分辨率，同时可以减去所有背景信号，而无需测量参考样品。

    Spin-polarised charge carrier device
    59.
    发明公开
    Spin-polarised charge carrier device 有权
    SpinpolarisierteLadungsträgervorrichtung

    公开(公告)号：EP2190022A1

    公开(公告)日：2010-05-26

    申请号：EP08169560.3

    申请日：2008-11-20

    Applicant: Hitachi Ltd.

    Inventor： Wunderlich, Joerg ,  Jungwirth, Tomas ,  Irvine, Andrew ,  Sinova, Jairo

    IPC: H01L29/66 ,  G01J4/00

    CPC classification number: H01L29/66984 ,  G01J4/04

    Abstract: A device comprising a channel (15) for charge carriers comprising non-ferromagnetic semiconducting in which charge carriers exhibit spin-orbit coupling, a region (10) of semiconducting material of opposite conductivity type to the channel and configured so as to form a junction (21) with the channel for injecting spin-polarised charge carriers into an end of the channel and at least one lead (18 1 , 18 2 ) connected to the channel for measuring a transverse voltage across the channel.

    Abstract translation: 一种包括用于电荷载流子的通道（15）的装置，其包括其中电荷载体表现出自旋 - 轨道耦合的非铁磁半导体，与沟道相反的导电类型的半导体材料的区域（10）并且被配置为形成结（ 21），其具有用于将自旋极化电荷载流子注入到所述沟道的端部的通道和连接到所述沟道的至少一个引线（18 1,18 2），用于测量跨过所述沟道的横向电压。

Patent Agency Ranking