摘要:
There is provided a method for controlling fetch-ahead of Fetch Sets into a decoupling First In First Out (FIFO) buffer of a Variable Length Execution Set (VLES) processor architecture, wherein a Fetch Set comprises at least a portion of a VLES group available for dispatch to processing resources within the VLES processor architecture, comprising, for each cycle, determining a number of VLES groups available for dispatch from previously pre-fetched Fetch Sets, and only requesting a fetch-ahead of a next Fetch Set in the next cycle if any one or more of the following is asserted: the number of VLES groups available for dispatch is less than a predetermined starvation threshold, OR the number of VLES groups available for dispatch is indicative of going below a predetermined upper limit threshold, OR the number of VLES groups available for dispatch is indicative of being between the predetermined starvation threshold and the predetermined upper limit threshold, and a fetch-ahead of a Fetch Set occurred in an immediately previous cycle.
摘要:
A structure and method to improve saw singulation quality and wettability of integrated circuit packages (140) assembled with lead frames (112) having half-etched recesses (134) in leads. A method of forming a semiconductor device package includes providing a lead frame strip (110) having a plurality of lead frames. Each of the lead frames includes a depression (130) that is at least partially filled with a material (400) prior to singulating the strip.
摘要:
Embodiments of semiconductor devices (200, 800) and driver circuits (110) include a semiconductor substrate (210, 810) having a first conductivity type, an isolation structure (including a sinker region (222, 822) and a buried layer (220, 820)), an active device within a portion (230, 830) of the substrate contained by the isolation structure, and a resistor circuit (160). The buried layer (220, 820) is positioned below the top substrate surface (212, 812), and has a second conductivity type. The sinker region (222, 822) extends between the top substrate surface and the buried layer, and has the second conductivity type. The active device includes a current carrying region (236, 238, 836, 838) (e.g., a source region of the first conductivity type and/or a drain region of the second conductivity type), and the resistor circuit (160) is connected between the isolation structure and the current carrying region. The resistor circuit may include one or more resistor networks (446, 546, 646, 746, 1046, 1146, 1246, 1346) and, optionally, a Schottky diode (410, 510, 1010, 1110) and/or one or more PN diode(s) (610, 710, 1210, 1310) in series and/or parallel with the resistor network(s).
摘要:
An overcurrent protection device comprises a maximum-allowed-current unit and a power switch. The maximum-allowed-current unit determines a maximum allowed current in real-time. The maximum allowed current is determined at least partially on an instantaneous level of a load voltage. The load voltage is a voltage across a load to be powered. The power switch is connectable with a switch input to a voltage supply and with a switch output to the load, for providing power to said load. The power switch has a conductive state and a nonconductive state, and is arranged to assume the nonconductive state in response to an indication that a current through the power switch is exceeding the maximum allowed current. A method of operating a power switch is also described.
摘要:
A disclosed power transistor, suitable for use in a switch mode converter that is operable with a switching frequency exceeding, for example, 5 MHz or more, includes a gate dielectric layer overlying an upper surface of a semiconductor substrate and first and second gate electrodes overlying the gate dielectric layer. The first gate electrode is laterally positioned overlying a first region of the substrate. The first substrate region has a first type of doping, which may be either n-type or p-type. A second gate electrode of the power transistor overlies the gate dielectric and is laterally positioned over a second region of the substrate. The second substrate region has a second doping type that is different than the first type. The transistor further includes a drift region located within the substrate in close proximity to an upper surface of the substrate and laterally positioned between the first and second substrate regions.
摘要:
A memory (10) includes a plurality of latching predecoders (20, 22, 24, 26), each including a first transistor (30, 136) coupled between a power supply voltage and a latch and having a control electrode coupled to a clock signal; a second transistor (32, 108) coupled to the first transistor and having a control electrode coupled to a first address bit signal; a third transistor (34, 110) coupled to the second transistor and having a control electrode coupled to a second address bit signal; a fourth transistor (36, 112) coupled to the third transistor and having a control electrode coupled to a delayed and inverted version of the clock signal; a fifth transistor (38, 114) coupled between the fourth transistor and ground and having a control electrode coupled to the clock signal; and an output which provides a predecode value (A6A7b) during a first portion of a clock cycle of the clock signal and a predetermined logic level during a second portion of the clock cycle.
摘要:
An integrated circuit (IC) device is provided that includes at least one internal voltage regulator arranged to receive a voltage supply signal at a first input thereof, receive a control signal at a second input thereof, regulate the received voltage supply signal in accordance with the received control signal, and provide a regulated voltage supply signal at an output thereof. The IC device further includes at least one voltage regulation power control module operably coupled to the second input of the at least one internal voltage regulator and arranged to provide the control signal thereto. The voltage regulation power control module is further arranged to receive at least one IC device conditional indication, and generate the control signal for the at least one internal voltage regulator based at least partly on an available thermal power budget for the IC device corresponding to the at least one IC device conditional indication.
摘要:
Embodiments include processing systems (110) that determine (308), based on an instruction address range indicator stored in a first register (132, 212), whether a next instruction fetch address corresponds to a location within a first memory region (216, 218) associated with a current privilege state or within a second memory region (216, 218) associated with a different privilege state. When the next instruction fetch address is not within the first memory region (216, 218), the next instruction is allowed to be fetched (314) only when a transition to the different privilege state is legal (310). In a further embodiment, when a data access address is generated for an instruction (316), a determination is made (320), based on a data address range indicator stored in a second register (133, 222), whether access to a memory location corresponding to the data access address is allowed. The access is allowed (318) when the current privilege state is a privilege state in which access to the memory location is allowed.
摘要:
A level shifter (300) including input (VDDIN) and output (VDDOUT) power nodes, input (VSSIN) and output (VSSOUT) reference nodes, input (IN) and output (OUT) signal nodes, and a lever shifter network (405,410,415,420,425,430,440). The input power and input reference nodes operate within a first power domain (202, 204, 206) and the output power and output reference nodes operate within a second power domain (202,204,206). The level shifter network receives an input signal operable within the first power domain, performs voltage shifting between the input and output power nodes and between the input and output reference nodes, and provides an output signal output signal indicative of the input signal that operates within the second power domain. The level shifter may include power (BYP_VDD) and/or ground (BYP_VSS) bypass such that either one or both of power and ground voltage shifting may be bypassed for faster switching. The level shifter may include an isolation input (ISO) to assert the output to a known level.