摘要:
A circuit (20) for reading a memory cell (3) of a nonvolatile memory device (1) provided with a memory array (2) with cells arranged in wordlines and bitlines, among which a first bitline (BL), associated to the memory cell, and a second bitline (BL'), has: a first circuit branch (22) associated to the first bitline and a second circuit branch (22') associated to the second bitline, each with a local node (N 1 , N 1 '), coupled to which is a first dividing capacitor (30), and a global node (N g , N g '), coupled to which is a second dividing capacitor (32); a decoder stage (23, 25) for coupling the local node to the first or second bitlines and coupling the global node to the local node; and a differential comparator stage (36), which has inputs that are coupleable to the global node of the first circuit branch or second circuit branch, and supplies an output signal (S out ) indicative of the datum stored; a coupling stage (40, 41), for coupling the global nodes of the first and second circuit branches; and a control unit (21) for controlling the decoder stage, the coupling stage, and the differential comparator stage for generation of the output signal.
摘要:
A memory cell (100) having a first switch device (Tr1), a second switch device (Tr2) and a capacitor (C) is disclosed. The first switch device (Tr1) has a control terminal coupled to and controlled by a select line (SL), a first terminal coupled to a bit line (BL), and a second terminal. The second switch device (Tr2) has a first terminal coupled to the second terminal of the first switch device (Tr1), a control terminal coupled to and controlled by a word line (WL), and a second terminal. The capacitor (C) has a first terminal coupled to the second terminal of the second switch device (Tr2) and a second terminal coupled to a predetermined voltage level, wherein data is read from the capacitor (C) or written to the capacitor (C) via the bit line (BL).
摘要:
Some embodiments include memory arrays. The memory arrays can have global bitlines extending along a first horizontal direction, vertical local bitlines extending perpendicularly from the global bitlines, and wordlines extending along a second horizontal direction which is perpendicular to the first horizontal direction. The global bitlines may be subdivided into a first series at a first elevational level, and a second series at a second elevational level which is different from the first elevational level. The global bitlines of the first series can alternate with the global bitlines of the second series. There can be memory cell material directly between the wordlines and the vertical local bitlines. The memory cell material may form a plurality of memory cells uniquely addressed by wordline/global bitline combinations. Some embodiments include cross-point memory cell units that have areas of about 2F2.
摘要:
A flash memory array includes memory sectors of two transistors (2T) AND memory cells (S(1,1,1), A(1,1,1) transistors). Within each of the memory sectors (104-1, 104-2), a row of sector selection transistors (SSTL1, SSTL2) is configured such that writing data onto a memory column within the memory sector is controlled by applying a voltage to a bit line (BL1, BL2, BL3), independent from the row of sector selection transistors.
摘要:
A sectioned bit line of an SRAM memory device, an SRAM memory device having a sectioned bit line, and associated systems and methods are described, including embodiments having sectioned bit lines with hierarchical aspects. In one illustrative implementation, each sectioned bit line may comprise a local bit line, a memory cell connected to the local bit line, and a pass gate coupled to the local bit line, wherein the pass gate is configured to be coupled to a global bit line. Further, in some embodiments, the sectioned bit lines are arranged in hierarchical arrays. In other implementations, SRAM memory devices may be configured involving sectioned bit lines (including hierarchical) and a global bit line wherein the pass gates are configured to connect and isolate the sectioned bit line and the global bit line.
摘要:
A phase change memory is disclosed. The phase change memory has a plurality of block units. The block units are alternately selected. The alternate block unit selection suppresses peak current ground bouncing on sub-wordline and connected ground line through sub-wordline driver transistor. An alternate bitline selection avoids adjacent cell heating interference in the selected block unit.